JPH01235418A - Dc offset removing circuit - Google Patents

Dc offset removing circuit

Info

Publication number
JPH01235418A
JPH01235418A JP6267088A JP6267088A JPH01235418A JP H01235418 A JPH01235418 A JP H01235418A JP 6267088 A JP6267088 A JP 6267088A JP 6267088 A JP6267088 A JP 6267088A JP H01235418 A JPH01235418 A JP H01235418A
Authority
JP
Japan
Prior art keywords
circuit
capacitor
offset
high frequency
lsi
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6267088A
Other languages
Japanese (ja)
Inventor
Shinji Hattori
真司 服部
Munehiro Uratani
浦谷 宗宏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP6267088A priority Critical patent/JPH01235418A/en
Publication of JPH01235418A publication Critical patent/JPH01235418A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To cut high-frequency noise from the internal part of LSI and to reduce DC offset by adding the capacitor of a small capacity in parallel to a normal CR differentiation circuit so as to constitute a DC off set removing circuit. CONSTITUTION:The capacitor 12 of the small capacity is added to the normal CR differentiation circuit 11 of the DC offset removal circuit in parallel. The capacity value C' of the capacitor 12 is set to about 1/10 of the capacity value of the capacitor consisting the differentiating circuit 11. With the capacitor 12, a high band removal effect is given, the gain in the high frequency area is reduced and high frequency noise from the internal part of LSI can be cut and the DC offset can considerably be reduced.

Description

【発明の詳細な説明】 〈産業上の利用分野〉 本発明は、モデム等の通信システムで使用され〈従来の
技術〉 アナログ・フロント・エンド・プロセッサ受侶ヤパシタ
・フィルタ、fl−数100KHz Kてサンプリング
)、3はAAF (Anti  A11asFilte
r、LPFで発生した周波数f8のノイズを除去するた
めのアナログLPF )、4はAGC(Automat
ic Ga1n Control )回路、5はA/D
コンバータ、6はディジタル出力である。
DETAILED DESCRIPTION OF THE INVENTION <Industrial Application Field> The present invention is used in communication systems such as modems. <Prior Art> sampling), 3 is AAF (Anti A11asFilter
r, an analog LPF for removing the noise of frequency f8 generated in the LPF), 4 is an AGC (Automatic
ic Galn Control) circuit, 5 is A/D
Converter 6 is a digital output.

AGC入力へのDCオフセット除去回路として外付けC
R微分回路7が付加されている。AGC回路4はアナロ
グ入力を増幅しA/Dコンバータ5への入力とするDC
アンプであり、AGC回路4への入力はDCオフセット
を極度に抑える必要があるため、上記の様に、外付けC
R微分回路7が前置される。なお、f2はサンプリング
周波数であり、音声帯域では通常7〜1OKHzである
External C as DC offset removal circuit to AGC input
An R differentiation circuit 7 is added. The AGC circuit 4 is a DC converter that amplifies the analog input and inputs it to the A/D converter 5.
Since it is an amplifier and the input to the AGC circuit 4 needs to suppress the DC offset to the extreme, an external C
An R differentiation circuit 7 is placed in front. Note that f2 is a sampling frequency, which is usually 7 to 1 OKHz in the audio band.

〈発明が解決しようとする課題〉 従来方式では、第4図に示す観測点■に於けるゲイン−
周波数特性に於いて高周波領域でのゲインが増加し、特
性が悪化してふ・す、そのためにLSI内部で発生する
クロック等の高周波ノイズが除去できないという問題点
かあまた。
<Problem to be solved by the invention> In the conventional method, the gain at the observation point ■ shown in Fig. 4 -
In terms of frequency characteristics, the gain increases in the high frequency region, causing the characteristics to deteriorate, which often causes problems such as the inability to remove high frequency noise such as clocks generated inside the LSI.

本発明は上記問題点を解決することを目的としているも
のである。
The present invention aims to solve the above problems.

く課題を解決するための手段〉 通常OCR微分回路に並列に小容量のコンデンサを付加
してDCオフセット除去回路を構成する。
Means for Solving the Problem> Normally, a DC offset removal circuit is constructed by adding a small capacitance capacitor in parallel to the OCR differentiation circuit.

〈作 用〉 上記構成とすることにより、LSI内部からの高周波ノ
イズをカットすることができ、DCオフセットを低減す
ることができる。
<Function> With the above configuration, high frequency noise from inside the LSI can be cut and DC offset can be reduced.

