JPH02136211U - - Google Patents

Info

Publication number
JPH02136211U
JPH02136211U JP4589289U JP4589289U JPH02136211U JP H02136211 U JPH02136211 U JP H02136211U JP 4589289 U JP4589289 U JP 4589289U JP 4589289 U JP4589289 U JP 4589289U JP H02136211 U JPH02136211 U JP H02136211U
Authority
JP
Japan
Prior art keywords
optical observation
observation device
biasing member
load
link mechanism
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4589289U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4589289U priority Critical patent/JPH02136211U/ja
Publication of JPH02136211U publication Critical patent/JPH02136211U/ja
Pending legal-status Critical Current

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Landscapes

  • Microscoopes, Condenser (AREA)
JP4589289U 1989-04-19 1989-04-19 Pending JPH02136211U (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4589289U JPH02136211U (de) 1989-04-19 1989-04-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4589289U JPH02136211U (de) 1989-04-19 1989-04-19

Publications (1)

Publication Number Publication Date
JPH02136211U true JPH02136211U (de) 1990-11-14

Family

ID=31560475

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4589289U Pending JPH02136211U (de) 1989-04-19 1989-04-19

Country Status (1)

Country Link
JP (1) JPH02136211U (de)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003215465A (ja) * 2001-12-21 2003-07-30 Leica Microsystems (Schweiz) Ag 光学装置の支持装置
JP2003246600A (ja) * 2002-01-04 2003-09-02 Leica Microsystems (Schweiz) Ag 自動平衡装置を有する架台
EP3220038A1 (de) * 2016-03-17 2017-09-20 Leica Instruments (Singapore) Pte. Ltd. Verfahren zum ausgleichen einer last mittels eines tragsystem und tragsystem

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4523732A (en) * 1980-09-18 1985-06-18 Carl-Zeiss-Stiftung, Heidenheim/Brenz Adjustable stand for optical observation instruments

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4523732A (en) * 1980-09-18 1985-06-18 Carl-Zeiss-Stiftung, Heidenheim/Brenz Adjustable stand for optical observation instruments

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003215465A (ja) * 2001-12-21 2003-07-30 Leica Microsystems (Schweiz) Ag 光学装置の支持装置
JP2003246600A (ja) * 2002-01-04 2003-09-02 Leica Microsystems (Schweiz) Ag 自動平衡装置を有する架台
EP3220038A1 (de) * 2016-03-17 2017-09-20 Leica Instruments (Singapore) Pte. Ltd. Verfahren zum ausgleichen einer last mittels eines tragsystem und tragsystem
WO2017160224A1 (en) * 2016-03-17 2017-09-21 Leica Instruments (Singapore) Pte Ltd Method of balancing a load using a support system and support system

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