JPH02145762U - - Google Patents
Info
- Publication number
- JPH02145762U JPH02145762U JP5512289U JP5512289U JPH02145762U JP H02145762 U JPH02145762 U JP H02145762U JP 5512289 U JP5512289 U JP 5512289U JP 5512289 U JP5512289 U JP 5512289U JP H02145762 U JPH02145762 U JP H02145762U
- Authority
- JP
- Japan
- Prior art keywords
- specimen
- microscope
- sample
- explanatory diagram
- diagram showing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 7
Description
第１図は本考案に係る顕微鏡用試料台の第１実
施例を示す斜視図、第２図は第１実施例の傾斜状
態を示す説明図、第３図は第２実施例を示す斜視
図、第４図は第２実施例における試料の水平状態
を示す説明図、第５図は試料を４５°傾斜させた
状態を示す説明図、第６図は試料を６０°傾斜さ
せた状態を示す説明図、第７図は試料を９０°傾
斜させた状態を示す説明図、第８図は従来例を示
す斜視図、第９図は従来例を使用した試料の傾斜
状態を示す説明図、第１０図は他の従来例を示す
説明図、第１１図は他の従来例における試料の傾
斜状態を示す説明図である。
１……試料台、２，２０……上面、３，３０…
…試料配置部、４，４０……側面、Ａ……試料。
Fig. 1 is a perspective view showing a first embodiment of a microscope sample stage according to the present invention, Fig. 2 is an explanatory view showing the tilted state of the first embodiment, and Fig. 3 is a perspective view showing the second embodiment. , FIG. 4 is an explanatory diagram showing the horizontal state of the sample in the second embodiment, FIG. 5 is an explanatory diagram showing the state where the sample is tilted at 45 degrees, and FIG. 6 is an explanatory diagram showing the state where the sample is tilted at 60 degrees. 7 is an explanatory diagram showing a state in which the sample is tilted by 90 degrees, FIG. 8 is a perspective view showing the conventional example, and FIG. 9 is an explanatory diagram showing the tilted state of the sample using the conventional example. FIG. 10 is an explanatory diagram showing another conventional example, and FIG. 11 is an explanatory diagram showing a tilted state of a sample in another conventional example. 1...Sample stand, 2,20...Top surface, 3,30...
...Sample placement part, 4,40...Side surface, A...Sample.
Claims (1)
ける試料台において、 上面の試料配置部から裏面にかけて、前記上面
に対して直角な側面を有することを特徴とする顕
微鏡用試料台。[Claims for Utility Model Registration] A specimen for a microscope, characterized in that a specimen stage attached to a specimen tilting mechanism provided in a microscope has a side surface perpendicular to the upper surface from the specimen placement section on the upper surface to the back surface. The stand.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5512289U JPH02145762U (en) | 1989-05-12 | 1989-05-12 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5512289U JPH02145762U (en) | 1989-05-12 | 1989-05-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02145762U true JPH02145762U (en) | 1990-12-11 |
Family
ID=31577795
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5512289U Pending JPH02145762U (en) | 1989-05-12 | 1989-05-12 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02145762U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003346693A (en) * | 2002-05-22 | 2003-12-05 | Dainippon Printing Co Ltd | Sample carrier and sample observing method |
-
1989
- 1989-05-12 JP JP5512289U patent/JPH02145762U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003346693A (en) * | 2002-05-22 | 2003-12-05 | Dainippon Printing Co Ltd | Sample carrier and sample observing method |