JPH01233905A - Manufacture system for surface acoustic wave resonator - Google Patents

Manufacture system for surface acoustic wave resonator

Info

Publication number
JPH01233905A
JPH01233905A JP6072588A JP6072588A JPH01233905A JP H01233905 A JPH01233905 A JP H01233905A JP 6072588 A JP6072588 A JP 6072588A JP 6072588 A JP6072588 A JP 6072588A JP H01233905 A JPH01233905 A JP H01233905A
Authority
JP
Japan
Prior art keywords
film pattern
thin film
crystal substrate
tape
cut
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6072588A
Other languages
Japanese (ja)
Inventor
Masaaki Morita
森田 正昭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP6072588A priority Critical patent/JPH01233905A/en
Publication of JPH01233905A publication Critical patent/JPH01233905A/en
Pending legal-status Critical Current

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  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)

Abstract

PURPOSE:To improve the yield and to avoid the deterioration in the characteristic by applying half-cut from a rear face while a pattern face of a piezoelectric substrate with a thin film pattern formed thereon in advance is directed downward, adhering an assembling tape to the rear face of the substrate, cutting fully the remaining part so as co separate individual elements. CONSTITUTION:A tin film pattern 2 is formed on a crystal plate surface 1 to form a crystal substrate wafer 3. The crystal substrate wafer 3 is adhered onto an UV radiation cut tape 4 while its thin film pattern 2 is directed downward. The wafer 3 is subjected to half cut from the rear face 5 of the crystal substrate wafer 3, UV radiation is applied to the side of the thin film pattern 2 to reduce the adhering force of the UV radiation cut-tape 4 and the thin film pattern 2. Then the side of the thin film pattern 2 of the crystal substrate wafer 3 and the rear face 5 of the crystal substrate wafer 3 are adhered by an assembling tape 6 and then the UV radiation cut tape 4 is exfoliated. Then each chip is split completely by a metal blade 7 from the side of the thin film pattern 2 of the crystal substrate wafer 3. With the assembling tape 6 expanded while being heated to a temperature of 70 deg.C, a clean surface acoustic wave device element 8 separated completely is obtained.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は表面弾性波共振子の製造方式の改良に関し、特
にその圧電基板の切断プロセスに関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to an improvement in a manufacturing method for a surface acoustic wave resonator, and particularly to a process for cutting a piezoelectric substrate thereof.

(従来の技術) 従来、表面弾性波共振子、すなわち表面弾性波デバイス
に使用されているウエノ・は要求特性から水晶、あるい
はLiTa0.などの基板が使用されている。このウェ
ハは半導体素子に使用されているシリコンウェハとは異
なって硬脆な性質をもっているため、切断時にもげたり
、あるいは割れ走りじやすく、この切断の際に生ずる小
片がチップ表面に付着したり、あるいはパターンを傷つ
けたりする。
(Prior Art) Conventionally, Ueno resin used in surface acoustic wave resonators, that is, surface acoustic wave devices, is made of quartz crystal or LiTa0. Substrates such as are used. Unlike the silicon wafers used in semiconductor devices, these wafers are hard and brittle, so they tend to peel off or crack when cut, and small pieces generated during cutting may stick to the chip surface. Or damage the pattern.

まな、表面弾性波デバイスでは、チップ表面を表面波が
伝搬するように作られているため、チップ表面に保、備
膜をコートしていない。よって、表面は傷つきやすく)
、切断層の付着により電気特性が劣化する。
However, surface acoustic wave devices are made so that surface waves propagate on the chip surface, so the chip surface is not coated with a protective film. Therefore, the surface is easily damaged)
, the electrical properties deteriorate due to the adhesion of the cutting layer.

表面弾性波デバイスでは切断時にクラックが生じやすい
材料を使用しており、切断層が付着するとデバイス表面
を傷つけるので、表面弾性波デバイス用りエハの切断は
次の2通りの方法により行っている。
Surface acoustic wave devices use materials that tend to crack when cut, and if a cutting layer adheres, it will damage the device surface, so wafers for surface acoustic wave devices are cut using the following two methods.

