JPH0210524A - Optical head device - Google Patents

Optical head device

Info

Publication number
JPH0210524A
JPH0210524A JP63159311A JP15931188A JPH0210524A JP H0210524 A JPH0210524 A JP H0210524A JP 63159311 A JP63159311 A JP 63159311A JP 15931188 A JP15931188 A JP 15931188A JP H0210524 A JPH0210524 A JP H0210524A
Authority
JP
Japan
Prior art keywords
semiconductor laser
light
output
current value
recording medium
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63159311A
Other languages
Japanese (ja)
Inventor
Yutaka Yamanaka
豊 山中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP63159311A priority Critical patent/JPH0210524A/en
Publication of JPH0210524A publication Critical patent/JPH0210524A/en
Pending legal-status Critical Current

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  • Optical Head (AREA)

Abstract

PURPOSE:To easily detect any defect of a recording medium by setting the operating point of a semiconductor laser in a hysteresis loop without using any additional electric circuit. CONSTITUTION:The operating point of the semiconductor laser is set in the hysteresis loop. In case of a defect on the recording medium 4, because of its reflectance change, the light quantity of a return light to the semiconductor laser 2 is increased or decreased. As a result, even when the operating point is shifted, and the light quantity of the return light is restored to the original, this operating point is maintained. In case of increasing the reflectance, an optical output of the semiconductor laser is shifted from a low output to a high output, while in case of decreasing the reflectance, the optical output of the semiconductor laser is shifted from the high output to the low output. Consequently, by monitoring the output of the semiconductor laser 2, a defect of the recording medium 4 can be detected.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、光を用いて情報の記録再生を行う光記録に用
いる光ヘッド装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an optical head device used for optical recording that records and reproduces information using light.

〔従来の技術〕[Conventional technology]

光記録においては、光源からの出射光を微小スポットと
して光記録媒体上に照射して情報を記録し、また微弱光
を照射して反射率の変化より情報を検出する光ヘッド装
置を用いている。記録媒体としては、ディスク形状の基
板の表面に記録層を形成し、スパイラル状あるいは同心
円状のトランクを設けたものが主として使用されている
In optical recording, information is recorded by emitting light from a light source as a minute spot onto an optical recording medium, and an optical head device is used that irradiates weak light and detects information from changes in reflectance. . As a recording medium, one in which a recording layer is formed on the surface of a disk-shaped substrate and a spiral or concentric trunk is provided is mainly used.

このような光ヘッド装置を用いて記録媒体に情報の記録
を行うには、まず記録トランクを一度再生して、異常な
反射率の変化、つまり記録媒体に欠陥の無いことを確認
してから記録を行っている。
To record information on a recording medium using such an optical head device, first play back the recording trunk once to confirm that there are no abnormal changes in reflectance, that is, there are no defects on the recording medium, and then start recording. It is carried out.

従来の光ヘッド装置では、このような記録媒体欠陥の検
出には、電気的な回路を使用している。第4図はその構
成例であり、記録媒体からの反射光量を検出する光検出
器1からの出力をコンパレータ9に入力して異常な光量
変化が検出されたとき、フリップフロップ10をオン状
態とする。記録トラツクをスキャンした後に、フリップ
フロップ1oがオンになっていれば、そのトラックには
欠陥が生じていることがわかる。
Conventional optical head devices use electrical circuits to detect such recording medium defects. FIG. 4 shows an example of its configuration. When the output from the photodetector 1 that detects the amount of reflected light from the recording medium is input to the comparator 9 and an abnormal change in the amount of light is detected, the flip-flop 10 is turned on. do. If the flip-flop 1o is turned on after scanning a recording track, it is known that the track is defective.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上記のように情報の記録に際し記録媒体の欠陥を検出す
るために、従来は電気回路を構成し付加しなければなら
ないという問題点がある。
As described above, in order to detect defects in a recording medium when recording information, conventional methods have a problem in that an electric circuit must be constructed and added.

