JPH0143654Y2 - - Google Patents

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Publication number
JPH0143654Y2
JPH0143654Y2 JP20133282U JP20133282U JPH0143654Y2 JP H0143654 Y2 JPH0143654 Y2 JP H0143654Y2 JP 20133282 U JP20133282 U JP 20133282U JP 20133282 U JP20133282 U JP 20133282U JP H0143654 Y2 JPH0143654 Y2 JP H0143654Y2
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JP
Japan
Prior art keywords
voltage
measured
amplifier
circuit
touch sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP20133282U
Other languages
Japanese (ja)
Other versions
JPS59106082U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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Priority to JP20133282U priority Critical patent/JPS59106082U/en
Publication of JPS59106082U publication Critical patent/JPS59106082U/en
Application granted granted Critical
Publication of JPH0143654Y2 publication Critical patent/JPH0143654Y2/ja
Granted legal-status Critical Current

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Relating To Insulation (AREA)
  • Emergency Protection Circuit Devices (AREA)

Description

【考案の詳細な説明】 本考案は、被測定物を流れる電流が設定量を越
えると試験電圧の印加をしや断させる過電流しや
断装置と、被測定物への試験電圧の印加が正常に
行われているか否かを感知する所謂タツチセンサ
とを備えた絶縁耐力或は絶縁抵抗を測定する絶縁
耐圧試験器に関するものである。
[Detailed description of the invention] The invention consists of an overcurrent cutoff device that cuts off the application of a test voltage when the current flowing through the object to be measured exceeds a set amount, and an overcurrent cut-off device that cuts off the application of the test voltage to the object to be measured. The present invention relates to a dielectric strength tester that measures dielectric strength or insulation resistance and is equipped with a so-called touch sensor that detects whether the test is being performed normally.

直流又は交流耐圧試験器にタツチセンサを付属
させることは、実公昭57−11262及び実公昭57−
11263により周知であり、これによれば、被測定
物へ印加された交流電圧に対応する微小交流を検
出することにより高圧試験用ラインの被測定物へ
の接触状態或はその断線の有無がランプ、OK表
示回路等により確認可能になる。
Attaching a touch sensor to a DC or AC withstand voltage tester is prohibited in accordance with Utility Model Publication No. 57-11262 and Utility Model Publication No. 57-11262.
11263, and according to this, by detecting a minute alternating current corresponding to the alternating current voltage applied to the object to be measured, the state of contact of the high-voltage test line to the object to be measured or the presence or absence of a disconnection can be detected using a lamp. This can be confirmed using an OK display circuit, etc.

そこで、本考案はさらに改良を加えて簡単な回
路構成のタツチセンサを備えた冒頭に述べた種の
絶縁耐圧試験器を提供することを目的とする。
Therefore, it is an object of the present invention to provide a dielectric strength tester of the type mentioned at the beginning which is further improved and equipped with a touch sensor having a simple circuit configuration.

次に本考案を図示の実施例を基に説明する。 Next, the present invention will be explained based on the illustrated embodiments.

第1図及び第2図は、本考案を交流耐圧試験器
に適用した場合の実施例を示すもので、第1図に
おいて1は摺動変圧器、2はその出力電圧を昇圧
して試験電圧源として機能する高圧トランス、3
はその出力電圧を測定する交流電圧計、4は試験
電圧源のアース側ラインへ挿入された過電流しや
断装置、4′はこの装置に付属して試験電圧源の
入力電圧例えば100Vの商用電源をしや断するリ
レー接点、5は過電流しや断装置4の一部の回路
と共にタツチセンサを構成する微小交流検出部、
6は例えば高圧プローブとして構成され得る高圧
側リード線(ライン)、7はアース側リード線、
8は被測定物(この実施例では変圧器の1次及び
2次側端子にリード線6,7がそれぞれ接続され
ているものとする)である。
Figures 1 and 2 show an embodiment in which the present invention is applied to an AC withstanding voltage tester. a high voltage transformer serving as a source, 3
is an AC voltmeter that measures the output voltage, 4 is an overcurrent cut-off device inserted into the ground line of the test voltage source, and 4' is an attached device that measures the input voltage of the test voltage source, for example, 100V commercial A relay contact for cutting off the power supply; 5 is a minute alternating current detection part that constitutes a touch sensor together with a part of the circuit of the overcurrent cutoff device 4;
6 is a high voltage side lead wire (line) that can be configured as a high voltage probe, 7 is a ground side lead wire,
Reference numeral 8 denotes an object to be measured (in this embodiment, lead wires 6 and 7 are connected to the primary and secondary terminals of a transformer, respectively).

