JPH01265334A - Test state monitor device - Google Patents

Abstract

PURPOSE:To correctly collect and record with no omission the information on the faults or troubles of a device to be tested which are detected during the test by preparing an edition number reading part to read the edition number of the device to be tested, a data processing part to grasp the test state, and a recording part to record said edition number and test state. CONSTITUTION:An edition number reading part 31 to read the edition number of a device 1 to be tested, a data processing part which grasps the test state, and a recording part 32 which records said edition number and test state are provided. The test states of the device 1 are collected by a test device 2 and stored in the part 32 via the part 33 of a test state monitor device 3. While the edition number of the device 1 is read by the part 31 of the device 3 and stored in the part 32. Such two types of recording jobs are carried out via the part 33 of the device 3. Thus it is possible to grasp the test progress state of the device 1 and also to grasp the generating state, the recovering state, etc., of the faults or troubles.

Description

[Detailed Description of the Invention] [Summary] Regarding a test status monitoring device that monitors the test status during prototype testing of large-scale calculations, etc., information on faults and failures of the device under test detected during testing is accurately collected without omission. The purpose of this test is to make it possible to store and record the information, to be able to refer to the information during testing, and to be able to process the information later and use it as statistical information. The test apparatus is configured to include a version number reading section for reading the number, a data processing section for grasping the test status thereof, and a recording section for recording the version number and the test situation.

[Industrial application field]

The present invention relates to a test status monitoring device that monitors the test status during a prototype test of a large-scale computer, and more particularly to a test status monitoring device that facilitates the collection, recording, and accumulation of information.

[Conventional technology]

Conventionally, when testing a prototype of a large computer, etc., a specially developed test program is used.

First, a test program is placed on a floppy disk or the like and registered in an external storage device of a service processor (hereinafter referred to as SVP), and a person in charge of testing instructs the SVP to execute the test program.

SvP takes out a test program from an external storage device and loads it into the memory of the main device. Next, start the CPU and begin the test. At the same time, the test program number/version/title is output to the console.

When the test program detects a failure, the test detail number, main unit PSW/register/memo redump, etc. are output to the console via SVP.

When the test is completed, the SVP is notified of this fact, and the SVP outputs the completion of the test and the number of failures to the console. The number of test programs to be executed is scheduled, and if not all have been executed yet, the remaining test programs are executed in sequence.

The test person investigates the fault detected by the test program and records the details of the design fault, the number of the detected test program (used for confirmation after the fault is corrected), detailed test number, version number, etc. be written by hand in a paper logbook.

[Problem to be Solved by the Invention] However, in the above-mentioned tests using the conventional data processing device, as a means of grasping the test status (progress) of the device under test, a person manually writes records on paper each time a test is performed. There was only one.

Therefore, if a fault or malfunction is detected during the test, repair the device under test, retest, confirm that the fault or malfunction has been repaired, and record the repair in the area recorded earlier. However, the amount of data recorded in a logbook is generally enormous, and when humans record it, they often forget to record it or record it incorrectly.

The present invention was created in view of these problems, and
It is possible to accurately collect and record information on failures and malfunctions of the device under test detected during testing, store that information, refer to it during testing, and process the information later. The purpose of the present invention is to provide a test status monitoring device that can also be used as statistical information.

[Means to solve the problem]

In the present invention, means for solving the above problems are as follows:
A test status monitoring device that monitors the results of tests performed on a device under test by a test device includes a version number reading unit that reads the version number of the device under test, a data processing unit that grasps the test status, and a version number and number. The test status monitoring device is equipped with a recording section for recording the test status.

In the present invention, the device under test refers to the main body (CPU, CHP, CH, memory, etc.) of a large-scale computer etc. to be prototyped, and the test device refers to a 5VP (service processor) alone or a 5VP (service processor) or an SVP and other It refers to a computer system. Note that the test is performed by the SVP loading the test program into the main unit and starting the CPU.

[Effect]

The test status of the device under test is collected by the test equipment and stored in the recording unit via the data processing unit of the test status monitoring device.

On the other hand, the version number of the device under test is read by the version number reading section of the test status monitoring device and stored in the recording section.

By processing the above two types of records in the data processing unit of the test status monitoring device, it is possible to understand the test progress status of the device under test, and also to understand the occurrence status of failures and failures, repair status, etc.

[Example] Hereinafter, an example of the present invention will be described in detail with reference to the drawings.

FIG. 1 is a configuration diagram showing an example of a test status monitoring device implementing the present invention. In the same figure, ■ is the device under test, 2
3 is a test device, and 3 is a test status monitoring device.

The device under test 1 and the test device 2 are the same as conventional ones,
Test device 2 (SVP) tests device under test 1.

