JPH01259236A - Sample exchanging device - Google Patents
Sample exchanging deviceInfo
- Publication number
- JPH01259236A JPH01259236A JP63086317A JP8631788A JPH01259236A JP H01259236 A JPH01259236 A JP H01259236A JP 63086317 A JP63086317 A JP 63086317A JP 8631788 A JP8631788 A JP 8631788A JP H01259236 A JPH01259236 A JP H01259236A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- magazine
- cartridge
- test
- exchange device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 claims abstract description 63
- 230000008878 coupling Effects 0.000 claims abstract description 9
- 238000010168 coupling process Methods 0.000 claims abstract description 9
- 238000005859 coupling reaction Methods 0.000 claims abstract description 9
- 230000007246 mechanism Effects 0.000 claims description 48
- 238000002474 experimental method Methods 0.000 abstract description 3
- 230000001133 acceleration Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000035939 shock Effects 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
Landscapes
- Sampling And Sample Adjustment (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は、試験装置を移動しなから複数の試料を交換
する試料交換装置に関し、能率良く試験を行うことがで
きるとともに、試料に加わる衝撃を吸収できるようにし
て宇宙へ打ち上げての試験をも可能とするものである。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a sample exchange device that exchanges multiple samples without moving the test device, which allows for efficient testing and reduces impact on the samples. This makes it possible to test it by launching it into space.
材料の試験や実験を行なう試験装置として、温度勾配炉
やイメージ炉等があり、試料を溶融加熱し、凝固成長し
た結晶等を得るようにしている。Temperature gradient furnaces, image furnaces, and the like are used as testing equipment for testing and experimenting with materials, and they melt and heat a sample to obtain solidified and grown crystals.
このような試験装置では、試験か完了する毎に試料を交
換し、新たな試料に収り替えて次の試験を行なうように
している。In such testing equipment, each time a test is completed, the sample is replaced, a new sample is placed, and the next test is performed.
ところが、このような試験装置で多数の試料の試験を行
なおうとすると、試料の交換作業を繰り返し行なわねば
ならず、人手による交換作業では、能率良く交換できな
いという問題かある。However, when attempting to test a large number of samples using such a testing device, the sample must be replaced repeatedly, and there is a problem in that the sample cannot be replaced efficiently if done manually.
特に、新材料の実験環境として注目されている宇宙で試
験を行なおうとする場合には、宇宙空間への打ち上げが
必要であり、このような場合にも損傷すること無く、し
かも自動試験ができる装置の開発か望まれている。In particular, when testing in space, which is attracting attention as an experimental environment for new materials, it is necessary to launch the product into space, and even in such cases, there is no damage and automatic testing is possible. Development of a device is desired.
この発明は、かかる従来技術の課題に鑑みてなされたも
ので、複数の試料を交換しながら試験かできる試料交換
装置を提供しようとするものである。The present invention has been made in view of the problems of the prior art, and aims to provide a sample exchange device that can perform tests while exchanging a plurality of samples.
また、宇宙空間への打ち上げによる大きな加速度が加わ
っても損傷等を受けることがない試料交換装置を提供し
ようとするものである。Another object of the present invention is to provide a sample exchange device that will not be damaged even if large accelerations are applied during launch into outer space.
上記課題を解決するためこの発明の試料交換装置は、試
料の試験を行なう往復移動可能な試験製装置と、この試
験装置の移動により挿脱される複数の試料の一端部が同
一円周上に取付ζすられ割出し回転可能な試料マガジン
とを持つことを特徴とするものである。In order to solve the above problems, the sample exchange device of the present invention includes a reciprocally movable test making device for testing samples, and one end of a plurality of samples inserted and removed by movement of this testing device on the same circumference. It is characterized by having a sample magazine that can be mounted and rotated for indexing.
また、前記試料マガジンと対向し各試料の他端部か嵌合
される支持部か形成され移動可能かつロック機構を具え
た支持板を持つ試料交換装置とすることで、片持ち支持
の試料の損傷や折損を防止している。In addition, by using a sample exchange device having a support plate facing the sample magazine and having a movable support plate to which the other end of each sample is fitted, the support plate is movable and equipped with a locking mechanism. Prevents damage and breakage.