このうち、過電流しや断装置4は、第2図によ
り詳細に示す如く、しや断電流の設定量を切換え
るための切換スイツチ11と、試験電圧源即ち高
圧トランス2及び被測定物間のアース側ラインへ
直列に挿入され、かつ前記設定量に相当する測定
電流に対してそれぞれ同一レベルの電圧降下を呈
する値に選択された抵抗器群12と、過電圧入力
に対する保護用のバリスタ13と、抵抗器群12
のうち切換スイツチ11により選択された抵抗器
に生じた電圧降下を入力とする増幅器14と、そ
の増幅出力に対する整流・平滑回路15と、その
直流出力と基準レベルとを比較する比較器16
と、その比較出力を基にリレー接点4′を開放状
態に保持する例えばサイリスタを用いた駆動回路
17とより構成されている。また、微小交流検出
部5は、整流・平滑回路15の直流出力に対する
増幅器21と、その増幅出力と基準レベルとを比
較し、かつその比較出力により発光ダイオード2
3を駆動する比較器22とから構成されている。
そして抵抗器群12のそれぞれの抵抗値及び増幅
器14の利得は、測定電流が例えば0.5mA〜
100mAの範囲で選択される所定量を越えると、
整流・平滑回路15の出力レベルが比較器16の
基準レベルを越えるように設定されている。一
方、増幅器21の利得は、被測定物8の分布静電
容量Coを流れる例えば5μAの微小交流が抵抗器
群12の最小値の抵抗を流れた場合に、整流・平
滑回路15の直流出力がさらに増幅されて比較回
路22の基準レベルを越え得る程度に設定されて
いる。結果としてタツチセンサの電圧利得は、両
増幅器14及び21の利得の積になつている。
As shown in more detail in FIG. 2, the overcurrent cutoff device 4 is connected between a changeover switch 11 for switching the set amount of cutoff current, a test voltage source, that is, a high voltage transformer 2, and an object to be measured. a group of resistors 12 inserted in series to the ground side line and each having a value selected to exhibit the same level of voltage drop with respect to the measured current corresponding to the set amount; and a varistor 13 for protection against overvoltage input; Resistor group 12
Among them, an amplifier 14 receives as input the voltage drop generated in the resistor selected by the changeover switch 11, a rectifier/smoothing circuit 15 for its amplified output, and a comparator 16 for comparing its DC output with a reference level.
and a drive circuit 17 using, for example, a thyristor, which holds the relay contact 4' in an open state based on the comparison output. Further, the minute AC detection unit 5 compares the amplified output of the amplifier 21 for the DC output of the rectification/smoothing circuit 15 with a reference level, and uses the comparison output to detect the light emitting diode 2.
3, and a comparator 22 that drives 3.
The resistance value of each resistor group 12 and the gain of the amplifier 14 are such that the measurement current is, for example, 0.5 mA to 0.5 mA.
If a predetermined amount selected in the range of 100mA is exceeded,
The output level of the rectifier/smoothing circuit 15 is set to exceed the reference level of the comparator 16. On the other hand, the gain of the amplifier 21 is such that when a minute AC of, for example, 5 μA flowing through the distributed capacitance Co of the object to be measured 8 flows through the minimum resistance of the resistor group 12, the DC output of the rectifier/smoothing circuit 15 The signal is set to such an extent that it can be further amplified and exceed the reference level of the comparison circuit 22. As a result, the voltage gain of the touch sensor is the product of the gains of both amplifiers 14 and 21.