第1の方法は、切断層の発生を極力抑えると込う観点か
ら薄いグレードにより低速でフルカットする切断法であ
る。
The first method is a cutting method in which full cutting is performed at low speed using a thin grade from the viewpoint of suppressing the generation of cut layers as much as possible.

第2の方法は、切断層の付着を完全になくす虎め、ウエ
ノ・にレジストを塗付した状態でノ・−7カツトを行い
、レジストを除去した後に手でチップに分割する切断法
である。
The second method is to completely eliminate the adhesion of the cut layer, by making 7 cuts with resist applied to Ueno®, and after removing the resist, the cutting method is divided into chips by hand. .

(発明が解決しようとする課題) 上述した従来の表面弾性波共振子の製造方式は、上記第
1の方式では切断屑の付着により電気的損失特性が劣化
するという欠点があり、上記第2の方式ではチップサイ
ズの小形化によりチップ分割時の工数および不良率が増
加するという欠点がある。特に、最近の表面弾性波デバ
イスは高周波、広帯域化、小形されており、上記欠点が
顕著である。
(Problem to be Solved by the Invention) The above-mentioned conventional surface acoustic wave resonator manufacturing method has the disadvantage that the electrical loss characteristics deteriorate due to adhesion of cutting chips in the first method, and the second method This method has the disadvantage that the reduction in chip size increases the number of man-hours and failure rate during chip division. In particular, recent surface acoustic wave devices have become high-frequency, broadband, and compact, and the above-mentioned drawbacks are noticeable.

本発明の目的は、予め薄膜ノくターンの形成された圧電
基板のパターン面を下にして裏面からノ・−フカットを
行い、さらに基板の裏面に組立て用テープを貼った後、
残りの部分をフルカットして個々の素子を分離すること
により上記欠点を除去し、特性の劣化や歩留りなどを改
善できるように構成した表面弾性波共振子の製造方式を
提供することにある。
The object of the present invention is to cut a piezoelectric substrate on which thin film nodules have been formed in advance from the back side with the pattern side facing down, and after applying assembly tape to the back side of the substrate,
It is an object of the present invention to provide a manufacturing method for a surface acoustic wave resonator configured to eliminate the above-mentioned drawbacks by completely cutting out the remaining portion and separating the individual elements, thereby improving the deterioration of characteristics and the yield.

(課題を解決するための手段) 本発明による表面弾性波共振子の製造方式は、ハーフカ
ット手段と、組立てテープと、フルカット手段とを具備
して構成したものである。
(Means for Solving the Problems) A method for manufacturing a surface acoustic wave resonator according to the present invention is configured to include a half-cut means, an assembly tape, and a full-cut means.

ハーフカット手段は、予め薄膜パターンを形成した圧電
基板のパターン面を下向きにして上側の裏面をハーフカ
ットするためのものである。
The half-cut means is for half-cutting the upper back surface of the piezoelectric substrate on which a thin film pattern has been formed with the pattern surface facing downward.

組立てテープは、基板の裏面に貼られた個々の素子の散
逸を防ぐ九めのものである。
The assembly tape is the ninth thing that prevents dispersion of the individual elements attached to the back side of the board.

フルカット手段は、ハーフカットした残りの部分をカッ
トして個々の素子を分離するためのものである。
The full cut means is for cutting the remaining half-cut portion to separate individual elements.

(実施例) 次例い本発明について図面を参照して説明する。(Example) Next, the present invention will be explained with reference to the drawings.

第1図(a)、(b)は、本発明【よる表面弾性波共振
子の製造方式の一実施例を示す説明図である。第1図に
おいて、1は水晶基板、2は薄1漢パターン、3は水晶
基板ウェハ、4はUV前照射形断テープ、5は水晶基板
1の裏面、6は組立て用テープ、7は25μm厚のメタ
ルブレードである。
FIGS. 1(a) and 1(b) are explanatory diagrams showing an embodiment of a method for manufacturing a surface acoustic wave resonator according to the present invention. In Fig. 1, 1 is a crystal substrate, 2 is a thin 1-character pattern, 3 is a crystal substrate wafer, 4 is a UV pre-irradiated cutting tape, 5 is the back side of the crystal substrate 1, 6 is an assembly tape, 7 is a 25 μm thick It is a metal blade.

