JPH0140952B2 - - Google Patents
Info
- Publication number
- JPH0140952B2 JPH0140952B2 JP56200819A JP20081981A JPH0140952B2 JP H0140952 B2 JPH0140952 B2 JP H0140952B2 JP 56200819 A JP56200819 A JP 56200819A JP 20081981 A JP20081981 A JP 20081981A JP H0140952 B2 JPH0140952 B2 JP H0140952B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- scanning
- ultrasonic
- parallel
- ultrasonic beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000002604 ultrasonography Methods 0.000 description 3
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
- G01N2291/02854—Length, thickness
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Microscoopes, Condenser (AREA)
Description
【発明の詳細な説明】
本発明は超音波顕微鏡に関するもので、特にそ
の走査装置の改良に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an ultrasonic microscope, and more particularly to improvements in its scanning device.
従来の超音波顕微鏡の走査は、ボイスコイルに
よる往復移動と、モータによる直線移動との組合
わせにより、試料上を超音波の微小スポツトが第
1図に一例を示すようにラスター状に走査するも
のである。第1図において、試料1の上方にトラ
ンスジユーサおよび音響レンズより成る超音波送
受素子2を配置し、駆動軸3を介してラウドスピ
ーカと同じ機構より成るボイスコイル4すなわち
x方向駆動装置と連結し、超音波送受素子2をX
方向に高速往復移動をさせるようにする。また、
試料1を保持する試料台5に設けたy方向移動機
構(例えばリード・スクリユー等による機構)に
よりy方向に低速移動させて超音波によ二次元走
査を行なつている。 Conventional ultrasonic microscope scanning uses a combination of reciprocating movement by a voice coil and linear movement by a motor to scan a microscopic spot of ultrasonic waves over a sample in a raster pattern, as shown in an example in Figure 1. It is. In FIG. 1, an ultrasonic transmitting/receiving element 2 consisting of a transducer and an acoustic lens is arranged above a sample 1, and connected via a drive shaft 3 to a voice coil 4, that is, an x-direction drive device consisting of the same mechanism as a loudspeaker. and set the ultrasonic transmitting/receiving element 2 to
Make it perform high-speed reciprocating movement in the direction. Also,
A sample table 5 holding the sample 1 is moved at low speed in the y direction by a y direction moving mechanism (for example, a mechanism using a lead screw, etc.) to perform two-dimensional scanning using ultrasonic waves.
走査においては、超音波ビームが最小に絞られ
る位置に試料が配置されねばならない。すなわ
ち、面の走査において、最小の超音波ビームが作
る平面と、試料の試料面が平行にならなければな
らない。そのため試料台5としては、x,yの2
方向に関して面の平行度を出すことが可能な部材
が用いられている。そして最小の超音波ビームの
作る面と、試料1を平行にするためには、走査を
繰返し、画像に表われる干渉縞を減少さすよう
に、試料台5を調整し、干渉縞が表われなくなつ
た時点で、はじめて試料1の平面性がとれること
になつていた。この試料台5の調整は非常に手間
がかかり、試料1が傾きをもつている場合は、こ
の平面性を出すための調整に大半の観察時間を使
うという欠点があつた。 During scanning, the sample must be placed at a position where the ultrasonic beam is minimized. That is, when scanning a surface, the plane created by the smallest ultrasonic beam must be parallel to the sample surface of the sample. Therefore, as the sample stage 5, 2 x, y
A member is used that can provide parallelism of the surface with respect to the direction. In order to make the surface created by the smallest ultrasonic beam parallel to the sample 1, repeat scanning and adjust the sample stage 5 to reduce the interference fringes that appear in the image, until the interference fringes no longer appear. At the point when the sample 1 was used, the planarity of the sample 1 was to be achieved for the first time. Adjusting the sample stage 5 is very time consuming, and when the sample 1 is tilted, there is a drawback that most of the observation time is spent on adjustment to achieve flatness.
本発明は上記の欠点を解消し、超音波顕微鏡に
関して、超音波が最小に絞られる面と、試料平面
とを容易に平行にする装置を提供することを目的
とするものである。 SUMMARY OF THE INVENTION An object of the present invention is to solve the above-mentioned drawbacks and to provide an apparatus for an ultrasonic microscope that easily makes parallel the surface where ultrasonic waves are minimized with the sample plane.
本発明は第1の方向に延在する軸線およびこれ
とほぼ直交する第2の方向に延在する軸線を中心
として揺動可能な試料台と、この試料台を前記第
1および第2の方向をそれぞれ軸として揺動させ
る駆動手段と、前記試料台表面に対向し、互いに
離間するとともに超音波ビームの走査面に対して
固定的に配置した少く共3個のギヤツプセンサと
を具え、これらギヤツプセンサの出力に基いて超
音波ビームの走査面に対して試料台が平行となる
ように前記駆動手段を制御するよう構成したこと
を特徴とするものである。 The present invention provides a sample stand that is swingable about an axis extending in a first direction and an axis extending in a second direction substantially perpendicular thereto, and and at least three gap sensors facing the surface of the sample stage, spaced apart from each other, and fixedly arranged with respect to the scanning plane of the ultrasonic beam. The apparatus is characterized in that the driving means is controlled based on the output so that the sample stage is parallel to the scanning plane of the ultrasonic beam.