The test status monitoring device 3 includes a version number reading section 31 and a recording section 3.
2. It consists of a data processing section 33, where a version number reading section 31 reads the version number of the device under test, and a recording section 32 records and stores the test status and device version number of the device under test. The data processing unit 33 performs processing regarding the test status and version number obtained from the test device 2 and the version number reading unit 31.

FIG. 2 is a schematic diagram showing an example of the contents of a test status record collected by the test status monitoring device of the present invention. In the figure, 4 is the first test situation, which includes a version number record 41 and a test situation record 42. 5 is the second test situation, which includes version number record 51 and test situation record 5.
2.

With the above configuration, before testing, the version number is correctly set in the device under test l, and the contents of the recording section 32 are initialized.

Next, a first test is performed by the device under test 1 and the test device 2, and the test results are sent to the test status monitoring device 3. In the test status monitoring device 3, the data processing section 33 combines and combines the sent test results and the device version number read by the version number reading section 31.
Edit it, add the type and details of any failures or malfunctions, and
If there is no failure or failure, information indicating that the test was successfully completed is added and stored in the recording unit 32 as the first test result 4.

If the device under test l has a problem or failure, it is repaired, the version number is updated, and a second test is performed to confirm the repair details. Furthermore, if the device under test l has been modified, a second confirmation is similarly performed to confirm the details of the modification.

A second test is conducted and stored in the recording unit 32 as test result 5.

The data processing unit 33 compares the first test result 4 and the second test result 5, and extracts differences in device versions and differences in test results. The following three test situations can be known from the extracted information.

■ The failure/failure is recorded only in the first test result, or there was a failure/failure in the first device version, but in the second
It has already been repaired for the last test.

■ Either the failure/failure is recorded only in the second test result, or there was no failure/failure in the first test, but a new one was detected in the second test.

■ Faults/failures are recorded in both the first and second test results. There has been a failure/failure since the first device version, and it has not been repaired even in the second device version.

To explain the above test situation record 42.52 in more detail,
Includes test status and test results.

The test status is the result of testing the main unit of the desired version using the test program, and the contents include the date, whether or not a fault was detected, and if a fault was detected, the detected test program number/test. This is the detail number. The main unit performs fault correction (EC) at an appropriate timing, and the test program itself may be modified, so there are multiple versions of each.

The test result is the result of executing a test program on the device under test. The same device under test is tested many times, multiple test results are collected and stored in the recording unit 32, and based on those test results, it is possible to determine whether or not a fault exists in the device under test. The data processing unit 33 can obtain information such as whether the failure has been repaired or not.

The table below shows an example of the contents of the test status records 42 and 52 shown in FIG.

Among the items in the table above, the 2 device version number indicates the hardware version number, and the test program version number indicates the software version number. The test detail number indicates the part where the failure was detected, and displays the code indicating which test the failure was detected in. The test program version number and test detail number have conventionally been included in the test program and printed out.

Comments are entered by the person in charge in the recording department.

In the first test, two failures were detected, and in the second test, the device under test was repaired (or modified) and the version number changed from AOI to A02.
Although the fault in 0805 has been repaired, the fault in 0806 remains unrepaired, and a new fault in 0807 has occurred.

Comparing the results of the second and third tests, the version of the test program increased while the version of the device under test remained the same, and a new failure of 0808 occurred.

A comparison of the third and fourth test results shows that the device under test was repaired (or modified) and the version number changed from AO2 to AO3.
0806.080, the fault detected in the third test without changing the version of the test program? , 0808 were all repaired and the test program detected no faults on the fourth test.

Conventionally, these were searched by a person in charge from a huge amount of printed data, but in the present invention, the test status monitoring device is provided with a reading section and a recording section for the device version number, and the test status is recorded with the device version number. By adding and storing it in the recording section in real time, for example, you can edit only the part related to the failure,
It can be easily taken out.

〔Effect of the invention〕

As explained above, according to the present invention, information on faults and failures of the device under test detected during a test is collected accurately and without omission, and the information is stored in the recording section, so that the information can be referenced during the test. It is possible to provide a test situation monitoring device that can process the information later and use it as statistical information.

[Brief explanation of the drawing]

FIG. 1 is a configuration diagram of an embodiment of the present invention, FIG. 2 is a schematic diagram of recorded contents according to the present invention. 1; Device under test, 2; test equipment; 3; Test status monitoring device; 31; Version reading section; 32; Data monitoring department; 33; Recording Department. Go A picture of the present invention Figure 1

Claims (1)

[Scope of Claims] In a test status monitoring device (3) that monitors the results of testing the device under test (1) by the test device (2), a version number that reads the version number of the device under test (1). Reading section (31
), a data processing unit (32) for grasping the test status, and a recording unit (33) for recording the version number and the test status.