第1図(a)に示すように、88011m厚の水晶板表
面1上に薄膜パターン2を形成して水晶基板ウェハ3を
形成する。水晶基板ウエノ〜3は薄膜パターン2を下に
し、温度を70°Cまで加熱して80μm厚のUV熱照
射形断テープ4に貼付ける。
As shown in FIG. 1(a), a thin film pattern 2 is formed on a crystal plate surface 1 having a thickness of 88011 m to form a crystal substrate wafer 3. The crystal substrate Ueno-3 is placed with the thin film pattern 2 facing down, heated to a temperature of 70° C., and attached to a UV heat-irradiated cutting tape 4 having a thickness of 80 μm.

水晶基板ウェハ3の裏面5から50μm厚だけ残してウ
ェハ3をハーフカットする。ノー−7カツトの後、薄膜
パターン2の側に24mW/−のUV照射を行って、U
V熱照射形断テープ4と、水晶基板表面1上の薄膜パタ
ーン2との粘着力を初期強度の1/10以下に低下させ
ている。
The wafer 3 is half-cut leaving a thickness of 50 μm from the back surface 5 of the crystal substrate wafer 3. After no-7 cuts, UV irradiation of 24 mW/- was performed on the thin film pattern 2 side to
The adhesive force between the V-heat irradiation cut tape 4 and the thin film pattern 2 on the surface 1 of the crystal substrate is reduced to 1/10 or less of the initial strength.

次に、水晶基板ウエノ・3の薄膜パターン2の側と、水
晶基板3の裏面5とに組立て用テープ6を貼付け、その
後でUV熱照射形断テープ4を水晶基板表面1から剥が
す。次に第1図(b)に示すように、水晶基板3の薄膜
パターン2の側から25μm厚のメタルブレード7によ
り、切残した50μm厚を切断して各チップへと完全に
分離する。
Next, an assembly tape 6 is attached to the thin film pattern 2 side of the crystal substrate Ueno 3 and to the back surface 5 of the crystal substrate 3, and then the UV heat irradiation cutting tape 4 is peeled off from the surface 1 of the crystal substrate. Next, as shown in FIG. 1(b), the remaining 50 μm thickness is cut from the thin film pattern 2 side of the crystal substrate 3 using a 25 μm thick metal blade 7 to completely separate each chip.

組立てテープ6を70°Cの温度に加熱しながら拡張す
ると、完全に分離された清浄な表面弾性波デバイス素子
8を得ることができる。
By expanding the assembly tape 6 while heating it to a temperature of 70° C., completely separated and clean surface acoustic wave device elements 8 can be obtained.

第2図(a)〜(c)は、第1図(a)、(b)の詳細
を示す説明図であるn第2図において、第1図と同じ要
素には同じ番号が付与してあり、8は表面弾性波デバイ
ス素子である。
Figures 2 (a) to (c) are explanatory diagrams showing details of Figures 1 (a) and (b).In Figure 2, the same elements as in Figure 1 are given the same numbers. 8 is a surface acoustic wave device element.

第2図(a)のUV熱照射形断テープ4は、第2図(b
)のように水晶基板ウェハ3に貼付けられる。続いて、
UV熱照射形断テープ4を除去するため、第2図(e)
に示すように組立て用テープ6を貼付けて表面弾性波デ
バイス素子8を分離できるようKする。
The UV heat-irradiated cutting tape 4 shown in FIG. 2(a) is
) is attached to the crystal substrate wafer 3. continue,
In order to remove the UV heat irradiation cutting tape 4, as shown in FIG. 2(e)
As shown in FIG. 3, an assembly tape 6 is attached so that the surface acoustic wave device element 8 can be separated.

