JPH0197267U - - Google Patents

Info

Publication number
JPH0197267U
JPH0197267U JP19334087U JP19334087U JPH0197267U JP H0197267 U JPH0197267 U JP H0197267U JP 19334087 U JP19334087 U JP 19334087U JP 19334087 U JP19334087 U JP 19334087U JP H0197267 U JPH0197267 U JP H0197267U
Authority
JP
Japan
Prior art keywords
semiconductor device
under test
refrigerant
device under
tester
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19334087U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19334087U priority Critical patent/JPH0197267U/ja
Publication of JPH0197267U publication Critical patent/JPH0197267U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP19334087U 1987-12-18 1987-12-18 Pending JPH0197267U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19334087U JPH0197267U (enExample) 1987-12-18 1987-12-18

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19334087U JPH0197267U (enExample) 1987-12-18 1987-12-18

Publications (1)

Publication Number Publication Date
JPH0197267U true JPH0197267U (enExample) 1989-06-28

Family

ID=31484138

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19334087U Pending JPH0197267U (enExample) 1987-12-18 1987-12-18

Country Status (1)

Country Link
JP (1) JPH0197267U (enExample)

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