さらに、前記支持板のロック機構と前記試験装置の往復
動機構とを連動させ試験装置を試料から退避させた固定
位置で支持板をロックする連結機構をもつ試料交換装置
とすることて、宇宙への打ち上げなども可能としている
。Furthermore, the sample exchange device has a coupling mechanism that links the locking mechanism of the support plate and the reciprocating mechanism of the test device to lock the support plate at a fixed position where the test device is evacuated from the sample. It is also possible to launch
また、前記試料マガジンの円周の少なくとも１ケ所を固
定かつフリーにする機構をそなえた試料交換装置とする
ことで、宇宙への打ち上げなども可能としている。Furthermore, by providing a sample exchange device with a mechanism that fixes and frees at least one location on the circumference of the sample magazine, it is possible to launch the sample magazine into space.
さらに、前記試料が前記試料マガジンに回転可能に取付
けられ、外部より非接触に回転さぜる機構をもつ試料交
換装置とすることで、試験時の試料への均等加熱などを
可能としている。Further, the sample is rotatably attached to the sample magazine, and the sample exchanger has a mechanism for rotating the sample from the outside without contact, thereby making it possible to uniformly heat the sample during testing.
また、前記試料マガジンのロック機構と前記試験装置の
往復ｍ構とを連動させ試験装置を試料から退避さぜな固
定位置で試料マガジンをロックする連結機構をもつ試料
交換装置とすることで、宇宙への打ち上けや試料の自動
交換をも可能としている。Furthermore, by interlocking the locking mechanism of the sample magazine and the reciprocating mechanism of the test device, the sample exchange device has a coupling mechanism that locks the sample magazine in a fixed position such as when the test device is evacuated from the sample. This also makes it possible to launch into the sky and automatically exchange samples.
このような試験装置では、試験装置を往復移動させると
ともに、試料はその一端部が片持ち支持状態て試料マガ
ジンに取付けられて割りたし回転されるようにしてあり
、駆動機構を分散してそれぞれの機構を簡素化している
。In such a test device, the test device is moved back and forth, and the sample is attached to a sample magazine with one end supported in a cantilevered state so that it can be split and rotated. The mechanism has been simplified.
また、宇宙への打ち上げ時の大きな加速度を考慮し、試
験装置を試料から離脱して退避させる動作に連動して支
持板を移動させ、支持部に試料の他端部を嵌合して両端
支持としたり、トグル機構等てロック状態とするように
しており、この口・ンク状態で試料を両端支持状態とし
て損傷等から保護し同時に試料マガジンの回転をロック
するようにしている。In addition, in consideration of the large acceleration during launch into space, the support plate is moved in conjunction with the operation of separating and retracting the test device from the sample, and the other end of the sample is fitted into the support part to support both ends. In this state, the sample is supported at both ends to protect it from damage, etc., and at the same time, the rotation of the sample magazine is locked.
以下、この発明の一実施例を図面に基づき詳細に説明す
る。Hereinafter, one embodiment of the present invention will be described in detail based on the drawings.
図１１ｉｉはこの発明の試料交換装置の一実施例にかか
り、第１図は正面図、第２図はロック状態の部分正面図
、第３図は平面図、第４図は左側面図、第５図は右側面
図である。11ii shows an embodiment of the sample exchange device of the present invention, FIG. 1 is a front view, FIG. 2 is a partial front view in a locked state, FIG. 3 is a plan view, FIG. 4 is a left side view, and FIG. Figure 5 is a right side view.
この試料交換装置１０は基台１１の左右両端部に支持枠
１２，１．３か立設されており、左側の支持枠１２は矩
形にされ、右側の支持枠１３は上端が尖った五角形にな
っている。This sample exchange device 10 has support frames 12, 1.3 erected at both left and right ends of a base 11, the left support frame 12 is rectangular, and the right support frame 13 is pentagonal with a pointed upper end. It has become.