本発明の目的は、このような問題点を生じることなく容
易にトラックの欠陥検出をすることが可能な光ヘッド装
置を提供することにある。
An object of the present invention is to provide an optical head device that can easily detect track defects without causing such problems.

〔課題を解決するための手段〕[Means to solve the problem]

本発明は、光源と、この光源からの出射光ビームを集光
レンズにより記録媒体上に微小スポットとして集光し、
その集光点からの反射光を前記光源に戻す光学系を有す
る光ヘッド装置において、前記光源として、或る注入電
流値によって光出力が不連続に変化し、光出力が増加す
る方向に不連続に変化する注入電流値と光出力が減小す
る方向に不連続に変化する注入電流値とが異なるヒステ
リシス特性を示し、かつ外部からの戻り光にょって前記
注入電流値が変化する半導体レーザを用い、 この半導体レーザの動作点をヒステリシスループ内に設
定してあることを特徴としている。
The present invention includes a light source and a light beam emitted from the light source that is focused on a recording medium as a minute spot by a condensing lens.
In an optical head device having an optical system that returns reflected light from the light condensing point to the light source, the light source has a discontinuous change in optical output depending on a certain injection current value, and a discontinuous change in the direction in which the optical output increases. A semiconductor laser exhibits different hysteresis characteristics in which the injection current value changes in the direction of decreasing optical output and the injection current value changes discontinuously in the direction of decreasing optical output, and the injection current value changes depending on the return light from the outside. The operating point of this semiconductor laser is set within the hysteresis loop.

〔作用〕[Effect]

記録媒体に欠陥があると、その反射率の変化により半導
体レーザへの戻り光の光量が増大あるいは減小する。そ
の結果、動作点が移行し、戻り光の光量が元に復帰して
も、その動作点は維持される0反射率増大の場合には半
導体レーザの光出力は低出力から高出力に移行し、反射
率減小の場合には半導体レーザの光出力は高出力から低
出力に移行する。したがって、半導体レーザの出力をモ
ニタすることによって、記録媒体の欠陥を検出すること
が可能となる。
If there is a defect in the recording medium, the amount of light returned to the semiconductor laser increases or decreases due to a change in reflectance. As a result, even if the operating point shifts and the intensity of the returned light returns to its original value, the operating point will be maintained. 0 When the reflectance increases, the optical output of the semiconductor laser will shift from low to high output. , when the reflectance decreases, the optical output of the semiconductor laser shifts from high output to low output. Therefore, by monitoring the output of the semiconductor laser, it is possible to detect defects in the recording medium.

〔実施例〕〔Example〕

第1図に本発明の一実施例を示す。この光ヘッド装置は
、或る注入電流値によって光出力が不連続に変化し、光
出力が増加する方向に不連続に変化する注入電流値と光
出力が減小する方向に不連続に変化する注入電流値とが
異なるヒステリシス特性を示し、かつ外部からの戻り光
によって前記注入電流値が変化する半導体レーザ2と、
この半導体レーザの裏面に設けられ、半導体レーザ2の
出力をモニタする光検出器1と、半導体レーザ2からの
出射光ビームを記録媒体4上に微小スポットとして集光
し、その集光点からの反射光を半導体レーザ2に戻す集
光レンズ3とを有している。
FIG. 1 shows an embodiment of the present invention. In this optical head device, the optical output changes discontinuously depending on a certain injection current value, and the injection current value changes discontinuously in the direction in which the optical output increases, and the optical output changes discontinuously in the direction in which the optical output decreases. a semiconductor laser 2 that exhibits a hysteresis characteristic in which the injection current value is different from the injection current value, and in which the injection current value changes depending on return light from the outside;
A photodetector 1 is provided on the back side of the semiconductor laser to monitor the output of the semiconductor laser 2, and a photodetector 1 is provided to monitor the output of the semiconductor laser 2, and a photodetector 1 is installed to condense the emitted light beam from the semiconductor laser 2 as a minute spot on the recording medium 4. It has a condenser lens 3 that returns reflected light to the semiconductor laser 2.

