JPH01312449A - Analyzed data processing apparatus - Google Patents
Analyzed data processing apparatusInfo
- Publication number
- JPH01312449A JPH01312449A JP14389288A JP14389288A JPH01312449A JP H01312449 A JPH01312449 A JP H01312449A JP 14389288 A JP14389288 A JP 14389288A JP 14389288 A JP14389288 A JP 14389288A JP H01312449 A JPH01312449 A JP H01312449A
- Authority
- JP
- Japan
- Prior art keywords
- data
- measurement
- stored
- displayed
- range
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004458 analytical method Methods 0.000 claims abstract description 15
- 238000005259 measurement Methods 0.000 abstract description 35
- 238000001228 spectrum Methods 0.000 abstract description 13
- 238000012512 characterization method Methods 0.000 abstract 1
- 230000003595 spectral effect Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000000921 elemental analysis Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
Landscapes
- Recording Measured Values (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】 （産業上の利用分野） 本発明は、分析データの処理装置に関する。[Detailed description of the invention] (Industrial application field) The present invention relates to an analytical data processing device.
（従来の技術）
測定スペクトルから様々な情報を得るには、試料を特徴
づけるピークを含む狭い波長或はエネルギー範囲の分析
データを用いて、試料を特徴づけるスペクトルピーク毎
にデータを管理・分析を行う方が効果的である。しかし
、未知試料では元素スペクトルの分布範囲が不明である
ために、上記のような必要なスペクトルピークが含まれ
ている狭い測定範囲を予め設定することが不可能である
、そこで従来は、大きなステップで広範囲にわたって測
定を行い、その測定結果により必要なスペクトルビーク
を含む狭い測定範囲を細かいステップで再度詳細測定し
ていた。しかし、このような方法では測定に長時間かか
るために非能率であった。(Prior art) In order to obtain various information from measured spectra, it is necessary to manage and analyze data for each spectral peak that characterizes the sample using analysis data in a narrow wavelength or energy range that includes the peaks that characterize the sample. It is more effective to do so. However, since the distribution range of the elemental spectrum is unknown for unknown samples, it is impossible to preset a narrow measurement range that includes the necessary spectral peaks as described above. Measurements were taken over a wide range, and based on the measurement results, detailed measurements were taken again in small steps over a narrow measurement range that included the necessary spectral peaks. However, such a method is inefficient because the measurement takes a long time.
（発明が解決しようとする課題）
本発明は、試料について必要なスペクトルビークを含む
狭い波長或はエネルギー範囲の分析データを能率良く収
集・管理することを目的とする。(Problems to be Solved by the Invention) An object of the present invention is to efficiently collect and manage analysis data in a narrow wavelength or energy range including a necessary spectral peak for a sample.
（課題を解決するための手段〉
広範囲の詳細分析データを全て記憶する手段と、上記分
析データを表示する手段と、上記分析データから登録範
囲を指示する手段と、全分析データから上記指示された
登録範囲の分析データを記憶する手段とを分析データ処
理装置に設けた。(Means for solving the problem) A means for storing all detailed analysis data over a wide range, a means for displaying the above analysis data, a means for specifying the registration range from the above analysis data, and a means for specifying the registration range from all the analysis data. The analytical data processing device is provided with means for storing analytical data of the registered range.
（作用）
最近、記憶媒体の記憶容量が一段と増大し、細かいステ
ップで広い波長或はエネルギー範囲を測定して得られる
測定データを全部記憶できるようになった。本発明はこ
のような背景により、試料を特徴づけるスペクトルビー
クが含まれる測定範囲を調査するための予備測定をする
ことなしに、ｔｍから広い測定範囲において細かいステ
ップで測定し、得られた測定データを記憶装置に記憶し
、測定終了後、測定データを収り出して表示装置に表示
し、表示されたスペクトルを参考にして、試料を特徴づ
けるスペクトルビークの測定データ範囲を登録指定し、
その指定範囲の測定データを管理するようにすることで
、測定時間の短縮を計ろうとするものである。(Function) Recently, the storage capacity of storage media has increased further, and it has become possible to store all measurement data obtained by measuring a wide wavelength or energy range in fine steps. Against this background, the present invention measures in small steps over a wide measurement range from tm, without conducting preliminary measurements to investigate the measurement range that includes the spectral peak that characterizes the sample, and collects the obtained measurement data. is stored in the storage device, and after the measurement is completed, the measured data is retrieved and displayed on the display device, and using the displayed spectrum as a reference, the measured data range of the spectral peak that characterizes the sample is registered and specified.
