JPH02147355U - - Google Patents
Info
- Publication number
- JPH02147355U JPH02147355U JP5684789U JP5684789U JPH02147355U JP H02147355 U JPH02147355 U JP H02147355U JP 5684789 U JP5684789 U JP 5684789U JP 5684789 U JP5684789 U JP 5684789U JP H02147355 U JPH02147355 U JP H02147355U
- Authority
- JP
- Japan
- Prior art keywords
- fault
- fault diagnosis
- signal
- fault detection
- conversion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Alarm Systems (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5684789U JPH02147355U (cs) | 1989-05-16 | 1989-05-16 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5684789U JPH02147355U (cs) | 1989-05-16 | 1989-05-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02147355U true JPH02147355U (cs) | 1990-12-14 |
Family
ID=31581038
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5684789U Pending JPH02147355U (cs) | 1989-05-16 | 1989-05-16 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02147355U (cs) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19710480C2 (de) * | 1996-03-15 | 2001-12-13 | Yazaki Corp | Unterbrechungsanzeigevorrichtung für eine Vielzahl von Halbleiterschaltelementen, welche eine Überstrom/Übertemperatur-Schutzfunktion aufweisen und die eine Identifizierung des unterbrochenen Halbleiterschaltelementes ermöglicht |
-
1989
- 1989-05-16 JP JP5684789U patent/JPH02147355U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19710480C2 (de) * | 1996-03-15 | 2001-12-13 | Yazaki Corp | Unterbrechungsanzeigevorrichtung für eine Vielzahl von Halbleiterschaltelementen, welche eine Überstrom/Übertemperatur-Schutzfunktion aufweisen und die eine Identifizierung des unterbrochenen Halbleiterschaltelementes ermöglicht |
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