動作に際して、摺動変圧器1により設定された
交流電圧が高圧トランス2の2次側から被測定物
8へ印加され、両リード線6,7と被測定物8と
の接触状態が正常であれば、微小交流電流がその
分布容量Co通つて抵抗器群12に電圧降下を生
ぜしめる。通常、この電流は被測定物8の静電容
諒を最小で20pFとすれば1KVの印加電圧に対し
て5μA以上であり、対応する電圧降下が増幅器1
4で増幅されて整流・平滑回路15の出力に直流
電圧として現れる。そしてこの直流電圧は、しや
断電流である0.5mA〜100mAに対応するレベル
よりは十分小さいために比較器16の基準レベル
には達すること無く、増幅器21でさらに増幅さ
れることにより比較器22の基準レベルを越え
る。したがつて、発光ダイオード23が発光し、
被測定物に正常に高圧が印加されていることが報
知される。この状態で電圧計3で監視しつつ高圧
を上昇させ、測定過程で測定電流が切換スイツチ
11で選択された所定量を越えると、対応して整
流・平滑回路15の直流出力レベルが比較器16
の基準レベルを越え、その比較出力を基に駆動回
路17がリレー接点4′を開放状態に保持する。
逆に、微小交流が流れないために発光ダイオード
23が発光しない場合、リード線6,7の断線或
は接触不良等が生じていることが分る。
During operation, the AC voltage set by the sliding transformer 1 is applied from the secondary side of the high-voltage transformer 2 to the object to be measured 8, and if the contact state between the lead wires 6, 7 and the object to be measured 8 is normal. For example, a minute alternating current causes a voltage drop in the resistor group 12 through the distributed capacitance Co. Normally, this current is 5 μA or more for an applied voltage of 1 KV, assuming that the capacitance of the device under test 8 is at least 20 pF, and the corresponding voltage drop is
4 and appears as a DC voltage at the output of the rectifier/smoothing circuit 15. Since this DC voltage is sufficiently lower than the level corresponding to the 0.5 mA to 100 mA which is the cut-off current, it does not reach the reference level of the comparator 16, and is further amplified by the amplifier 21, so that the voltage is applied to the comparator 22. exceeds the standard level. Therefore, the light emitting diode 23 emits light,
It is reported that high voltage is normally applied to the object to be measured. In this state, the high voltage is increased while being monitored by the voltmeter 3, and when the measured current exceeds the predetermined amount selected by the changeover switch 11 during the measurement process, the DC output level of the rectifier/smoothing circuit 15 changes to the comparator 16.
exceeds the reference level, and the drive circuit 17 maintains the relay contact 4' in an open state based on the comparison output.
On the other hand, if the light emitting diode 23 does not emit light because the minute alternating current does not flow, it can be seen that the lead wires 6 and 7 are disconnected or have poor contact.

尚、微小交流検出部5を交流入力で作動するよ
うに構成する場合、増幅器21は増幅器14に直
接後続させる。また、増幅器21の利得は、被測
定物即ちその分布容量及び試験電圧に応じて調整
可能にしておくと好都合である。さらに、タツチ
センサがランプによる報知の代りに、試験電圧を
所定時間印加して異常がなければランプ表示等を
行うOK表示回路に組込まれる場合には、比較器
22の出力によりリレーを駆動させ、微小交流が
検出されたときだけOK表示回路が動作し得るよ
うにする。
In addition, when the minute alternating current detection part 5 is configured to operate with an alternating current input, the amplifier 21 is made to directly follow the amplifier 14. Further, it is convenient if the gain of the amplifier 21 is adjustable in accordance with the object to be measured, that is, its distributed capacitance and the test voltage. Furthermore, if the touch sensor is incorporated into an OK display circuit that applies a test voltage for a predetermined period of time and displays a lamp display if there is no abnormality, instead of using a lamp, the output of the comparator 22 drives a relay and To enable an OK display circuit to operate only when alternating current is detected.

第3図は本考案を直流耐圧試験器に適用した場
合の実施例を示すもので、第1図の高圧トランス
2の2次側回路にダイオード31、平滑用コンデ
ンサ32及び放電用抵抗器33から成る高圧整流
回路と、例えば2KHzの発振器34から給電され
るトランス35とが追加され、また電圧計3は直
流用に置換されている。この場合、過電流しや断
装置4の整流・平滑回路15は不要になるため微
小交流検出部5の増幅器21は直接増幅器14に
直接後続する。リード線6,7が被測定物8に正
常に接触している場合トランス35から供給され
る高周波電流が分布容量Coを通つて流れ、した
がつて増幅器14にはこの微小交流に対応したレ
ベルの増幅出力が発生し、これは比較器16に対
してレベル的には影響がなく、一方微小交流検出
部5ではさらに増幅されて高周波で発光ダイオー
ド23を発光させる。尚、動作を確実にするため
に比較器16の入力端子に高周波阻止用チヨーク
を設け、また場合によつては微小交流検出部5に
高周波の整流・平滑回路を設けることも考えられ
る。
Figure 3 shows an embodiment in which the present invention is applied to a DC withstand voltage tester, in which a diode 31, a smoothing capacitor 32 and a discharge resistor 33 are connected to the secondary circuit of the high voltage transformer 2 in Figure 1. For example, a high voltage rectifier circuit consisting of a high voltage rectifier circuit and a transformer 35 supplied with power from a 2KHz oscillator 34 are added, and the voltmeter 3 is replaced with a direct current one. In this case, the rectifier/smoothing circuit 15 of the overcurrent shielding device 4 becomes unnecessary, so the amplifier 21 of the minute alternating current detection section 5 directly follows the amplifier 14. When the lead wires 6 and 7 are in normal contact with the object to be measured 8, the high frequency current supplied from the transformer 35 flows through the distributed capacitance Co, and therefore the amplifier 14 has a level corresponding to this minute alternating current. An amplified output is generated, which has no effect on the comparator 16 in terms of level, but is further amplified in the minute alternating current detection section 5 to cause the light emitting diode 23 to emit light at a high frequency. In order to ensure reliable operation, a high frequency blocking circuit may be provided at the input terminal of the comparator 16, and in some cases, a high frequency rectification/smoothing circuit may be provided in the minute alternating current detection section 5.

