JPH02102720U - - Google Patents

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Publication number
JPH02102720U
JPH02102720U JP989889U JP989889U JPH02102720U JP H02102720 U JPH02102720 U JP H02102720U JP 989889 U JP989889 U JP 989889U JP 989889 U JP989889 U JP 989889U JP H02102720 U JPH02102720 U JP H02102720U
Authority
JP
Japan
Prior art keywords
detection device
pattern
optical system
pattern detection
slit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP989889U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP989889U priority Critical patent/JPH02102720U/ja
Publication of JPH02102720U publication Critical patent/JPH02102720U/ja
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本案の一実施例の概略図、第2図は公
知のパターン検出装置の概略図、第3図は投影レ
ンズの色収差を示す概念図である。 1……レテイクル、2……投影レンズ、3……
ウエハ、3′……ウエハ上の位置合せ用パターン
、4……ウエハステージ、5……結像光学系、6
……波長選択ミラー、7,7′……2次結像光学
系、8……スリツト板、9……スリツト、10…
…光検出器。
FIG. 1 is a schematic diagram of an embodiment of the present invention, FIG. 2 is a schematic diagram of a known pattern detection device, and FIG. 3 is a conceptual diagram showing chromatic aberration of a projection lens. 1... Reticle, 2... Projection lens, 3...
Wafer, 3'... alignment pattern on wafer, 4... wafer stage, 5... imaging optical system, 6
...Wavelength selection mirror, 7, 7'...Secondary imaging optical system, 8...Slit plate, 9...Slit, 10...
...photodetector.

Claims (1)

【実用新案登録請求の範囲】 1 原画パターンを投影レンズを介して被露光体
へ転写すると共に、被露光体に設けた位置合せ用
ターゲツトパターンを上記投影レンズを介し、複
数種の波長の光を用いて検出するパターン検出装
置を有する光露光装置で、前述のパターン検出装
置内に波長選択ミラーと、各々の波長の光により
結像される上記ターゲツトマークの各々の結像位
置に対応した光学系を設け、各々光検出器を配備
することにより複数の波長による検出を同時に検
出できる事を特徴とするパターン検出装置。 2 請求項1において、前記各々の光検出器が結
像を走査するためのスリツト板を共有し、かつ前
記スリツト板には、各々の光学系に応じたスリツ
トが設けられていて、スリツト板を1回動作させ
ることにより同時に各々の検出器の検出が実行さ
れることを特徴とするパターン検出装置。
[Claims for Utility Model Registration] 1. An original pattern is transferred to an exposed object through a projection lens, and a target pattern for alignment provided on the exposed object is emitted with light of multiple wavelengths through the projection lens. A light exposure apparatus having a pattern detection device for detection using a pattern detection device, which includes a wavelength selection mirror in the pattern detection device, and an optical system corresponding to each image formation position of the target mark imaged by light of each wavelength. What is claimed is: 1. A pattern detection device characterized in that it is capable of simultaneously detecting detection using a plurality of wavelengths by providing a photodetector for each. 2. In claim 1, each of the photodetectors shares a slit plate for scanning an image, and the slit plate is provided with a slit corresponding to each optical system, and the slit plate is provided with a slit corresponding to each optical system. A pattern detection device characterized in that detection by each detector is executed simultaneously by operating the device once.
JP989889U 1989-02-01 1989-02-01 Pending JPH02102720U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP989889U JPH02102720U (en) 1989-02-01 1989-02-01

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP989889U JPH02102720U (en) 1989-02-01 1989-02-01

Publications (1)

Publication Number Publication Date
JPH02102720U true JPH02102720U (en) 1990-08-15

Family

ID=31217049

Family Applications (1)

Application Number Title Priority Date Filing Date
JP989889U Pending JPH02102720U (en) 1989-02-01 1989-02-01

Country Status (1)

Country Link
JP (1) JPH02102720U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05175096A (en) * 1991-12-26 1993-07-13 Hitachi Ltd Optical projection exposure device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05175096A (en) * 1991-12-26 1993-07-13 Hitachi Ltd Optical projection exposure device

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