〈実施例〉 第1図は本発明に係るDCオフセット除去回路の回路構
成図である。通常OCR微分回路11に並列に小容量の
コンデンサ12が付加されている1、コンデンサ12の
容量値C′は微分回路11を構成するコンデンサの容量
値Cの約琵程度である。
<Embodiment> FIG. 1 is a circuit configuration diagram of a DC offset removal circuit according to the present invention. Usually, a capacitor 12 of small capacity is added in parallel to the OCR differentiating circuit 11. The capacitance value C' of the capacitor 12 is about 1,000 times the capacitance value C of the capacitor constituting the differentiating circuit 11.

第2図は観測点■に於けるゲイン−周波数特注を両者で
比較しtものである。従来方式では高層波頭域でのゲイ
ンが増加し、特性が悪化しており、そのためにLSI内
部で発生するクロック等の高周波ノイズが除去できない
。一方、本発明ではコンデンサ12によって高域除去効
果をもたせることにより、高周波ノイズを低減している
Figure 2 compares the gain-frequency custom orders at observation point (2). In the conventional method, the gain increases in the high wave front region and the characteristics deteriorate, and therefore high frequency noise such as clocks generated inside the LSI cannot be removed. On the other hand, in the present invention, high frequency noise is reduced by providing a high frequency removal effect using the capacitor 12.

第3図は本回路の最終目標である%出力におけるDCオ
フセットの特性を示したものであり、高域ノイズをカプ
トすることによってDCオフセットも大きく低減してい
ることがわかる。
FIG. 3 shows the characteristics of DC offset at % output, which is the ultimate goal of this circuit, and it can be seen that the DC offset is greatly reduced by cutting out high-frequency noise.

〈発明の効果〉 以上のように本発明によれば、LSI内部からの高周波
ノイズをカットすることができ、DCオフセットを大き
く低減することができるものである。
<Effects of the Invention> As described above, according to the present invention, high frequency noise from inside an LSI can be cut, and DC offset can be significantly reduced.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明に係るDCオフセット除去回路の回路構
成図、第2図は第4図に於ける観測点[株]に於けるゲ
イン−周波数特性を示す図、第3図はへ出力における設
定ゲイン−DCオフセット特性を示す図、第4図はアナ
ログ・フロント・エンド・プロセッサ受信側の従来回路
を示すプロ・ツク図である。 符号の説明 11:通常OCR微分回路、12:小容量のコンデンサ
Fig. 1 is a circuit configuration diagram of the DC offset removal circuit according to the present invention, Fig. 2 is a diagram showing the gain-frequency characteristics at the observation point [stock] in Fig. 4, and Fig. 3 is a diagram showing the gain-frequency characteristics at the output to FIG. 4 is a diagram showing a set gain-DC offset characteristic, and is a block diagram showing a conventional circuit on the receiving side of an analog front end processor. Explanation of symbols 11: Normal OCR differentiation circuit, 12: Small capacitor.

Claims (1)

【特許請求の範囲】[Claims] 1、モデム等の通信システムで使用されるアナログ・フ
ロント・エンド・プロセッサのDCオフセット除去回路
に於いて、通常のCR微分回路に並列に小容量のコンデ
ンサを付加したことを特徴とするDCオフセット除去回
路。
1. A DC offset removal circuit for analog front end processors used in communication systems such as modems, which is characterized by adding a small-capacity capacitor in parallel to a normal CR differentiation circuit. circuit.
JP6267088A 1988-03-15 1988-03-15 Dc offset removing circuit Pending JPH01235418A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6267088A JPH01235418A (en) 1988-03-15 1988-03-15 Dc offset removing circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6267088A JPH01235418A (en) 1988-03-15 1988-03-15 Dc offset removing circuit

Publications (1)

Publication Number Publication Date
JPH01235418A true JPH01235418A (en) 1989-09-20

Family

ID=13206959

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6267088A Pending JPH01235418A (en) 1988-03-15 1988-03-15 Dc offset removing circuit

Country Status (1)

Country Link
JP (1) JPH01235418A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH048007A (en) * 1990-04-26 1992-01-13 Oki Electric Ind Co Ltd Automatic gain control circuit

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS507445A (en) * 1973-05-18 1975-01-25
JPS5333029A (en) * 1976-09-09 1978-03-28 Nec Corp Cut-off frequency variable filter

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS507445A (en) * 1973-05-18 1975-01-25
JPS5333029A (en) * 1976-09-09 1978-03-28 Nec Corp Cut-off frequency variable filter

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH048007A (en) * 1990-04-26 1992-01-13 Oki Electric Ind Co Ltd Automatic gain control circuit

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