これら支持枠１２．１３間には、試料マガジン１４の回
転軸１５が軸受１６を介して回転自在に支持されており
、回転軸１５の左端部にプーリ１７か嵌着され、試料マ
ガジン回転用モータ１８のプーリ１９との間に掛けられ
たベル１へ２０を介して駆動され、割り出し回転がてき
るようになっている。A rotating shaft 15 of the sample magazine 14 is rotatably supported between these support frames 12 and 13 via a bearing 16. A pulley 17 is fitted to the left end of the rotating shaft 15, and a motor for rotating the sample magazine is connected to the rotating shaft 15. It is driven via a bell 20 to a bell 1 hung between a pulley 19 and a pulley 18, and index rotation is performed.
この試料マガジン１４は、回転軸１５の右端部に放射状
に複数の試料支持アーム２１が取（−１けてあり、周方
向等間隔に配置され、１本だけか取り除かれた状態とな
っている。This sample magazine 14 has a plurality of sample support arms 21 radially attached to the right end of a rotating shaft 15 (-1 digit), arranged at equal intervals in the circumferential direction, and only one of them is removed. .
また、各試料支持アーム２１の先端部には、同一円周上
に中心が配置された軸受２２が取付けてあり、この軸受
２２を介して試料である試料カートリッジ２３の一端部
か嵌着される支持筒２４と一体の軸２５か支持され、軸
２５の端部に磁気トルクカップリング２６の一方の部材
が取付けである。Further, a bearing 22 whose center is arranged on the same circumference is attached to the tip of each sample support arm 21, and one end of a sample cartridge 23, which is a sample, is fitted through this bearing 22. A shaft 25 integral with the support tube 24 is supported, and one member of a magnetic torque coupling 26 is attached to the end of the shaft 25.
さらに、基台１１の試料カートリッジ２３の回転軸１５
の下方には、試験位置に割り出し回転された試料支持ア
ーム２１に取付けられた軸２５の磁気トルクカップリン
グ２６の一方の部材と対向して他方の部材が非接触状態
で配置され、試料カートリッジ回転用モータ２７および
２つのプーリ２８．２９、ベルト３０を介して駆動され
るようになっており、駆動機構の振動を遮断しながら非
接触状態て駆動するとともに、試験位置の試料カートリ
ッジ２３を１台の駆動機構で回転する６一方、このよう
な試料マガジン１４に取付けられ一端部が支持筒２４て
支持された試料カートリッジ２３を順次試験する試験装
置としての実験炉３１は、試料マガジン１４の回転軸１
５の下方で活動自在になっており、回転軸１５と平行に
配置された送りねじ軸３２およびカイト棒３３によって
移動される移動台３４上に取付けられている。Further, the rotating shaft 15 of the sample cartridge 23 on the base 11
Below, one member of the magnetic torque coupling 26 of the shaft 25 attached to the sample support arm 21 indexed and rotated to the test position is disposed in a non-contact state opposite to the other member. It is designed to be driven via a motor 27, two pulleys 28, 29, and a belt 30, and is driven in a non-contact state while blocking vibrations of the drive mechanism, and also supports one sample cartridge 23 at the test position. On the other hand, the experimental furnace 31 as a test device that sequentially tests sample cartridges 23 attached to such a sample magazine 14 and supported at one end by the support cylinder 24 is rotated by a drive mechanism of the sample magazine 14. 1
It is mounted on a movable table 34 which is movable below the rotary shaft 15 and is moved by a feed screw shaft 32 and a kite rod 33 arranged parallel to the rotary shaft 15.
この移動台３４を駆動して実験炉３１内に試料カートリ
ッジ２３を位置させるため、基台１１の中央部に実験炉
用モータ３５が設けられ、２つのプーリ３６．３７とベ
ル１〜３８で送りねじ軸３２を回転駆動するようになっ
ており、実験炉３１を試料マガジン１４の左端より外側
の退避位置Ａがら実験位置（図示省略）の間を往復動す
る。In order to drive this moving table 34 and position the sample cartridge 23 in the experimental furnace 31, an experimental furnace motor 35 is provided in the center of the base 11, and is moved by two pulleys 36, 37 and bells 1 to 38. The screw shaft 32 is rotatably driven, and the experimental furnace 31 is reciprocated between a retracted position A outside the left end of the sample magazine 14 and an experimental position (not shown).
