JPH01285839A - Inspection of disk medium - Google Patents
Inspection of disk mediumInfo
- Publication number
- JPH01285839A JPH01285839A JP11475788A JP11475788A JPH01285839A JP H01285839 A JPH01285839 A JP H01285839A JP 11475788 A JP11475788 A JP 11475788A JP 11475788 A JP11475788 A JP 11475788A JP H01285839 A JPH01285839 A JP H01285839A
- Authority
- JP
- Japan
- Prior art keywords
- disk medium
- magnetic disk
- test
- inspection
- weatherability
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 title claims abstract description 27
- 238000000034 method Methods 0.000 claims abstract description 27
- 238000011156 evaluation Methods 0.000 claims abstract description 7
- 238000004321 preservation Methods 0.000 claims abstract description 7
- 238000004519 manufacturing process Methods 0.000 claims description 8
- 230000000007 visual effect Effects 0.000 abstract description 7
- 230000000694 effects Effects 0.000 abstract description 6
- 238000012216 screening Methods 0.000 abstract 1
- 230000007547 defect Effects 0.000 description 14
- 238000010586 diagram Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Landscapes
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
Abstract
Description
【発明の詳細な説明】
〔離業上の利用分野〕
この発明は、ディスク媒体の検査方法、例えば、ｆｌｆ
ｔ Ｎ−機等の情報を記憶する記憶装置に使用されるデ
・イスク媒体の製造時における検査方法に関するもので
ある。DETAILED DESCRIPTION OF THE INVENTION [Field of application apart from business] The present invention relates to a method for inspecting a disk medium, for example, a method for inspecting a disk medium.
The present invention relates to an inspection method during the manufacture of disk media used in storage devices for storing information such as tN-machines.
第３図は、従来のディスク媒体の検査方法、例えば、Ｎ
ＥＣ技報、ｖｏｌ 、 ３９／ＶＡ９７′１９８６ ｊ
”磁気ディスク媒体技術」の図２「薄膜ディスク媒体製
造工程」に示されているテスト工程のみの一例を示す工
程図である。FIG. 3 shows a conventional disk medium inspection method, for example, N
EC Technical Report, vol, 39/VA97'1986 j
FIG. 2 is a process diagram showing only an example of the test process shown in FIG. 2 "Thin film disk medium manufacturing process" of "Magnetic disk media technology".
図において、符号（１）は通常検査の一徨であるグライ
ドテスト、（２）は同様のサーテイファイテスト、（３
）も同様の目視テストである。In the figure, code (1) is the glide test, which is one of the normal tests, (2) is the similar certify test, and (3) is the same test.
) is a similar visual test.
次にこのテスト内容について説明する。Next, the contents of this test will be explained.
グライドテスト（１）は磁気ディスク媒体上の突起を検
出するものである。Glide test (1) detects protrusions on the magnetic disk medium.
サーテイファイテスト（２）は磁気ディスク媒体の電磁
変換特性の測定と電気的に検出される欠陥とを検出する
ものである。Certify test (2) measures the electromagnetic conversion characteristics of a magnetic disk medium and detects electrically detected defects.
また、目視テスト（３）は磁気ディスク媒体表面の付着
物及びきす等を検出するものである。The visual test (3) is to detect deposits, scratches, etc. on the surface of the magnetic disk medium.
従来の磁気ディスク媒体の検査方法は以上のように行な
われているので、時間経過と共に進展するピンホールや
きす、欠陥などのみを選択して検出することは難しく、
また、進展するか、しないかＫかかわらず、すべてのピ
ンホールやきす、欠陥を有するものを除くことは、検査
方法を必要以上に厳しくしなければならず、その結果、
製造歩留りが著しく低下するなどの問題点があった。し
かも、これらの欠陥は、耐候性に大きく影響を与えるも
のであり、従って、進展し拡大したピンホール、まず、
欠陥等のあるものは、落ちなく、排除することが必要で
あり、従って、このようなピンホール、まず、欠陥を落
ちなく検出し得る検査方法を得たいという課題を有して
いた。Conventional magnetic disk media inspection methods are performed as described above, so it is difficult to selectively detect pinholes, scratches, defects, etc. that develop over time.
In addition, to remove all pinholes, scratches, and defects, regardless of whether they develop or not, the inspection method must be made more stringent than necessary, and as a result,
There were problems such as a significant decrease in manufacturing yield. Moreover, these defects greatly affect weather resistance, and therefore, pinholes that develop and enlarge, first of all,
It is necessary to eliminate defects and the like without dropping them.Therefore, there was a problem of creating an inspection method that can detect such pinholes without dropping them.
この発明は、上記のような課題を解決するためＫなされ
たもので、ディスク媒体の耐候性の向上のために、耐候
性の良好なディスク媒体のみが得られる検査方法を得る
ことを目的とする。This invention was made to solve the above-mentioned problems, and an object of the present invention is to provide an inspection method that can obtain only disk media with good weather resistance, in order to improve the weather resistance of disk media. .
