JPH0170170U - - Google Patents

Info

Publication number
JPH0170170U
JPH0170170U JP1987118426U JP11842687U JPH0170170U JP H0170170 U JPH0170170 U JP H0170170U JP 1987118426 U JP1987118426 U JP 1987118426U JP 11842687 U JP11842687 U JP 11842687U JP H0170170 U JPH0170170 U JP H0170170U
Authority
JP
Japan
Prior art keywords
integrated circuit
test head
circuit testing
support part
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1987118426U
Other languages
English (en)
Japanese (ja)
Other versions
JP2511186Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987118426U priority Critical patent/JP2511186Y2/ja
Publication of JPH0170170U publication Critical patent/JPH0170170U/ja
Application granted granted Critical
Publication of JP2511186Y2 publication Critical patent/JP2511186Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1987118426U 1987-07-31 1987-07-31 集積回路試験装置 Expired - Lifetime JP2511186Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987118426U JP2511186Y2 (ja) 1987-07-31 1987-07-31 集積回路試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987118426U JP2511186Y2 (ja) 1987-07-31 1987-07-31 集積回路試験装置

Publications (2)

Publication Number Publication Date
JPH0170170U true JPH0170170U (US07413550-20080819-C00001.png) 1989-05-10
JP2511186Y2 JP2511186Y2 (ja) 1996-09-18

Family

ID=31362774

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987118426U Expired - Lifetime JP2511186Y2 (ja) 1987-07-31 1987-07-31 集積回路試験装置

Country Status (1)

Country Link
JP (1) JP2511186Y2 (US07413550-20080819-C00001.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2006129372A1 (ja) * 2005-06-03 2008-12-25 株式会社アドバンテスト 半導体試験装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2006129372A1 (ja) * 2005-06-03 2008-12-25 株式会社アドバンテスト 半導体試験装置

Also Published As

Publication number Publication date
JP2511186Y2 (ja) 1996-09-18

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