半導体レーザ2としては、例えば第2図に示すような共
振器長方向で片側の電極を分割して励起領域5と吸収領
域6を設けたようなタンデム電極形の半導体レーザを用
いる。この半導体レーザは、第3図に示すように、注入
電流と光出力の関係がヒステリシスを描く。すなわち、
特定の注入電流値によって光出力が不連続に変化し、こ
の特定の注入電流値が光出力を増加する方向と減小する
方向とでは異なる特性を示す、また外部からの戻り光量
が増すとヒステリシスループが実線から破線のように変
化する。
As the semiconductor laser 2, a tandem electrode type semiconductor laser is used, for example, as shown in FIG. 2, in which an excitation region 5 and an absorption region 6 are provided by dividing one electrode in the resonator length direction. In this semiconductor laser, as shown in FIG. 3, the relationship between the injection current and the optical output shows hysteresis. That is,
The optical output changes discontinuously depending on a specific injection current value, and exhibits different characteristics depending on whether the specific injection current value increases or decreases the optical output, and hysteresis occurs when the amount of light returned from the outside increases. The loop changes from a solid line to a broken line.

次に、本実施例における記録媒体欠陥検出動作を説明す
る。
Next, the recording medium defect detection operation in this embodiment will be explained.

半導体レーザ2は、第3図に示すヒステリシスループに
おいて動作点をP7に設定し、微弱光を出射させる。半
導体レーザ2からの出射光は集光レンズ3によって記録
媒体4上に集光され、その集光点からの反射光は逆の経
路で半導体レーザ2に戻る。記録媒体4に欠陥があり異
常な反射率増大があれば、戻り光量が増加するので動作
点P17に状態が変わり、反射率が元に戻ってもこの状
態は維持される。
The semiconductor laser 2 sets its operating point at P7 in the hysteresis loop shown in FIG. 3, and emits weak light. The light emitted from the semiconductor laser 2 is focused onto the recording medium 4 by the condenser lens 3, and the reflected light from the focus point returns to the semiconductor laser 2 in the opposite path. If there is a defect in the recording medium 4 and there is an abnormal increase in reflectance, the amount of returned light increases, so the state changes to operating point P17, and this state is maintained even if the reflectance returns to its original value.

光検出器lは、半導体レーザ2の裏面で出力をモニタし
ており、光出力の増加により反射率を増大させる欠陥が
記録媒体4にあることがわかる。
The photodetector l monitors the output on the back surface of the semiconductor laser 2, and it can be seen that there is a defect in the recording medium 4 that increases the reflectance due to an increase in the optical output.

また、反射率を減小させるような欠陥を検出する場合に
は、動作点をP8としておけば戻り光量の減小で動作点
P1Bに状態が移行し、反射率が元に戻ってもこの状態
は維持される。光出力の減小は、光検出器lにより検出
され、記録媒体4に欠陥があることがわかる。
In addition, when detecting a defect that decreases the reflectance, if the operating point is set to P8, the state will shift to the operating point P1B as the amount of returned light decreases, and even if the reflectance returns to its original state, it will remain in this state. is maintained. The decrease in light output is detected by the photodetector l, indicating that the recording medium 4 is defective.