この発明に係るディスク媒体の検査方法は、ディスク媒
体の通常検査前にディスク媒体の耐候性評価を加速させ
る環境において一定時間保存する保存工程を加え、その
後に、ディスク媒体の通常テストを行なうものである。The disk medium inspection method according to the present invention adds a storage step of storing the disk medium for a certain period of time in an environment that accelerates the weather resistance evaluation of the disk medium before the normal inspection of the disk medium, and then performs the normal test of the disk medium. be.
この発明におけるディスク媒体の検査方法によルやキズ
、欠陥などは、耐候性評価を加速させる環境下での一定
時間保存のために、進展するものは進展して、耐候性に
影響を与えるところの排除すべきピンホールやきす、あ
るいはその他の欠陥を検出しやすくシ、従って、落ちな
くこれらだけを検出することができ、その結果、耐候性
の良好なディスク媒体を選別することができる。Due to the inspection method of disk media in this invention, holes, scratches, defects, etc. are stored for a certain period of time in an environment that accelerates weather resistance evaluation, so those that develop will develop and affect weather resistance. It is easy to detect pinholes, scratches, or other defects that should be eliminated, and therefore only these can be detected without falling, and as a result, disk media with good weather resistance can be selected.
以下、この発明をその一実施例を示す図に基づいて説明
する。The present invention will be explained below based on the drawings showing one embodiment thereof.
なお、符号（１）〜（３）で示すものは、上記従来の検
査方法において同一符号で示したものと同−又は同等の
ものである。Note that the items indicated by symbols (1) to (3) are the same as or equivalent to those indicated by the same symbols in the conventional inspection method described above.
第１図において、符号（１１）は、ディスク媒体、例え
ば、磁気ディスク媒体の耐候性評価を加速させる環境下
において一定時間保存する保存工程で、磁気ディスク媒
体の通常検査、例えば、グライドテスト、サーテイファ
イテスト及び目視テストの前に実施する。In FIG. 1, reference numeral (11) refers to a storage process in which a disk medium, for example, a magnetic disk medium, is stored for a certain period of time in an environment that accelerates weather resistance evaluation, and is used for normal inspection of magnetic disk media, such as a glide test, and a service. Conducted before the test and visual test.
上記のように構成された磁気ディスク媒体の検査方法に
おいては、磁気ディスク媒体の通常検査の実施前に、磁
気ディスク媒体の耐候性評価を加速させる環境の下にお
いて、一定時間保存する保存工程を追加しているので、
時間経過と共に進展して耐候性に大きく影響を与えるよ
うな状態になったピンホールやきす、欠陥などは、磁気
ディスク媒体の通常の検査によって検出され、上記一定
時間の保存にもかかわらず、進展せず、従って、耐候性
に影響を与えないピンホール、キズ、欠陥等は検出され
ない。In the magnetic disk medium inspection method configured as described above, a storage step is added in which the magnetic disk medium is stored for a certain period of time in an environment that accelerates the weather resistance evaluation of the magnetic disk medium before the normal inspection of the magnetic disk medium. Because I am doing
Pinholes, scratches, defects, etc. that develop over time and have a major impact on weather resistance are detected by normal inspection of magnetic disk media, and do not develop even after storage for the above-mentioned period of time. Therefore, pinholes, scratches, defects, etc. that do not affect weather resistance are not detected.
従って、上記のこの発明方法忙より、ピンホールやまず
、欠陥などが検出された磁気ディスク媒体を選別し排除
することにより、耐候性の良好な磁気ディスク媒体のみ
を得ることが可能となる。Therefore, by selecting and eliminating magnetic disk media in which pinholes or other defects have been detected, it is possible to obtain only magnetic disk media with good weather resistance.
次Ｋ、この発明の他の実施例を第２図に基づいて説明す
る。Next, another embodiment of the present invention will be described based on FIG.
図においては、まず、グライドテスト（１）、サーテイ
ファイテスト（２）、目視テスト（３）を実施した後、
保存工［（１１）を実施する。そして、再度、グライド
テスト（１）、サーテイファイテスト（２）、目視テス
ト（３）を実施し、保存工程（１１）の前後の両テスト
結果を比較する。その結果、変化が認めらねれば、時間
経過と共にピンホールやきす、欠陥等が進展したもので
あり、従って、耐候性の不足する磁気ディスク媒体と判
定できる。In the figure, first, after conducting a glide test (1), a certify test (2), and a visual test (3),
Preservation work [(11) shall be carried out. Then, the glide test (1), certify test (2), and visual test (3) are performed again, and the test results before and after the preservation step (11) are compared. As a result, if no change is observed, pinholes, scratches, defects, etc. have developed over time, and it can therefore be determined that the magnetic disk medium lacks weather resistance.
