JPH02124504U - - Google Patents

Info

Publication number
JPH02124504U
JPH02124504U JP3339389U JP3339389U JPH02124504U JP H02124504 U JPH02124504 U JP H02124504U JP 3339389 U JP3339389 U JP 3339389U JP 3339389 U JP3339389 U JP 3339389U JP H02124504 U JPH02124504 U JP H02124504U
Authority
JP
Japan
Prior art keywords
images
image recognition
resin
appearance inspection
inspection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3339389U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3339389U priority Critical patent/JPH02124504U/ja
Publication of JPH02124504U publication Critical patent/JPH02124504U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の実施例1示す斜視図、第2図
は同平面図、第3図a,b,c,d,eは本考案
の実施例1における記憶画像を示す図、第4図は
本考案の実施例2を示す斜視図、第5図は従来の
ボイド外観検査装置を示す斜視図、第6図a、第
7図aは従来例の画像を示す平面図、第6図b、
第7図bは同側面図である。 1……画像認識装置、2……画像認識カメラ、
3……パツケージ、4……ボイド、5…影、6…
…光軸、7,8,9,10,14……光源、11
……記憶画像、15……中空回転ステージ。
Fig. 1 is a perspective view showing the first embodiment of the present invention, Fig. 2 is a plan view of the same, Figs. The figure is a perspective view showing Embodiment 2 of the present invention, FIG. 5 is a perspective view showing a conventional void appearance inspection device, FIGS. 6a and 7a are plan views showing images of the conventional example, and FIG. b,
FIG. 7b is a side view of the same. 1... Image recognition device, 2... Image recognition camera,
3...Package, 4...Void, 5...Shadow, 6...
...Optical axis, 7, 8, 9, 10, 14...Light source, 11
...Memory image, 15...Hollow rotating stage.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 樹脂封止パツケージのボイドの有無を判定する
ボイド外観検査装置において、樹脂封止パツケー
ジの表面を写し出す画像認識カメラと、パツケー
ジの表面を周方向の複数の位置から照射する光源
と、画像認織カメラより入力した複数の画像を記
憶し、これらの記憶画像に基づいて合成画像を生
成する画像認識装置とを有することを特徴とする
ボイド外観検査装置。
A void appearance inspection device that determines the presence or absence of voids in a resin-sealed package includes an image recognition camera that images the surface of the resin-sealed package, a light source that illuminates the surface of the package from multiple positions in the circumferential direction, and an image recognition camera. 1. A void appearance inspection device comprising: an image recognition device that stores a plurality of images inputted from a plurality of images, and generates a composite image based on these stored images.
JP3339389U 1989-03-25 1989-03-25 Pending JPH02124504U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3339389U JPH02124504U (en) 1989-03-25 1989-03-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3339389U JPH02124504U (en) 1989-03-25 1989-03-25

Publications (1)

Publication Number Publication Date
JPH02124504U true JPH02124504U (en) 1990-10-15

Family

ID=31537010

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3339389U Pending JPH02124504U (en) 1989-03-25 1989-03-25

Country Status (1)

Country Link
JP (1) JPH02124504U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014010138A (en) * 2012-07-03 2014-01-20 Ricoh Elemex Corp Inspection device and inspection method
WO2018088552A1 (en) * 2016-11-14 2018-05-17 日本碍子株式会社 Ceramic body defect inspecting device and defect inspecting method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014010138A (en) * 2012-07-03 2014-01-20 Ricoh Elemex Corp Inspection device and inspection method
WO2018088552A1 (en) * 2016-11-14 2018-05-17 日本碍子株式会社 Ceramic body defect inspecting device and defect inspecting method
JPWO2018088552A1 (en) * 2016-11-14 2018-11-15 日本碍子株式会社 Defect inspection apparatus and defect inspection method for ceramic body
US11226295B2 (en) 2016-11-14 2022-01-18 Ngk Insulators, Ltd. Ceramic body defect inspecting apparatus and defect inspecting method

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