JPH0186055U - - Google Patents
Info
- Publication number
- JPH0186055U JPH0186055U JP1987181407U JP18140787U JPH0186055U JP H0186055 U JPH0186055 U JP H0186055U JP 1987181407 U JP1987181407 U JP 1987181407U JP 18140787 U JP18140787 U JP 18140787U JP H0186055 U JPH0186055 U JP H0186055U
- Authority
- JP
- Japan
- Prior art keywords
- electron microscope
- scanning electron
- load
- load actuator
- test piece
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004154 testing of material Methods 0.000 claims description 3
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987181407U JPH0614400Y2 (ja) | 1987-11-28 | 1987-11-28 | 走査電子顕微鏡付き材料試験機 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1987181407U JPH0614400Y2 (ja) | 1987-11-28 | 1987-11-28 | 走査電子顕微鏡付き材料試験機 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0186055U true JPH0186055U (cs) | 1989-06-07 |
JPH0614400Y2 JPH0614400Y2 (ja) | 1994-04-13 |
Family
ID=31472891
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1987181407U Expired - Lifetime JPH0614400Y2 (ja) | 1987-11-28 | 1987-11-28 | 走査電子顕微鏡付き材料試験機 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0614400Y2 (cs) |
-
1987
- 1987-11-28 JP JP1987181407U patent/JPH0614400Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0614400Y2 (ja) | 1994-04-13 |