以上の実施例では、半導体レーザ2の光出力の変化を半
導体レーザ2の裏面に設けた光検出器で行っているが、
第2図に示すように半導体レーザ2の吸収領域6に接続
した抵抗11に流れる電流値をモニタしてもよい。
In the above embodiment, the optical output of the semiconductor laser 2 is changed by a photodetector provided on the back surface of the semiconductor laser 2.
As shown in FIG. 2, the value of the current flowing through the resistor 11 connected to the absorption region 6 of the semiconductor laser 2 may be monitored.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、付加的な電気回路を用いることなく、
光ヘッド装置自体で容易に記録媒体の欠陥の検出をする
ことが可能となる。
According to the present invention, without using additional electrical circuits,
It becomes possible to easily detect defects in the recording medium using the optical head device itself.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示す図、 第2図は本発明に用いる半導体レーザの構成を示す図、 第3図は半導体レーザのヒステリシス特性を示す図、 第4図は従来の欠陥検出用回路を示す図である。 1・・・・・光検出器 2・・・・・半導体レーザ 3・・・・・集光レンズ 4・・・・・記録媒体 5・・・・・励起領域 6 ・ 9 ・ 10・ 11・ ・吸収領域 ・コンパレータ ・フリツプフロツプ ・抵抗 FIG. 1 is a diagram showing an embodiment of the present invention; FIG. 2 is a diagram showing the configuration of a semiconductor laser used in the present invention; Figure 3 is a diagram showing the hysteresis characteristics of a semiconductor laser. FIG. 4 is a diagram showing a conventional defect detection circuit. 1...Photodetector 2... Semiconductor laser 3...Condensing lens 4...Recording medium 5...Excitation region 6・ 9・ 10・ 11・ ・Absorption area ·comparator ・Flip Flop ·resistance

Claims (1)

【特許請求の範囲】[Claims] (1)光源と、この光源からの出射光ビームを集光レン
ズにより記録媒体上に微小スポットとして集光し、その
集光点からの反射光を前記光源に戻す光学系を有する光
ヘッド装置において、 前記光源として、或る注入電流値によって光出力が不連
続に変化し、光出力が増加する方向に不連続に変化する
注入電流値と光出力が減小する方向に不連続に変化する
注入電流値とが異なるヒステリシス特性を示し、かつ外
部からの戻り光によって前記注入電流値が変化する半導
体レーザを用い、 この半導体レーザの動作点をヒステリシスループ内に設
定してあることを特徴とする光ヘッド装置。
(1) In an optical head device that includes a light source and an optical system that focuses the emitted light beam from the light source as a minute spot on a recording medium using a condensing lens, and returns reflected light from the condensed point to the light source. As the light source, the light output changes discontinuously depending on a certain injection current value, and the injection current value changes discontinuously in the direction of increasing the optical output and the injection current value changes discontinuously in the direction of decreasing the optical output. A light source characterized by using a semiconductor laser that exhibits a hysteresis characteristic that differs from a current value, and in which the injected current value changes depending on return light from the outside, and the operating point of this semiconductor laser is set within a hysteresis loop. head device.
JP63159311A 1988-06-29 1988-06-29 Optical head device Pending JPH0210524A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63159311A JPH0210524A (en) 1988-06-29 1988-06-29 Optical head device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63159311A JPH0210524A (en) 1988-06-29 1988-06-29 Optical head device

Publications (1)

Publication Number Publication Date
JPH0210524A true JPH0210524A (en) 1990-01-16

Family

ID=15691027

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63159311A Pending JPH0210524A (en) 1988-06-29 1988-06-29 Optical head device

Country Status (1)

Country Link
JP (1) JPH0210524A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7339870B2 (en) 2003-12-25 2008-03-04 Hitachi, Ltd. Optical disk apparatus and data reproducing method
DE112020001208T5 (en) 2019-03-11 2021-11-25 Livedo Corporation Folded absorbent article and single packaging for absorbent articles
DE112020001207T5 (en) 2019-03-11 2021-11-25 Livedo Corporation Absorbent article

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7339870B2 (en) 2003-12-25 2008-03-04 Hitachi, Ltd. Optical disk apparatus and data reproducing method
US7724625B2 (en) 2003-12-25 2010-05-25 Hitachi, Ltd. Optical disk apparatus and data reproducing method
DE112020001208T5 (en) 2019-03-11 2021-11-25 Livedo Corporation Folded absorbent article and single packaging for absorbent articles
DE112020001207T5 (en) 2019-03-11 2021-11-25 Livedo Corporation Absorbent article

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