(発明の効果) 以上説明したように本発明は、予め薄膜パターンの形成
されな圧電基板のパターン面を下にして裏面からハーフ
カットを行い、さらに基板の裏面に組立て用テープを貼
った後、残りの部分をフルカットKして個々の素子を分
離することKより、次の第1〜第8の効果がある。
(Effects of the Invention) As explained above, in the present invention, half-cutting is performed from the back side of a piezoelectric substrate on which a thin film pattern has not been formed with the pattern side facing down, and after applying an assembly tape to the back side of the substrate, The following first to eighth effects can be obtained by fully cutting the remaining portion and separating the individual elements.

第1図は、パターン面を下にして切断深さ量の85πを
切断しているため、素子上のパターン面への切断屑の付
着量は低減され、汚れの少ない良好な素子を得ることが
できるという効果である。
In Figure 1, since the pattern surface is facing down and the cutting depth is 85π, the amount of cutting debris adhering to the pattern surface on the element is reduced, making it possible to obtain a good element with less contamination. The effect is that it can be done.

第2は、ハーフカットの後にテープによるフルカット切
断が可能であるため、大幅な工数の低減が可能であると
いう効果がある。
Second, since it is possible to perform full-cut cutting using tape after half-cutting, there is an effect that the number of man-hours can be significantly reduced.

第8は、パターン面とは反対の裏面から切断を行うため
、基板にクラックが発生し難いので切断速度を高速化で
きるという効果がある。
Eighth, since cutting is performed from the back side opposite to the patterned side, cracks are less likely to occur in the substrate, so there is an effect that the cutting speed can be increased.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図(a)、(b)は、本発明による表面弾性波共憑
子の製造方式の一実施例を示す説明図である。 第2図(a)〜(i))は、第1図に示す製造方式の詳
細を示す説明図である。 1・吻・水晶基板表面 216.薄膜パターン 3・・・水晶基板ウエノ・ 4・・−UV照射形切断テープ S−◆・水晶基板裏面 6・@中組立て用テープ ツー−拳メタルブレード 8脅・・表面弾性波デバイス素子
FIGS. 1(a) and 1(b) are explanatory diagrams showing an embodiment of a method for manufacturing a surface acoustic wave companion according to the present invention. FIGS. 2(a) to 2(i) are explanatory diagrams showing details of the manufacturing method shown in FIG. 1. 1. Proboscis/Crystal substrate surface 216. Thin film pattern 3...Crystal substrate ueno・4...-UV irradiation type cutting tape S-◆・Crystal substrate back side 6・@Medium assembly tape to fist metal blade 8 threat・・Surface acoustic wave device element

Claims (1)

【特許請求の範囲】[Claims] 予め薄膜パターンを形成した圧電基板のパターン面を下
向きにして上側の裏面のハーフカツトするためのハーフ
カット手段と、前記基板の裏面に貼られた個々の素子の
散逸を防ぐための組立てテープと、前記ハーフカットし
た残りの部分をカットして前記個々の素子を分離するた
めのフルカット手段とを具備して構成したことを特徴と
する表面弾性波共振子の製造方式。
a half-cut means for half-cutting the upper back surface of a piezoelectric substrate on which a thin film pattern has been formed with the pattern surface facing downward; an assembly tape for preventing the individual elements attached to the back surface of the substrate from dispersing; 1. A method for manufacturing a surface acoustic wave resonator, comprising a full cut means for separating the individual elements by cutting the remaining portion after the half cut.
JP6072588A 1988-03-15 1988-03-15 Manufacture system for surface acoustic wave resonator Pending JPH01233905A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6072588A JPH01233905A (en) 1988-03-15 1988-03-15 Manufacture system for surface acoustic wave resonator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6072588A JPH01233905A (en) 1988-03-15 1988-03-15 Manufacture system for surface acoustic wave resonator

Publications (1)

Publication Number Publication Date
JPH01233905A true JPH01233905A (en) 1989-09-19

Family

ID=13150541

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6072588A Pending JPH01233905A (en) 1988-03-15 1988-03-15 Manufacture system for surface acoustic wave resonator

Country Status (1)

Country Link
JP (1) JPH01233905A (en)

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