JPH0159880U - - Google Patents

Info

Publication number
JPH0159880U
JPH0159880U JP15640887U JP15640887U JPH0159880U JP H0159880 U JPH0159880 U JP H0159880U JP 15640887 U JP15640887 U JP 15640887U JP 15640887 U JP15640887 U JP 15640887U JP H0159880 U JPH0159880 U JP H0159880U
Authority
JP
Japan
Prior art keywords
positional
terminals
power supply
whose
bias power
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15640887U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15640887U priority Critical patent/JPH0159880U/ja
Publication of JPH0159880U publication Critical patent/JPH0159880U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP15640887U 1987-10-12 1987-10-12 Pending JPH0159880U (US20030204162A1-20031030-M00001.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15640887U JPH0159880U (US20030204162A1-20031030-M00001.png) 1987-10-12 1987-10-12

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15640887U JPH0159880U (US20030204162A1-20031030-M00001.png) 1987-10-12 1987-10-12

Publications (1)

Publication Number Publication Date
JPH0159880U true JPH0159880U (US20030204162A1-20031030-M00001.png) 1989-04-14

Family

ID=31434920

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15640887U Pending JPH0159880U (US20030204162A1-20031030-M00001.png) 1987-10-12 1987-10-12

Country Status (1)

Country Link
JP (1) JPH0159880U (US20030204162A1-20031030-M00001.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013148538A (ja) * 2012-01-23 2013-08-01 Shindengen Electric Mfg Co Ltd 半導体試験装置、半導体試験方法及び半導体デバイス

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013148538A (ja) * 2012-01-23 2013-08-01 Shindengen Electric Mfg Co Ltd 半導体試験装置、半導体試験方法及び半導体デバイス

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