JPH02128508U - - Google Patents
Info
- Publication number
- JPH02128508U JPH02128508U JP3465589U JP3465589U JPH02128508U JP H02128508 U JPH02128508 U JP H02128508U JP 3465589 U JP3465589 U JP 3465589U JP 3465589 U JP3465589 U JP 3465589U JP H02128508 U JPH02128508 U JP H02128508U
- Authority
- JP
- Japan
- Prior art keywords
- film thickness
- light source
- measuring device
- light receiving
- meter body
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000853 adhesive Substances 0.000 claims 1
- 230000001070 adhesive effect Effects 0.000 claims 1
- 239000011248 coating agent Substances 0.000 claims 1
- 238000000576 coating method Methods 0.000 claims 1
- 239000000470 constituent Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 229920006255 plastic film Polymers 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
第１図は本考案の一実施例を示す説明図、第２
図は従来技術を示す説明図である。
１……光源、２……受光部、３……膜厚計本体
、４１，４２……ロール、４３……反転ロール、
４４〜４８……ロール、５……積層フイルム、６
……金属蒸着フイルム、７……プラスチツクフイ
ルム層。
Fig. 1 is an explanatory diagram showing one embodiment of the present invention;
The figure is an explanatory diagram showing a conventional technique. DESCRIPTION OF SYMBOLS 1...Light source, 2...Light receiving part, 3...Film thickness meter main body, 4 1 , 4 2 ...Roll, 4 3 ...Reversing roll,
4 4 to 4 8 ...Roll, 5...Laminated film, 6
...Metal vapor deposited film, 7...Plastic film layer.
Claims (1)
等を測定するための膜厚測定装置であり、赤外線
の光源と受光部を有する膜厚計本体、該膜厚計本
体上の前記赤外線の光源と受光部とを結ぶ直線の
中心から垂直上方位置に鏡面ロールを設けたこと
を特徴とする膜厚測定装置。 This is a film thickness measuring device for measuring the constituent films of a laminated film, the coating amount of adhesive, etc., and includes a film thickness meter body having an infrared light source and a light receiving section, and the infrared light source and light receiving portion on the film thickness meter body. A film thickness measuring device characterized in that a mirror roll is provided at a position vertically above the center of a straight line connecting the parts.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3465589U JPH02128508U (en) | 1989-03-27 | 1989-03-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3465589U JPH02128508U (en) | 1989-03-27 | 1989-03-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02128508U true JPH02128508U (en) | 1990-10-23 |
Family
ID=31539322
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3465589U Pending JPH02128508U (en) | 1989-03-27 | 1989-03-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02128508U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2015163299A1 (en) * | 2014-04-22 | 2015-10-29 | 株式会社アドバンテスト | Electromagnetic-wave measurement device, measurement method, program and recording medium |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6125082A (en) * | 1984-07-13 | 1986-02-03 | Nec Corp | New direction detecting system |
-
1989
- 1989-03-27 JP JP3465589U patent/JPH02128508U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6125082A (en) * | 1984-07-13 | 1986-02-03 | Nec Corp | New direction detecting system |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2015163299A1 (en) * | 2014-04-22 | 2015-10-29 | 株式会社アドバンテスト | Electromagnetic-wave measurement device, measurement method, program and recording medium |
| JPWO2015163299A1 (en) * | 2014-04-22 | 2017-04-20 | 株式会社アドバンテスト | Electromagnetic wave measuring apparatus, measuring method, program, recording medium |