By managing the measurement data within the specified range, the measurement time is reduced.
（実施例）
第１図に本発明の一実施例を示す、第１図において、１
は分析装置、２は分析装置１とＣＰＵ３との信号の連絡
動作を行うインターフェイスである。ＣＰＵ３は分析装
置１の制御及び測定データの処理制御を行う。４は測定
データ等を格納するメモリ、５は測定データ及び結果を
表示する表示装置で、６は種々なデータおよび指令をＣ
ＰＵ３に入力するキーボードである。(Example) FIG. 1 shows an example of the present invention.
2 is an analyzer, and 2 is an interface for communicating signals between the analyzer 1 and the CPU 3. The CPU 3 controls the analyzer 1 and processes measurement data. 4 is a memory that stores measurement data, etc., 5 is a display device that displays measurement data and results, and 6 is a computer that displays various data and commands.
This is a keyboard for inputting to PU3.
第２図に測定動作のフローチャー１−を示す。最初に分
析装置１の測定すべき波長或はエネルギー等の範囲、測
定ステップ等の分析条件を設定する（ア）。この場合、
例えば試料の元素分析であれば予め試料に含まれる可能
性のある元素全てのビークが現れる波長範囲を設定し、
このような予想がつけられないときは、分析装置におけ
る全測定範囲を指定し、測定ステップ（サンプリング波
長間隔等）は目標とする分析精度によって予め決定され
る。全スペクトルデータを入手するために上記設定され
た広範囲の測定を行う〈イ〉。入手した測定データをメ
モリ４に格納する（つ）。ここで測定は終了し、測定デ
ータの処理に入る。全スペクトルを表示装Ｗ５に表示し
く１）、第３図Ａに示すように、表示されたスペクトル
にキーボード６を操作して登録すべきスペクトルビーク
データが含まれる領域１，２．３等をカーソルによって
指定する（オ）、測定データを上記登録条件により分割
し、分割したデータをメモリに格納する。必要に応じて
格納した登録データを第３図Ｂに示すようにスペクトル
ビーク毎に表示装Ｗ５に表示して分析を行う。FIG. 2 shows a flowchart 1- of the measurement operation. First, analysis conditions such as the wavelength or energy range to be measured by the analyzer 1 and the measurement steps are set (a). in this case,
For example, in the case of elemental analysis of a sample, the wavelength range in which the peaks of all elements that may be included in the sample appear is set in advance.
When such predictions cannot be made, the entire measurement range of the analyzer is specified, and the measurement steps (sampling wavelength intervals, etc.) are determined in advance according to the target analysis accuracy. Perform measurements over the wide range set above in order to obtain all spectral data (B). The obtained measurement data is stored in the memory 4. The measurement ends here, and the measurement data begins to be processed. Display the entire spectrum on the display W5 (1). As shown in FIG. (e), the measurement data is divided according to the above registration conditions, and the divided data is stored in the memory. If necessary, the stored registered data is displayed on the display W5 for each spectrum peak as shown in FIG. 3B for analysis.
（発明の効果）
本発明によれば、本測定によって細かいステップの全測
定データを測定・記憶させ、測定終了後試料を特徴づけ
るスペクトルビークデータ毎に分割記憶させるようにし
たことで、予備測定が不必要となり、測定時間を短縮す
ることが可能になった。(Effects of the Invention) According to the present invention, all measurement data of fine steps are measured and stored in the main measurement, and after the measurement is completed, the data is divided and stored for each spectral peak data that characterizes the sample, so that the preliminary measurement can be performed. This is no longer necessary, making it possible to shorten measurement time.