次に、このような試料マガジン１４に片持状態で取付け
られた試料カートリッジ２３をロヶッ１−での打ち上げ
及び帰還時に他端を支持するため、回転軸１５の左端部
外側に試料マガジン１４の試料カートリッジ２３と対向
する環状の支持板３９が試料カートリッジ２３に接近離
反移動できるよう設置されている。Next, in order to support the other end of the sample cartridge 23 attached to the sample magazine 14 in a cantilevered state during launching and returning from the rocket 1-, the sample cartridge 23 of the sample magazine 14 is placed outside the left end of the rotating shaft 15. An annular support plate 39 facing the cartridge 23 is installed so that it can move toward and away from the sample cartridge 23.
この支持板３９の各試料カートリッジ２３と対向する位
置には、第１図に拡大して示すように、試料カー）〜リ
ッジ２３の先端テーパ部が嵌合される凹部４０か形成さ
れ、ばね４１で前方に付勢されな当接板４２が設けられ
、支持板３９を前進させて試料カートリッジ２３の先端
テーパ部を当接板４２で軸方向に弾性支持すると同時に
、径方向は四部４０に嵌合して支持するようになってい
る。As shown in an enlarged view in FIG. 1, a recess 40 into which the tapered end of the sample car to ridge 23 is fitted is formed at a position facing each sample cartridge 23 of the support plate 39, and a spring 41 An abutment plate 42 is provided which is biased forward by the abutment plate 42, and the support plate 39 is moved forward to elastically support the tapered end of the sample cartridge 23 in the axial direction, and at the same time, the abutment plate 42 is fitted into the four parts 40 in the radial direction. It is designed to support both parties.
この支持板３９の移動およびロック状態を保持するため
トグル機構４３が設けられ、支持枠１２〜 ９ −
に承着されたリンク４４と、支持板３９に承着されたリ
ンク４５が連結リンク４６の一端部に連結してあり、２
つのリンク４４．４５を直線状に移動しなとき、支持板
３９による試料カートリッジ２３の支持およびロックが
できるようになっている。A toggle mechanism 43 is provided to keep the support plate 39 moving and locked, and links 44 attached to the support frames 12 to 9- and links 45 attached to the support plate 39 are connected to the connecting links 46. connected to one end, two
When the two links 44, 45 are not moved linearly, the sample cartridge 23 can be supported and locked by the support plate 39.
また、連結リンク４６は、第２のトグル機構（連結機構
）を構成するよう基台１１に一端部が承着されたリンク
４７と連結され、これら連結リンク４６およびリンク４
７を直線上に移動すると、トグルａｍ４３のリンク４４
．４５が直線上になるようにしてあり、リンク４７の端
部のＬ字部分に引張ばね４８が連結してあり、第２のト
グル機構を作動状態に保持するようにしである。Further, the connecting link 46 is connected to a link 47 whose one end is attached to the base 11 so as to constitute a second toggle mechanism (connecting mechanism).
7 on a straight line, link 44 of toggle am43
．． 45 are arranged in a straight line, and a tension spring 48 is connected to the L-shaped portion at the end of the link 47 to maintain the second toggle mechanism in an activated state.
このようなリンク機構の動作を実験炉３１の移動に連動
させるなめ、実験炉３１の側方にピニオンを構成する１
個の歯状の突起４つが取付けられ、実験炉３１の退避位
置Ａに対応する基台１１にラックを構成する１個の歯状
の凹部５０が形成された回動レバー５１か承着されてお
り、この回動−１〇 −
レバー５１とリンク４７とがリンク５２で連結され、実
験炉３１を退避位置Ａに移動すると、突起４９が回動レ
バー５１の凹部に噛み合って回動レバー５１を引き起し
、リンク５２を介してリンク４７を回動させることで、
トグル１ｌｉｉ４３により支持板３つで試料カートリッ
ジ２３を支持ロックすると同時に、実験炉３１も移動し
ないようにモータブレーキでロックする。In order to link the operation of such a link mechanism with the movement of the experimental reactor 31, a pinion is constructed on the side of the experimental reactor 31.