以下図面を参照して本発明を詳細に説明する。 The present invention will be described in detail below with reference to the drawings.
第2図は本発明の超音波顕微鏡の走査装置の一
実施例を示す線図的斜視図である。この走査装置
では、モータ11を駆動軸12を介して回転ドラ
ム13に連結し、回転ドラム13の内には図示し
ない超音波送受素子の直線往復移動部材があり、
この部材の直線往復移動と回転ドラム13の回転
移動の組合わせにより、試料14の平面上を超音
波ビームがスパイラル状に走査するものである。 FIG. 2 is a schematic perspective view showing an embodiment of the scanning device for an ultrasound microscope according to the present invention. In this scanning device, a motor 11 is connected to a rotating drum 13 via a drive shaft 12, and inside the rotating drum 13 there is a linear reciprocating member for an ultrasonic transmitting/receiving element (not shown).
By combining the linear reciprocating movement of this member and the rotational movement of the rotary drum 13, the ultrasonic beam scans the plane of the sample 14 in a spiral manner.
この走査装置において、回転ドラム13の底面
は、超音波送受素子からの超音波ビームの最小ス
ポツトが走査の際に作るであろう平面と平行であ
る。従つて、この回転ドラム13の底面と、観察
しようとする試料14の面、あるいは試料14に
傾きが無い場合には、試料台15の表面とを平行
にすれば。、走査において、超音波ビームの最小
スポツトが試料14の面に平行な面を走査するこ
とになる。試料14を載置する試料台15は、x
方向に延在する軸線を中心として揺動する第1部
材と、y方向に延在する軸線を中心として揺動す
る第2部材と、固定部に取付けられた第3部材と
を以つて構成する。 In this scanning device, the bottom surface of the rotating drum 13 is parallel to the plane that the minimum spot of the ultrasonic beam from the ultrasonic transceiver element will create during scanning. Therefore, the bottom surface of this rotating drum 13 should be parallel to the surface of the sample 14 to be observed, or to the surface of the sample stage 15 if the sample 14 is not tilted. , in scanning, the minimum spot of the ultrasonic beam scans a plane parallel to the plane of the sample 14. The sample stage 15 on which the sample 14 is placed is x
A first member that swings around an axis extending in the y direction, a second member that swings around an axis that extends in the y direction, and a third member attached to the fixed part. .
回転ドラム13の底面と試料15上に保持され
た試料14の面を平行にするため、回転ドラム1
3の底面にその回転の中心に関して4個のギヤツ
プセンサ16,17,18,19が対称の位置に
配設されている。このうちギヤツプセンサ16,
17はx方向に関する平面性を、ギヤツプセンサ
18,19はy方向に関する平面性を検出するも
のである。比較器20はギヤツプセンサ16,1
7に接続されその出力を比較し、比較器21はギ
ヤツプセンサ18,19に接続されその出力を比
較するもので、比較器20は試料台15の第3部
材15cに取付けられ、第2部材15bを揺動さ
せる駆動装置22に、同様に比較器21は試料台
15の第2部材15bに取付けられ、第1部材1
5aを揺動させる駆動装置23に接続されてい
る。回転ドラム13内の超音波送受素子からの超
音波ビームの最小スポツトが走査の際つくるであ
ろう走査面と試料台15上に載置された試料14
の表面とは、x方向については、ギヤツプセンサ
16,17により、回転ドラム13の底面と試料
14までの距離に関する出力を、比較器20で比
較し、出力が同一になる、すなわち距離が2点に
おいて等しくなるようx方向に関する駆動装置2
2を制御することにより平行とすることができ、
また、同様にy方向についてはギヤツプセンサ1
8,19、比較器21によりy方向に関する駆動
装置23を制御することにより平行とすることが
できる。 In order to make the bottom surface of the rotating drum 13 parallel to the surface of the sample 14 held on the sample 15, the rotating drum 1
Four gap sensors 16, 17, 18, and 19 are arranged on the bottom surface of 3 at symmetrical positions with respect to the center of rotation. Among these, gap sensor 16,
Reference numeral 17 detects flatness in the x direction, and gap sensors 18 and 19 detect flatness in the y direction. Comparator 20 is gap sensor 16,1
The comparator 21 is connected to the gap sensors 18 and 19 and compares their outputs. The comparator 20 is attached to the third member 15c of the sample stage 15 and Similarly, the comparator 21 is attached to the second member 15b of the sample stage 15, and the comparator 21 is attached to the drive device 22 for swinging.