第１図は本発明の一実施例の構成図、第２図は測定動作
のフローチャート、第３図はスベ２トル図で、同図Ａは
全スペクトル図、同図Ｂは分割スペクトル図である。
１・・・分析装置、２・・・インターフェイス、３・・
・ＣＰＵ、４・・・メモリ、５・・・表示装置。Figure 1 is a configuration diagram of an embodiment of the present invention, Figure 2 is a flowchart of measurement operation, Figure 3 is a smooth diagram, Figure A is a full spectrum diagram, and Figure B is a divided spectrum diagram. . 1... Analyzer, 2... Interface, 3...
・CPU, 4...Memory, 5...Display device.
Claims (1)
析データを表示する手段と、上記分析データから登録範
囲を指示する手段と、全分析データから上記指示された
登録範囲の分析データを記憶する手段とを設けたことを
特徴とする分析データ処理装置。means for storing all of the detailed analysis data over a wide range; means for displaying the analysis data; means for instructing a registration range from the analysis data; and means for storing analysis data in the specified registration range from all the analysis data. An analytical data processing device characterized by comprising:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63143892A JPH0827244B2 (en) | 1988-06-10 | 1988-06-10 | Analytical data processor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63143892A JPH0827244B2 (en) | 1988-06-10 | 1988-06-10 | Analytical data processor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01312449A true JPH01312449A (en) | 1989-12-18 |
| JPH0827244B2 JPH0827244B2 (en) | 1996-03-21 |
Family
ID=15349470
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63143892A Expired - Lifetime JPH0827244B2 (en) | 1988-06-10 | 1988-06-10 | Analytical data processor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0827244B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001264212A (en) * | 2000-03-14 | 2001-09-26 | Advantest Corp | Waveform measuring device, method and recording medium |
| US7742565B2 (en) | 2007-10-16 | 2010-06-22 | Jeol Ltd. | Method and apparatus for analysis using X-ray spectra |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5446085A (en) * | 1977-09-19 | 1979-04-11 | Omron Tateisi Electronics Co | Spectrophotometer |
| JPS60100726A (en) * | 1983-11-07 | 1985-06-04 | Hitachi Ltd | Spectrophotometer provided with crt |
| JPS61724A (en) * | 1984-06-13 | 1986-01-06 | Shimadzu Corp | Removal of back ground of spctrum and its apparatus |
| JPS61159158A (en) * | 1984-12-29 | 1986-07-18 | Japan Spectroscopic Co | Method for preserving data of chromatogram |
| JPS62127673A (en) * | 1985-11-29 | 1987-06-09 | Jeol Ltd | Fourier transform processor |
-
1988
- 1988-06-10 JP JP63143892A patent/JPH0827244B2/en not_active Expired - Lifetime
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5446085A (en) * | 1977-09-19 | 1979-04-11 | Omron Tateisi Electronics Co | Spectrophotometer |
| JPS60100726A (en) * | 1983-11-07 | 1985-06-04 | Hitachi Ltd | Spectrophotometer provided with crt |
| JPS61724A (en) * | 1984-06-13 | 1986-01-06 | Shimadzu Corp | Removal of back ground of spctrum and its apparatus |
| JPS61159158A (en) * | 1984-12-29 | 1986-07-18 | Japan Spectroscopic Co | Method for preserving data of chromatogram |
| JPS62127673A (en) * | 1985-11-29 | 1987-06-09 | Jeol Ltd | Fourier transform processor |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001264212A (en) * | 2000-03-14 | 2001-09-26 | Advantest Corp | Waveform measuring device, method and recording medium |
| US7742565B2 (en) | 2007-10-16 | 2010-06-22 | Jeol Ltd. | Method and apparatus for analysis using X-ray spectra |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0827244B2 (en) | 1996-03-21 |
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