A rotating lever 51 having four tooth-shaped protrusions attached thereto and having a tooth-shaped recess 50 forming a rack is mounted on the base 11 corresponding to the retracted position A of the experimental reactor 31. When the rotating lever 51 and the link 47 are connected by the link 52 and the experimental reactor 31 is moved to the retracted position A, the protrusion 49 engages with the recess of the rotating lever 51 and the rotating lever 51 is moved. By pulling up and rotating the link 47 via the link 52,
The sample cartridge 23 is supported and locked by the three support plates by the toggle 1lii43, and at the same time, the experimental furnace 31 is also locked by the motor brake so that it does not move.
かように構成した試料交換装置１０による試験は次のよ
うにして行なう。A test using the sample exchanger 10 configured as described above is conducted as follows.
ます、試料マガジン１４の各支持筒２４に試料カー１−
リッジ２３の一端部を嵌着した状態とし、試料フカジン
回転用モータ１８で１つの試料カートリッジ２３を試験
位置に回転する。First, attach the sample car 1- to each support tube 24 of the sample magazine 14.
With one end of the ridge 23 fitted, one sample cartridge 23 is rotated to the test position by the sample rotation motor 18.
こののち、実験炉用モータ３５により実験炉３１を移動
し、実験炉３１内に試料カートリッジ２３を位置させる
と同時に、試料カートリッジ回転用モータ２７により磁
気トルクカップリンク２６を介して非接触状態で試料カ
ートリッジ２３を回転し、均一に加熱されるようにして
試験を行なう。Thereafter, the experimental reactor 31 is moved by the experimental reactor motor 35 to position the sample cartridge 23 in the experimental reactor 31, and at the same time, the sample cartridge rotation motor 27 moves the sample through the magnetic torque cup link 26 in a non-contact state. The test is conducted by rotating the cartridge 23 to ensure uniform heating.
こうして１本の試料カートリッジ２３について試験を行
なったのち、試料カートリッジ２３の交換を行なう。After testing one sample cartridge 23 in this manner, the sample cartridge 23 is replaced.
この交換は、試料カートリッジ２３の回転を停止したの
ち、実験炉３１を移動して試料カートリッジ２３から抜
けた状態として行なう。This replacement is performed after the rotation of the sample cartridge 23 is stopped, and then the experimental furnace 31 is moved and removed from the sample cartridge 23.
試料マガジン１４を試料マガジン回転用モータ１８で回
転し、次の試料カートリッジ２３を試験位置に割り出し
たのち、上記と同様、実験炉３１を移動し、試料カー１
〜リツジ２３を回転しながら実験を行なう。After the sample magazine 14 is rotated by the sample magazine rotation motor 18 and the next sample cartridge 23 is indexed to the test position, the experimental furnace 31 is moved in the same way as above, and the sample car 1 is moved.
~ Conduct the experiment while rotating the ridge 23.
このような実験炉３１の移動と試料マガジン１４の回転
とを繰り返すことで全ての試料カートリッジ２３の試験
を行なう。By repeating such movement of the experimental furnace 31 and rotation of the sample magazine 14, all sample cartridges 23 are tested.
一方、宇宙空間への打ち上げや宇宙空間からの回収の場
合には、試料カートリッジ２３の他端部の支持を行なう
必要があり、この場合、実験炉３１を通常の試料カート
リッジ２３の交換位置よりさらに退避させ、退避位置Ａ
にする。On the other hand, in the case of launching into outer space or recovering from outer space, it is necessary to support the other end of the sample cartridge 23, and in this case, it is necessary to move the experimental reactor 31 farther than the normal sample cartridge 23 replacement position. Evacuate to evacuation position A
Make it.
すると、実験炉３１と一体の移動台３４に取付けられた
歯状の突起４９か回動レバー５１の歯状の凹部５０に噛
み合って回動レバー５１を垂直状態に回動し、実験炉３
１を固定状態とする。Then, the tooth-like protrusion 49 attached to the movable table 34 integrated with the experimental reactor 31 engages with the tooth-like recess 50 of the rotating lever 51, and the rotating lever 51 is rotated to the vertical position.
