JPH02124504U - - Google Patents
Info
- Publication number
- JPH02124504U JPH02124504U JP3339389U JP3339389U JPH02124504U JP H02124504 U JPH02124504 U JP H02124504U JP 3339389 U JP3339389 U JP 3339389U JP 3339389 U JP3339389 U JP 3339389U JP H02124504 U JPH02124504 U JP H02124504U
- Authority
- JP
- Japan
- Prior art keywords
- images
- image recognition
- resin
- appearance inspection
- inspection device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011800 void material Substances 0.000 claims description 4
- 238000007689 inspection Methods 0.000 claims description 3
- 239000002131 composite material Substances 0.000 claims 1
- 230000003287 optical effect Effects 0.000 description 1
Description
第1図は本考案の実施例1示す斜視図、第2図
は同平面図、第3図a,b,c,d,eは本考案
の実施例1における記憶画像を示す図、第4図は
本考案の実施例2を示す斜視図、第5図は従来の
ボイド外観検査装置を示す斜視図、第6図a、第
7図aは従来例の画像を示す平面図、第6図b、
第7図bは同側面図である。
1……画像認識装置、2……画像認識カメラ、
3……パツケージ、4……ボイド、5…影、6…
…光軸、7,8,9,10,14……光源、11
……記憶画像、15……中空回転ステージ。
Fig. 1 is a perspective view showing the first embodiment of the present invention, Fig. 2 is a plan view of the same, Figs. The figure is a perspective view showing Embodiment 2 of the present invention, FIG. 5 is a perspective view showing a conventional void appearance inspection device, FIGS. 6a and 7a are plan views showing images of the conventional example, and FIG. b,
FIG. 7b is a side view of the same. 1... Image recognition device, 2... Image recognition camera,
3...Package, 4...Void, 5...Shadow, 6...
...Optical axis, 7, 8, 9, 10, 14...Light source, 11
...Memory image, 15...Hollow rotating stage.
Claims (1)
ボイド外観検査装置において、樹脂封止パツケー
ジの表面を写し出す画像認識カメラと、パツケー
ジの表面を周方向の複数の位置から照射する光源
と、画像認織カメラより入力した複数の画像を記
憶し、これらの記憶画像に基づいて合成画像を生
成する画像認識装置とを有することを特徴とする
ボイド外観検査装置。 A void appearance inspection device that determines the presence or absence of voids in a resin-sealed package includes an image recognition camera that images the surface of the resin-sealed package, a light source that illuminates the surface of the package from multiple positions in the circumferential direction, and an image recognition camera. 1. A void appearance inspection device comprising: an image recognition device that stores a plurality of images inputted from a plurality of images, and generates a composite image based on these stored images.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3339389U JPH02124504U (en) | 1989-03-25 | 1989-03-25 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3339389U JPH02124504U (en) | 1989-03-25 | 1989-03-25 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02124504U true JPH02124504U (en) | 1990-10-15 |
Family
ID=31537010
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3339389U Pending JPH02124504U (en) | 1989-03-25 | 1989-03-25 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02124504U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014010138A (en) * | 2012-07-03 | 2014-01-20 | Ricoh Elemex Corp | Inspection device and inspection method |
WO2018088552A1 (en) * | 2016-11-14 | 2018-05-17 | 日本碍子株式会社 | Ceramic body defect inspecting device and defect inspecting method |
-
1989
- 1989-03-25 JP JP3339389U patent/JPH02124504U/ja active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2014010138A (en) * | 2012-07-03 | 2014-01-20 | Ricoh Elemex Corp | Inspection device and inspection method |
WO2018088552A1 (en) * | 2016-11-14 | 2018-05-17 | 日本碍子株式会社 | Ceramic body defect inspecting device and defect inspecting method |
JPWO2018088552A1 (en) * | 2016-11-14 | 2018-11-15 | 日本碍子株式会社 | Defect inspection apparatus and defect inspection method for ceramic body |
US11226295B2 (en) | 2016-11-14 | 2022-01-18 | Ngk Insulators, Ltd. | Ceramic body defect inspecting apparatus and defect inspecting method |