JPH02135851U - - Google Patents

Info

Publication number
JPH02135851U
JPH02135851U JP4596589U JP4596589U JPH02135851U JP H02135851 U JPH02135851 U JP H02135851U JP 4596589 U JP4596589 U JP 4596589U JP 4596589 U JP4596589 U JP 4596589U JP H02135851 U JPH02135851 U JP H02135851U
Authority
JP
Japan
Prior art keywords
infrared
amplifier
inspection object
circuit
heating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4596589U
Other languages
English (en)
Japanese (ja)
Other versions
JPH074559Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4596589U priority Critical patent/JPH074559Y2/ja
Publication of JPH02135851U publication Critical patent/JPH02135851U/ja
Application granted granted Critical
Publication of JPH074559Y2 publication Critical patent/JPH074559Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
JP4596589U 1989-04-19 1989-04-19 表面欠陥検査装置 Expired - Lifetime JPH074559Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4596589U JPH074559Y2 (ja) 1989-04-19 1989-04-19 表面欠陥検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4596589U JPH074559Y2 (ja) 1989-04-19 1989-04-19 表面欠陥検査装置

Publications (2)

Publication Number Publication Date
JPH02135851U true JPH02135851U (enrdf_load_stackoverflow) 1990-11-13
JPH074559Y2 JPH074559Y2 (ja) 1995-02-01

Family

ID=31560619

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4596589U Expired - Lifetime JPH074559Y2 (ja) 1989-04-19 1989-04-19 表面欠陥検査装置

Country Status (1)

Country Link
JP (1) JPH074559Y2 (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2375243B1 (de) * 2010-04-08 2023-06-07 Institut Dr. Foerster Gmbh & Co. Kg Thermografisches Prüfverfahren und Prüfvorrichtung zur Durchführung des Prüfverfahrens

Also Published As

Publication number Publication date
JPH074559Y2 (ja) 1995-02-01

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