1 is set as a fixed state.
また、この回動レバー５１の回動により、リンク５２を
介して連結されたリンク４７も回動され、連結リンク４
６て構成される連結機構としての第２のトグル機構がロ
ック状態となると同時に、リンク４４．４５が直線上に
移動され、支持板３つを前進させ、凹部４０に試料カー
トリッジ２３の先端テーパ部を嵌合させて支持する。Further, due to the rotation of the rotation lever 51, the link 47 connected via the link 52 is also rotated, and the connection link 4
At the same time, the second toggle mechanism as a connecting mechanism consisting of 6 is in the locked state, the links 44 and 45 are moved in a straight line, the three support plates are advanced, and the tapered end of the sample cartridge 23 is inserted into the recess 40. Fit and support.
さらに試料マガジンロック機構が連動し、試料マガジン
の回転をロックする。Furthermore, the sample magazine lock mechanism is interlocked to lock the rotation of the sample magazine.
この状態では、支持板３９はリンク４４．４５で構成さ
れるトグル機構４３でロック状態が保持され、ロケット
による打ち上げ時にも解放することがない。In this state, the support plate 39 is held in a locked state by the toggle mechanism 43 composed of links 44 and 45, and will not be released even when launched by a rocket.
そして、実験を行なう場合に、実験炉３１を移動すると
、連動して実験炉３１の固定および支持板３つによる支
持か解放される。When conducting an experiment, when the experimental furnace 31 is moved, the experimental furnace 31 is fixed and released from being supported by the three support plates.
したかって、実験炉３１の固定や支持板３９による支持
のため特に駆動源を必要とせず、簡単な構造となり、装
置の小型軽量化かはかれる。Therefore, no particular drive source is required for fixing the experimental reactor 31 or supporting it with the support plate 39, resulting in a simple structure and the ability to reduce the size and weight of the apparatus.
さらに、試験装置を試料マガジンに片持支持された試料
に挿脱しながら試料交換して試験を行なう試料交換装置
で、試験装置の試料からの退避動作に連動して支持板を
移動させ、試料の開放端を支持部に嵌合するとともに、
トグル機構でロックするようにしたので、試料および試
験装置を簡単にロック状態にすることができるとともに
、構造が簡単であり、小型軽量化をはかることができる
。In addition, the sample exchanger performs tests by exchanging samples while inserting and removing the test device into and from the sample that is cantilever-supported in the sample magazine. While fitting the open end into the support part,
Since the toggle mechanism is used for locking, the sample and test device can be easily locked, and the structure is simple, making it possible to reduce the size and weight.
したがって、この試料交換装置をロケットで打ち上げて
宇宙空間で使用する場合にも、試料の損傷等を招くこと
なく、試験や回収ができる。Therefore, even when this sample exchange device is launched by a rocket and used in outer space, testing and recovery can be performed without causing damage to the sample.
なお、上記実施例では、支持板に連結されるトグル機構
を第２の１〜グル機構を介して試験装置と連動するよう
にしたが、他の機構でも良く、例えば４コのプーリ等で
環状に張ったワイヤをトグル機構に連結するとともに、
試験装置にもワイヤを連結し、試験装置の移動をワイヤ
を介してトグル機構に伝達することも省えられる。In the above embodiment, the toggle mechanism connected to the support plate was linked to the test device via the second 1-to-ggle mechanism, but other mechanisms may also be used. At the same time as connecting the wire stretched to the toggle mechanism,
It is also omitted to connect a wire to the test device and to transmit the movement of the test device to the toggle mechanism via the wire.
また、上記実施例では、試料マガジンを固定式としたが
、着脱式とし、複数の試料マガジンを用意し、−度に多
数の試料カートリッジの試験かできるようにすることも
できる。Further, in the above embodiment, the sample magazine is of a fixed type, but it may be of a removable type, and a plurality of sample magazines may be prepared so that a large number of sample cartridges can be tested at the same time.
さらに、試験装置の移動機構も送りねじ軸とガイド棒に
よるものに限るものでない。 。Furthermore, the moving mechanism of the testing device is not limited to the one using the feed screw shaft and the guide rod. .