この実施例によれば、耐候性に大きく影響を与えるとこ
ろの時間経過と共に進展するピンホールやキズ、欠陥な
どのみを、より適確に検出することができ、従って、耐
候性の良好な磁気ディスク媒体のみを得ることが可能と
なる。According to this embodiment, it is possible to more accurately detect only pinholes, scratches, defects, etc. that develop over time, which greatly affect the weather resistance, and therefore, the magnetic disk with good weather resistance can be detected. It becomes possible to obtain only the medium.
なお、上記実施例ではグライドテスト（１）、ザーテイ
７アイテスト（２）及び目視テスト（３）を行なうもの
に基づいて説明したが、必ずしも、すべてが揃う必要は
なく、いずれかを省略又は別のテスト項目を追加しても
よく、更には、すべてを変更してピンホール、きす、欠
陥等の進展が影響する別のテスト項目のみとしてもよく
、同様の効果があることはいうまでもよい。In addition, although the above example was explained based on the glide test (1), the X-7 eye test (2), and the visual test (3), it is not necessarily necessary to have all of them, and any one of them may be omitted or separated. It goes without saying that additional test items may be added, or all of them may be changed to include only other test items that are affected by the development of pinholes, scratches, defects, etc., and it goes without saying that this will have the same effect. .
Ｐ （６
）以」二のように、この発明によればディスク媒体の検
査の前に、ディスク媒体の耐候性計画を加速させる環境
下において一定時間保存する保存工程を加えたことによ
り、進展すべきピンホール、きず、欠陥等は進展させて
検出、選別を容易にし、進展しないものは耐候性にほと
んど影響を与えないの宝検出排除する必要はなく、従っ
て、耐候性【７〕良好なディスク媒体のみを得ることが
可能なディスク媒体σ〕検査方法が得られるという効果
を有し、ている。P (6
) As described in ``2'', according to the present invention, before inspection of the disk medium, a preservation process is added in which the disk medium is stored for a certain period of time in an environment that accelerates the weather resistance plan, thereby detecting pinholes that should develop. , scratches, defects, etc. will develop to make it easier to detect and sort, and those that do not develop will have little effect on weather resistance. Therefore, there is no need to exclude them from detection. Therefore, only disk media with good weather resistance [7] should be used. This method has the effect of providing a disk medium σ] inspection method that can be obtained.
第１図はこの発明σ〕一実施例による磁気ディスク媒体
の製造部の検査工杵図、第２図はこの発明の他の実施例
による磁気ディスク蛮体の製造時の検査−１１程図、第
３図は従来の磁気ディスク媒体の製造時の検査工枚図で
ある。
図において、（１）・・通常検査（グライドテスト）、
（２）・φ通常検査（サーテイファイデスト）、（３）
・・通常検査（１」祝テス））、（ｘｔ）・・保存工程
、なお、各図中、同一符号は同−又は相当部分を示す。
製遭工甲４ｙソFIG. 1 is a diagram of an inspection process in a magnetic disk medium manufacturing section according to one embodiment of the present invention σ], and FIG. 2 is a diagram of an inspection-11 process during manufacturing of a magnetic disk according to another embodiment of the present invention. FIG. 3 is a diagram showing an inspection process during manufacturing of a conventional magnetic disk medium. In the figure, (1)...Normal inspection (glide test),
(2)・φ Normal inspection (certify dest), (3)
...Normal inspection (1" congratulatory test)), (xt)...Storage process. In each figure, the same reference numerals indicate the same or equivalent parts. Manufactured by Kou 4y
Claims (1)
時における検査方法において、ディスク媒体の通常検査
前にディスク媒体の耐候性評価を加速させる環境におい
て一定時間保存する保存工程を加えていることを特徴と
するディスク媒体の検査方法。In the inspection method during the manufacturing of disk media used in storage devices that store information, etc., a preservation process is added in which the disk media is stored for a certain period of time in an environment that accelerates the evaluation of the weather resistance of the disk media before the normal inspection of the disk media. Characteristic disk media inspection method.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11475788A JPH01285839A (en) | 1988-05-13 | 1988-05-13 | Inspection of disk medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11475788A JPH01285839A (en) | 1988-05-13 | 1988-05-13 | Inspection of disk medium |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01285839A true JPH01285839A (en) | 1989-11-16 |
Family
ID=14645920
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11475788A Pending JPH01285839A (en) | 1988-05-13 | 1988-05-13 | Inspection of disk medium |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01285839A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100403040B1 (en) * | 1996-12-27 | 2003-12-18 | 삼성전자주식회사 | Method for improving yield of hard disk drive manufacturing process |
-
1988
- 1988-05-13 JP JP11475788A patent/JPH01285839A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100403040B1 (en) * | 1996-12-27 | 2003-12-18 | 삼성전자주식회사 | Method for improving yield of hard disk drive manufacturing process |
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