JPH0167563U - - Google Patents

Info

Publication number
JPH0167563U
JPH0167563U JP1987163376U JP16337687U JPH0167563U JP H0167563 U JPH0167563 U JP H0167563U JP 1987163376 U JP1987163376 U JP 1987163376U JP 16337687 U JP16337687 U JP 16337687U JP H0167563 U JPH0167563 U JP H0167563U
Authority
JP
Japan
Prior art keywords
measured
rotationally symmetric
symmetric surface
measurement device
flaw detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1987163376U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987163376U priority Critical patent/JPH0167563U/ja
Publication of JPH0167563U publication Critical patent/JPH0167563U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP1987163376U 1987-10-26 1987-10-26 Pending JPH0167563U (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987163376U JPH0167563U (zh) 1987-10-26 1987-10-26

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987163376U JPH0167563U (zh) 1987-10-26 1987-10-26

Publications (1)

Publication Number Publication Date
JPH0167563U true JPH0167563U (zh) 1989-05-01

Family

ID=31448048

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987163376U Pending JPH0167563U (zh) 1987-10-26 1987-10-26

Country Status (1)

Country Link
JP (1) JPH0167563U (zh)

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