以上、一実施例とともに具体的に説明したようにこの発
明によれば、試料の試験を行なう往復移動可能な試験製
装置と、この試験装置の移動により挿脱される複数の試
料の一端部が同一円周上に取付けられ割出し回転可能な
試料マガジンとで試料交換装置を構成したので、試料の
自動交換ができるとともに、試験装置と試料マガジンと
に゛それぞれ駆動機構が分散されそれぞれの機構を簡素
化することもできる。As described above in detail with one embodiment, according to the present invention, a reciprocally movable test making device for testing samples and one end portion of a plurality of samples inserted and removed by movement of this testing device are provided. Since the sample exchange device is composed of a sample magazine that is mounted on the same circumference and can be indexed and rotated, it is possible to automatically exchange samples, and the drive mechanism is distributed between the test device and the sample magazine, so that each mechanism can be operated separately. It can also be simplified.
また、前記試料マガジンと対向し各試料の他端部が嵌合
される支持部か形成され移動可能かつロック機構を具え
た支持板を持つ試料交換装置とすることで、片持ち支持
の試料を支持板で両端支持とすることができ、試料の損
傷や折損を防止することかできる。In addition, by using a sample exchange device having a support plate facing the sample magazine and having a movable support plate into which the other end of each sample is fitted, a cantilever-supported sample can be replaced. Both ends can be supported by support plates, which prevents damage or breakage of the sample.
さらに、前記支持板のロック機構と前記試験装置の往復
動機構とを連動させ試験装置を試料から退避させた固定
位置で支持板をロックする連結機構をもつ試料交換装置
とすることで、宇宙への打ち上げ時に加わる衝撃を抑制
し、宇宙への打ち上げなども可能としている。Furthermore, the sample exchange device has a coupling mechanism that links the locking mechanism of the support plate and the reciprocating mechanism of the test device to lock the support plate at a fixed position where the test device is evacuated from the sample. This suppresses the shock that is applied during launch, making it possible to launch into space.
また、前記試料マガジンの円周の少なくとも１ケ所を固
定かつフリーにする機構をそなえた試料交換装置とする
ことで、宇宙への打ち上げなどの際に固定状態とするこ
とかできる。Furthermore, by providing a sample exchange device with a mechanism that fixes and frees at least one location on the circumference of the sample magazine, the sample magazine can be kept in a fixed state during launch into space or the like.
さらに、前記試料が前記試料マガジンに回転可能に取付
けられ、外部より非接触に回転させる機構をもつ試料交
換装置とすることで、試験時の試料への均等加熱などが
可能となり、試験の自動化を容易としている。Furthermore, by using a sample exchange device with a mechanism in which the sample is rotatably attached to the sample magazine and rotated from the outside without contact, it is possible to heat the sample evenly during testing, and automation of the test is possible. It's easy.
また、前記試料マガジンのロック機構と前記試験装置の
往復機構とを連動させ試験装置を試料から退避さぜな固
定位置で試料マガジンをロックする連結ｍ構をもつ試料
交換装置とすることで、宇宙への打ち上げ時に加わる衝
撃を抑制し、宇宙への打ち上げなども可能としている。In addition, the sample exchange device has a coupling mechanism that links the lock mechanism of the sample magazine and the reciprocating mechanism of the test device to lock the sample magazine in a fixed position such as retracting the test device from the sample. This suppresses the shock that is applied during launch into space, making it possible to launch into space.
図面は、この発明の試料交換装置の一実施例にかかり、
第１図は正面図、第２図はロック状態の正面図、第３図
は平面図、第４図は左側面図、第５図は右側面図である
。
１０・・・試料交換装置、１１・・・基台、１４・・・
試料′マガジン、２３・・・試料カートリッジ、３１・
・・実験炉、３４・・・移動台、３９・・・支持板、４
０・・・凹部、４３・・・トグル機構、４４．４５・・
・リンク、４６・・・連結リンク６
出願人 石川島播磨重工業株式会社
代理人 坂 本 徹
（ほか １ 名）The drawing depicts an embodiment of the sample exchange device of the present invention.
