JPH0185680U - - Google Patents
Info
- Publication number
- JPH0185680U JPH0185680U JP18083887U JP18083887U JPH0185680U JP H0185680 U JPH0185680 U JP H0185680U JP 18083887 U JP18083887 U JP 18083887U JP 18083887 U JP18083887 U JP 18083887U JP H0185680 U JPH0185680 U JP H0185680U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- electrode
- jig
- unit
- view
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010438 heat treatment Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 description 1
- 150000003377 silicon compounds Chemical class 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Description
第１図ａは本考案の温度特性測定用治具の実施
例１を示す斜視図、第１図ｂは第１図ａのＡ―Ａ
線断面図、第２図ａは実施例２の温度特性測定用
治具を示す斜視図、第２図ｂは第２図ａのＢ―Ｂ
線断面図、第３図ａは従来の温度特性測定用治具
を示す斜視図、第３図ｂは第３図ａのＣ―Ｃ線断
面図である。
１……試料加熱用ユニツト、２……ソケツト、
３……電極、４……ソケツト支持部、５……フツ
ク、６……ヒータ線、７……溝、８……試料、９
……試料のリード、１０……シリコンコンパウン
ド、１１……ブロツク、１２……ビス、１３……
固定用金型、１４……配線、１５……加熱ヒータ
。
FIG. 1a is a perspective view showing Embodiment 1 of the temperature characteristic measuring jig of the present invention, and FIG. 1b is A-A in FIG. 1a.
A line sectional view, FIG. 2a is a perspective view showing the temperature characteristic measurement jig of Example 2, and FIG. 2b is a line BB of FIG. 2a.
3a is a perspective view showing a conventional temperature characteristic measuring jig, and FIG. 3b is a sectional view taken along the line CC in FIG. 3a. 1... Sample heating unit, 2... Socket,
3... Electrode, 4... Socket support part, 5... Hook, 6... Heater wire, 7... Groove, 8... Sample, 9
...Sample lead, 10...Silicon compound, 11...Block, 12...Screw, 13...
Fixing mold, 14... Wiring, 15... Heater.
Claims (1)
ツト上に設置した試料の電極端子に接触する電極
を設けたソケツトとの組合せからなることを特徴
とする温度特性測定用治具。 A jig for measuring temperature characteristics, comprising a combination of a sample heating unit that heats a sample, and a socket provided with an electrode that contacts an electrode terminal of the sample placed on the unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18083887U JPH0185680U (en) | 1987-11-27 | 1987-11-27 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18083887U JPH0185680U (en) | 1987-11-27 | 1987-11-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0185680U true JPH0185680U (en) | 1989-06-07 |
Family
ID=31472343
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18083887U Pending JPH0185680U (en) | 1987-11-27 | 1987-11-27 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0185680U (en) |
-
1987
- 1987-11-27 JP JP18083887U patent/JPH0185680U/ja active Pending
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