It is connected to a drive device 23 that swings the shaft 5a. The scanning surface where the minimum spot of the ultrasonic beam from the ultrasonic transmitting/receiving element in the rotating drum 13 will be created during scanning and the sample 14 placed on the sample stage 15
The surface of Drive device 2 in the x direction to be equal
2 can be made parallel by controlling
Similarly, for the y direction, gap sensor 1
8, 19, can be made parallel by controlling the drive device 23 in the y direction by the comparator 21.
以上説明したように本発明によれば、走査する
以前において、超音波ビームの最小スポツトが走
査の際に作るであろう走査平面と、試料面とを平
行にすることが可能となり、従来のように、何度
も走査を行なつて試料面を平行にする観察調整等
の繁雑な手間を省略できる。 As explained above, according to the present invention, before scanning, it is possible to make the scanning plane, which would be created by the minimum spot of the ultrasonic beam during scanning, parallel to the sample surface. In addition, the complicated labor of performing observation adjustment to make the sample surface parallel by performing multiple scans can be omitted.
なお、本発明は前述の実施例に限定されるもの
でなく幾多の変形や変更が可能である。例えばス
パイラル状の走査によらないボイスコイルによる
ラスタ走査装置の場合でも用いることができる。 Note that the present invention is not limited to the above-described embodiments, and can be modified and changed in many ways. For example, it can be used even in the case of a raster scanning device using a voice coil that does not use spiral scanning.
第1図は従来の超音波顕微鏡の走査装置の一例
の線図的斜視図、第2図は本発明の超音波顕微鏡
の走査装置の一実施例の線図的斜視図である。
11…モータ、12…駆動軸、13…回転ドラ
ム、14…試料、15…試料台、15a…試料台
の第1部材、15b…試料台の第2部材、15c
…試料台の第3部材、16,17,18,19…
ギヤツプセンサ、20,21…比較器、22,2
3…駆動装置。
FIG. 1 is a diagrammatic perspective view of an example of a conventional ultrasound microscope scanning device, and FIG. 2 is a diagrammatic perspective view of an embodiment of the ultrasound microscope scanning device of the present invention. DESCRIPTION OF SYMBOLS 11... Motor, 12... Drive shaft, 13... Rotating drum, 14... Sample, 15... Sample stand, 15a... First member of sample stand, 15b... Second member of sample stand, 15c
...Third member of sample stage, 16, 17, 18, 19...
Gap sensor, 20, 21... Comparator, 22, 2
3...Drive device.
Claims (1)
直交する第2の方向に延在する軸線を中心として
揺動可能な試料台と、この試料台を前記第1およ
び第2の方向をそれぞれ軸として揺動させる駆動
手段と、前記試料台の表面に対向し、互いに離間
するとともに超音波ビームの走査面に対して固定
的に配置した少く共3個のギヤツプセンサとを具
え、これらギヤツプセンサの出力に基いて超音波
ビームの走査面に対して前記試料台表面に載置さ
れた試料の表面が平行となるように前記駆動手段
を制御するよう構成したことを特徴とする超音波
顕微鏡。1. A sample stand that is swingable about an axis extending in a first direction and an axis extending in a second direction substantially perpendicular thereto; a drive means for swinging as an axis; and at least three gap sensors facing the surface of the sample stage, spaced apart from each other, and fixedly arranged with respect to the scanning plane of the ultrasonic beam; An ultrasonic microscope characterized in that the driving means is controlled so that the surface of the sample placed on the sample stage surface is parallel to the scanning plane of the ultrasonic beam.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56200819A JPS58102152A (en) | 1981-12-15 | 1981-12-15 | Ultrasonic microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP56200819A JPS58102152A (en) | 1981-12-15 | 1981-12-15 | Ultrasonic microscope |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58102152A JPS58102152A (en) | 1983-06-17 |
JPH0140952B2 true JPH0140952B2 (en) | 1989-09-01 |
Family
ID=16430723
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP56200819A Granted JPS58102152A (en) | 1981-12-15 | 1981-12-15 | Ultrasonic microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58102152A (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0711511B2 (en) * | 1986-04-28 | 1995-02-08 | オリンパス光学工業株式会社 | Automatic tilt adjustment sample table |
US7168694B2 (en) * | 2004-01-22 | 2007-01-30 | Sakura Finetek U.S.A., Inc. | Multi-axis workpiece chuck |
JP4789111B2 (en) * | 2006-02-13 | 2011-10-12 | セイコーインスツル株式会社 | Thin section manufacturing apparatus and thin section manufacturing method |
DE102016211126A1 (en) * | 2016-06-22 | 2017-12-28 | Osram Opto Semiconductors Gmbh | Measuring device for flat samples and methods for measuring |
-
1981
- 1981-12-15 JP JP56200819A patent/JPS58102152A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS58102152A (en) | 1983-06-17 |
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