1 is a front view, FIG. 2 is a front view in a locked state, FIG. 3 is a plan view, FIG. 4 is a left side view, and FIG. 5 is a right side view. 10... Sample exchange device, 11... Base, 14...
Sample 'magazine, 23... Sample cartridge, 31.
...Experimental reactor, 34...Moving table, 39...Support plate, 4
0... recess, 43... toggle mechanism, 44.45...
・Link, 46... Linking link 6 Applicant Ishikawajima Harima Heavy Industries Co., Ltd. Agent Toru Sakamoto (and 1 other person)
Claims (6)
この試験装置の移動により挿脱される複数の試料の一端
部が同一円周上に取付けられ割出し回転可能な試料マガ
ジンとを持つことを特徴とする試料交換装置。(1) A reciprocating test device for testing samples;
A sample exchange device characterized by having a sample magazine in which one end of a plurality of samples to be inserted and removed by movement of the test device is attached on the same circumference and can be indexed and rotated.
される支持部が形成され移動可能かつロック機構を具え
た支持板を持つことを特徴とする請求項第１項記載の試
料交換装置。(2) The sample according to claim 1, further comprising a support plate that faces the sample magazine and is movable and equipped with a locking mechanism, in which a support portion into which the other end of each sample is fitted is formed. Exchange device.
機構とを連動させ試験装置を試料から退避させた固定位
置で支持板をロックする連結機構をもつことを特徴とす
る請求項第２項記載の試料交換装置。(3) Claim 2, further comprising a coupling mechanism that interlocks the locking mechanism of the support plate and the reciprocating mechanism of the test device to lock the support plate at a fixed position where the test device is evacuated from the sample. Sample exchange device as described in section.
定かつフリーにする機構をそなえたことを特徴とする請
求項第１項記載の試料交換装置。(4) The sample exchange device according to claim 1, further comprising a mechanism for fixing and freeing at least one location on the circumference of the sample magazine.
られ、外部より非接触に回転させる機構をもつことを特
徴とする請求項第１項記載の試料交換装置。(5) The sample exchange device according to claim 1, wherein the sample is rotatably attached to the sample magazine and has a mechanism for rotating the sample from the outside without contact.
往復機構とを連動させ試験装置を試料から退避させた固
定位置で試料マガジンをロックする連結機構をもつこと
を特徴とする請求項第４項記載の試料交換装置。(6) Claim 4, further comprising a coupling mechanism that interlocks the locking mechanism of the sample magazine and the reciprocating mechanism of the test device to lock the sample magazine at a fixed position where the test device is evacuated from the sample. Sample exchange device as described.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63086317A JPH0692924B2 (en) | 1988-04-08 | 1988-04-08 | Sample exchange device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63086317A JPH0692924B2 (en) | 1988-04-08 | 1988-04-08 | Sample exchange device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01259236A true JPH01259236A (en) | 1989-10-16 |
| JPH0692924B2 JPH0692924B2 (en) | 1994-11-16 |
Family
ID=13883457
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63086317A Expired - Fee Related JPH0692924B2 (en) | 1988-04-08 | 1988-04-08 | Sample exchange device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0692924B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106442062A (en) * | 2016-11-01 | 2017-02-22 | 贵州大学 | Device and method for rapidly and precisely processing experimental coal rock sample |
| CN108169231A (en) * | 2018-01-24 | 2018-06-15 | 南京图思灵智能科技有限责任公司 | A kind of pathological section scanner of large capacity |
-
1988
- 1988-04-08 JP JP63086317A patent/JPH0692924B2/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106442062A (en) * | 2016-11-01 | 2017-02-22 | 贵州大学 | Device and method for rapidly and precisely processing experimental coal rock sample |
| CN106442062B (en) * | 2016-11-01 | 2023-08-15 | 贵州大学 | Rapid and accurate processing device and method for experimental coal rock sample |
| CN108169231A (en) * | 2018-01-24 | 2018-06-15 | 南京图思灵智能科技有限责任公司 | A kind of pathological section scanner of large capacity |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0692924B2 (en) | 1994-11-16 |
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