JPH0197270U - - Google Patents

Info

Publication number
JPH0197270U
JPH0197270U JP19436687U JP19436687U JPH0197270U JP H0197270 U JPH0197270 U JP H0197270U JP 19436687 U JP19436687 U JP 19436687U JP 19436687 U JP19436687 U JP 19436687U JP H0197270 U JPH0197270 U JP H0197270U
Authority
JP
Japan
Prior art keywords
transistor
semiconductor device
device evaluation
view
evaluation jig
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19436687U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19436687U priority Critical patent/JPH0197270U/ja
Publication of JPH0197270U publication Critical patent/JPH0197270U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP19436687U 1987-12-21 1987-12-21 Pending JPH0197270U (enrdf_load_html_response)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19436687U JPH0197270U (enrdf_load_html_response) 1987-12-21 1987-12-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19436687U JPH0197270U (enrdf_load_html_response) 1987-12-21 1987-12-21

Publications (1)

Publication Number Publication Date
JPH0197270U true JPH0197270U (enrdf_load_html_response) 1989-06-28

Family

ID=31485097

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19436687U Pending JPH0197270U (enrdf_load_html_response) 1987-12-21 1987-12-21

Country Status (1)

Country Link
JP (1) JPH0197270U (enrdf_load_html_response)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013242228A (ja) * 2012-05-21 2013-12-05 Mitsubishi Electric Corp 半導体検査治具

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013242228A (ja) * 2012-05-21 2013-12-05 Mitsubishi Electric Corp 半導体検査治具

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