JPH0189379U - - Google Patents

Info

Publication number
JPH0189379U
JPH0189379U JP18459187U JP18459187U JPH0189379U JP H0189379 U JPH0189379 U JP H0189379U JP 18459187 U JP18459187 U JP 18459187U JP 18459187 U JP18459187 U JP 18459187U JP H0189379 U JPH0189379 U JP H0189379U
Authority
JP
Japan
Prior art keywords
leaf spring
semiconductor device
spring contactor
measuring
view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18459187U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18459187U priority Critical patent/JPH0189379U/ja
Publication of JPH0189379U publication Critical patent/JPH0189379U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP18459187U 1987-12-02 1987-12-02 Pending JPH0189379U (US06272168-20010807-M00014.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18459187U JPH0189379U (US06272168-20010807-M00014.png) 1987-12-02 1987-12-02

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18459187U JPH0189379U (US06272168-20010807-M00014.png) 1987-12-02 1987-12-02

Publications (1)

Publication Number Publication Date
JPH0189379U true JPH0189379U (US06272168-20010807-M00014.png) 1989-06-13

Family

ID=31475940

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18459187U Pending JPH0189379U (US06272168-20010807-M00014.png) 1987-12-02 1987-12-02

Country Status (1)

Country Link
JP (1) JPH0189379U (US06272168-20010807-M00014.png)

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