JPH0197270U - - Google Patents
Info
- Publication number
- JPH0197270U JPH0197270U JP19436687U JP19436687U JPH0197270U JP H0197270 U JPH0197270 U JP H0197270U JP 19436687 U JP19436687 U JP 19436687U JP 19436687 U JP19436687 U JP 19436687U JP H0197270 U JPH0197270 U JP H0197270U
- Authority
- JP
- Japan
- Prior art keywords
- transistor
- semiconductor device
- device evaluation
- view
- evaluation jig
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000011156 evaluation Methods 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 claims description 3
- 239000003990 capacitor Substances 0.000 description 2
- 239000011888 foil Substances 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19436687U JPH0197270U (cs) | 1987-12-21 | 1987-12-21 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19436687U JPH0197270U (cs) | 1987-12-21 | 1987-12-21 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0197270U true JPH0197270U (cs) | 1989-06-28 |
Family
ID=31485097
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19436687U Pending JPH0197270U (cs) | 1987-12-21 | 1987-12-21 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0197270U (cs) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013242228A (ja) * | 2012-05-21 | 2013-12-05 | Mitsubishi Electric Corp | 半導体検査治具 |
-
1987
- 1987-12-21 JP JP19436687U patent/JPH0197270U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013242228A (ja) * | 2012-05-21 | 2013-12-05 | Mitsubishi Electric Corp | 半導体検査治具 |