第1図及び第3図において、過電流しや断装置
4はアース側ラインに挿入されているが、特に高
圧の程度によつては高圧側ライン即ち高圧側リー
ド線6の側に挿入して第2図による回路をアース
から浮かせた状態で構成することもできる。ま
た、本考案は、第3図に示す如く直流の試験電圧
を被測定物へ印加して測定電流を基に絶縁抵抗を
測定する過電流しや断装置付絶縁抵抗計、特に超
絶縁抵抗計にも適用可能である。
In FIGS. 1 and 3, the overcurrent cutoff device 4 is inserted into the ground line, but depending on the level of high voltage, it may be inserted into the high voltage line, that is, the high voltage lead wire 6. The circuit according to FIG. 2 can also be constructed floating above ground. The present invention also provides an insulation resistance meter with an overcurrent shield device that applies a DC test voltage to the object to be measured and measures the insulation resistance based on the measured current, as shown in Fig. 3, particularly a super insulation resistance meter. It is also applicable to

以上、本考案により過電流しや断装置を試験電
圧又はアース側へ挿入し、その増幅器にタツチセ
ンサの増幅器を後続させることにより、回路を部
分的に共用でき、また両者の回路をアースを基準
に構成でき、したがつて回路が簡単で安価なタツ
チセンサ付きの過電流しや断式耐圧試験器又は絶
縁抵抗計等が実現可能になる。
As described above, according to the present invention, by inserting an overcurrent cut-off device into the test voltage or ground side and following the amplifier of the touch sensor, the circuit can be partially shared, and both circuits can be connected to the ground. Therefore, it becomes possible to realize an overcurrent, break-type withstand voltage tester, insulation resistance tester, etc. with a touch sensor that has a simple and inexpensive circuit.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図及び第2図は本考案の第1の実施例によ
る回路構成並びに第3図は第2の実施例による回
路構成を示す。 1……摺動変圧器、2……高圧トランス、4…
…過電流しや断装置、5……微小交流検出部、8
……被測定物。
1 and 2 show a circuit configuration according to a first embodiment of the present invention, and FIG. 3 shows a circuit configuration according to a second embodiment of the present invention. 1...Sliding transformer, 2...High voltage transformer, 4...
...Overcurrent cutoff device, 5...Micro alternating current detection section, 8
...Object to be measured.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 試験電圧源から被測定物へ電圧を印加するライ
ンへ、測定電流を増幅検出して所定量を越えると
電圧印加をしや断する過電流しや断装置が挿入さ
れた絶縁耐力或は絶縁抵抗を測定する絶縁耐圧試
験器において、過電流しや断装置の増幅器に、被
測定物へ印加された交流電圧に対応する微小交流
を増幅検出するタツチセンサの増幅器が後続して
いることを特徴とするタツチセンサ付絶縁耐圧試
験器。
Dielectric strength or insulation resistance in which an overcurrent cutoff device is inserted into the line that applies voltage from the test voltage source to the object under test, which amplifies and detects the measured current and cuts off the voltage application when it exceeds a predetermined amount. In the dielectric strength tester for measuring the voltage, the amplifier of the overcurrent cutoff device is followed by the amplifier of the touch sensor that amplifies and detects minute alternating current corresponding to the alternating voltage applied to the object to be measured. Dielectric strength tester with touch sensor.
JP20133282U 1982-12-30 1982-12-30 Dielectric strength tester with touch sensor Granted JPS59106082U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20133282U JPS59106082U (en) 1982-12-30 1982-12-30 Dielectric strength tester with touch sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20133282U JPS59106082U (en) 1982-12-30 1982-12-30 Dielectric strength tester with touch sensor

Publications (2)

Publication Number Publication Date
JPS59106082U JPS59106082U (en) 1984-07-17
JPH0143654Y2 true JPH0143654Y2 (en) 1989-12-18

Family

ID=30426831

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20133282U Granted JPS59106082U (en) 1982-12-30 1982-12-30 Dielectric strength tester with touch sensor

Country Status (1)

Country Link
JP (1) JPS59106082U (en)

Also Published As

Publication number Publication date
JPS59106082U (en) 1984-07-17

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