JPH02105660A - Extended test link device in electronic exchange - Google Patents

Abstract

PURPOSE:To shorten a time required for a test with an inexpensive means by connecting an extended test link to a subscriber testing device side in an existing test link. CONSTITUTION:The test link 104 is connected to the terminal of a subscriber circuit 103, and the primary side of an extended test link 1 is connected to the subscriber testing device 106 side. The extended test link 1 is constituted of 16 relay switches of (4X16) with a concentration ratio of 1:4. When the test link 104 is of 16 levels, the subscriber circuit side(primary side) of the extended test link 1 is also of 16 levels, however, the subscriber testing device side(secondary side) goes to 64 levels by performing the variable connection of those levels. Therefore, a number to house the subscriber testing device is 16 in an on-going system, but, it can be increased to 64, which increases the test link. In such a way, since the subscriber testing device of four times that in the on-going system can be connected, it is possible to shorten the time required for the test to 1/4.

Description

[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to an expansion test link device in an electronic exchange, and in particular, to an electronic exchange device that enables the number of connected subscriber test devices to be expanded at a lower cost than ever before. This invention relates to an extended test link device in an exchange.

[Conventional technology]

As is well known, in electronic exchanges such as the D70 electronic exchange, it is necessary to test various functions of subscriber circuits and analog transmission characteristics periodically or from time to time. A test link is used in such cases.

An example of the above-mentioned IJ sink will be explained with reference to FIG.

As shown in the figure, a subscriber 102 such as a telephone is connected to one end of a subscriber line 101, and a first terminal of a subscriber circuit 103 that supplies communication current, etc. is connected to the other end.

The inside of the subscriber circuit 103 is composed of a changeover switch 103a, a movable terminal is connected to the first terminal, and a time division communication path switch 105 whose fixed contact, on the break side, constitutes a communication path as a second terminal. It is connected to the.

The make side of the fixed contact is connected as a third terminal to one end of the test link 104, and the other end is connected to the subscriber testing device 106. Further, a communication path control device 107 is connected to the time division communication path switch 105 for setting a route necessary for a communication, and this is connected to the common bus 109.
It is connected to a communication line common control device 108 for central processing using a storage program control method.

Although the figure shows the − group of subscribers 102 and subscriber circuits 103 connected to the test link 104, in reality, a large number of subscribers and subscriber circuits (for example, several hundred) are connected to the test link 104. are connected to each other, and these are tested in sequence.

As is clear from Fig. 3, the conventional test link 10
Reference numeral 4 provides a direct selective connection between the subscriber circuit and the subscriber test equipment, and this is constituted by a space division switch (for example, using a PNPN switch). That is, the subscriber test device 106 is fixedly connected to the test link 104, and the test link level and the type of test device etc. are uniquely determined for the subscriber circuit 103.

For this reason, for example, each test requires several tens of seconds, so the time required to complete the several hundred tests described above is extremely long.

The reason why the subscriber testing device 106 is applied to the subscriber circuit 103 without using the time division channel switch 105 as shown in the figure is as follows. That is, in an electronic exchange, digital signals are transmitted and received between the time division communication path switch and the subscriber circuit. In other words, it is not suitable for carrying analog signals. However, the test signal sent from the subscriber testing device to the subscriber circuit is an analog signal. Therefore, various tests were conducted independently from the time-division channel switch.

[Problem to be solved by the invention]

By the way, as mentioned above, the conventional subscriber test takes a lot of wasted time, so it is not very desirable from the standpoint of proceeding with the test work as efficiently as possible.

As a solution to this situation, for example, the subscriber circuit is divided into several groups and a subscriber testing device is connected to each group.

If each group is tested in this state, the total time required can be shortened.

However, as the number of subscriber test devices increases, the total number of existing test link levels cannot accommodate it.

A possible solution to such a case is, for example, to remove the existing test link and install a new test link that has a total number of levels that can accommodate all the subscriber test devices, even after the increase. However, this method has the disadvantage of being too expensive and impractical.

The present invention has been made in view of the above-mentioned circumstances, and its object is to provide an extended test link device in an electronic exchange to which a large number of subscriber test devices can be applied at low cost.

[Means to solve the problem]

The present invention provides a test link to which a subscriber circuit can be connected to the primary side, a subscriber test device etc. to be directly selectively connected to the secondary side, and a test link to which the above-described test link can be connected to the primary side. The expanded test link equipment in the electronic exchange is equipped with an extended test link that has the same total number of levels as the subscriber testing equipment side, and the secondary side has a greater number of levels than the subscriber testing equipment side of this test link. It is something that

In this way, the conventional test link can be used as is, and the total number of levels, which are apparently higher than conventional ones, can be increased, making it possible to connect a large number of subscriber test devices, etc. time can be shortened.

〔Example〕

Next, the present invention will be explained with reference to the drawings.

Note that the same reference numerals are simply given to the constituent members that have already been explained, and repeated explanations are avoided.

As shown in FIG. 1, a test link 104 is connected to the third terminal of the subscriber circuit 103, and one of the extended test links 1 is connected to the side to which the subscriber test device was conventionally connected.
The next side is connected.

The extended test link 1 is composed of 16 4×16 relay switches with a line concentration ratio of 1:4. As shown in FIG. 2, when the conventional test link 104 has 16 levels, the subscriber circuit side (primary side) of the IJ sink (extended test) has 16 levels. There are 64 levels on the subscriber testing device side (secondary side). Therefore, the number of subscriber testing devices that can be accommodated is conventionally 1.
What used to be 6 now becomes 64, making it possible to add more test links.

In this way, it is possible to connect four times as many subscriber test devices as before, so the time required for testing can be reduced to 1/2.
It can be shortened to 4.

In this example, the concentration ratio was set to 1=4, but 1:T
It goes without saying that it may be set to (1<an integer of T).

〔Effect of the invention〕

As explained above, according to the present invention, an extended test link is connected to the subscriber test device side of an existing test link,
The subscriber circuit side (primary side) has variable connections, and the subscriber testing device side (primary side) can have a higher total number of test link levels than before.

Therefore, the total number of TES+J sync bells can be easily increased without replacing the conventional test link, which has the effect of making it possible to significantly shorten the time required for testing with inexpensive means.

[Brief explanation of drawings]

FIG. 1 is a block diagram showing an embodiment of an extended test link device in an electronic exchange according to the present invention, FIG. 2 is a block diagram showing a detailed configuration of an extended test link device in an electronic exchange according to the present invention, and FIG. 3 is a conventional block diagram. FIG. 2 is a block diagram showing the position of a test link in an electronic exchange. 1...Extended test link, 103...Subscriber circuit, 104...Test link, 105...Time division channel switch, 106...
...Subscriber testing equipment. Figure 3 Primary side Secondary side

Claims (1)

[Scope of Claims] In an electronic exchange having a time-division communication path, which has a test link that allows direct selective connection of subscriber circuits and subscriber test equipment, etc. without going through the time-division communication path, the primary side A test link to which subscriber circuits can be connected, and subscriber test equipment etc. can be directly selected and connected to the secondary side, and the primary side has the same number of levels as the subscriber test equipment side of the test link. An extended test link device in an electronic exchange, characterized in that the extended test link has a total number of levels, and the secondary side has a greater total number of levels than the subscriber testing device side of the test link.