JPH0121028Y2 - - Google Patents

Description

[Detailed description of the invention] The present invention relates to an automatic inspection device that automates the acceptance inspection of raw materials, quality inspection for shipping products, etc., and in particular, it determines the quality of inspected objects moving on the line and The present invention relates to an automatic inspection device equipped with a mechanism for excluding non-defective products from the line.

In recent years, the automation of manufacturing and processes in various industries has made remarkable progress, and processes are becoming increasingly unmanned and faster.

Generally, in the inspection process in the manufacturing process, the quality of the inspected object (hereinafter referred to as a specimen) that is continuously moved on a line such as a belt conveyor is determined by some method, and only defective items are removed from the line. I am taking a method. In many processes, this inspection step is performed by humans, and defective products that are identified visually are removed from the line on the spot or within easy reach.

When this process is mechanized, it consists of a sensor that determines whether the sample is good or not, and a rejector that removes defective products from the line, but generally the sensor part is large and sensitive, so The machine is installed at a certain distance from the sensor. The problem at this time is whether defective products detected by the sensor can be distinguished from other non-defective products and correctly rejected.

In order to solve this problem, the conventional method is to synchronize the sensor and the ejector in time and control them by keeping the moving speed of one specimen constant.
Alternatively, a method is being considered in which the number of specimens passing through the position of the two sensors and the number of specimens passing through the position of the rejector are counted, and an instruction is given as to which specimen is defective for control. However, in the former process, it is difficult to keep the moving speed of the sample constant and time synchronized in a normal process, and there is also a lack of responsiveness to changes in the sample load. When the sample disappears from the line, all subsequent operations of the rejector become erroneous, and there is a danger that the next good product will be rejected without rejecting the defective product. .

The present invention was developed in view of the above points, and consists of an n-stage transmitter that transmits information regarding the quality of the specimen between the state discrimination sensor that determines the quality of the specimen and the ejector according to the movement position. By providing a transmission means, even if the moving speed of the specimen is not constant or the number of specimens between the sensor and the rejector is small, only defective products can be reliably rejected and the inspection can be automated. The purpose of the present invention is to provide an automatic inspection device that makes it possible to improve the reliability of cases.

Hereinafter, an embodiment of the present invention will be described with reference to the accompanying drawings.

FIG. 1 is an explanatory diagram showing the basic configuration of an automatic inspection device according to the present invention. As described above, the device to which the present invention is applied is a device that automatically inspects products or raw materials that are continuously moving on a line, and removes only defective products from the line. As shown in Figure 1, this device is a condition determination sensor CS that detects the condition of the sample TO and determines whether it is good or bad.
and a removal machine that removes defective products from line L.
REM and the sample TO shown from the previous stage when the sample TO arrives at a predetermined position on line L.
The transmission means consists of an n-stage transmitter TS that transmits information regarding the quality of the product to the subsequent stage.
The transmitter TS has a position between the position of the state discrimination sensor CS on the line L and the position of the remover REM, and the interval between the position detection parts (detection areas of the position sensors to be described later) of each transmitter is set in the moving direction of the specimen TO ( They are arranged in a straight line with respect to the moving direction so that the dimensions are smaller than the longitudinal dimension. Note that f _c is information about the quality of the specimen from the condition discrimination sensor CS, and f _R is information about the quality of the specimen TO
This is an exclusion command that is output from the n-th stage transmitter when it is determined that it is defective.

FIG. 2 is an explanatory diagram showing an embodiment based on the basic configuration shown in FIG. 1. In this example, each transmitter TS ₁
A position _sensor PS ₁ ~ _{PS o} that detects when the sample TO has arrived on the line L, and a D-type flip-flop that outputs information about the quality of the sample from the previous stage to the subsequent stage. F/F ₍₁₎ ~F/
It consists of F _(o) .

The operation of this embodiment will be explained below with reference to FIG.

The sample TO is continuously moved on the line L by means of conveyance such as a conveyor. Status determination sensor
The CS constantly determines whether the sample TO is good or bad, and sends the result to the first-stage transmitter TS ₁ as a signal f _c . Here, the level of the signal "f _c " corresponding to a defective product is "H", the level of the signal "f _c " corresponding to a good product is set to L, and when the position sensors PS ₁ to _{PS o} detect a specimen, Flip Flop F/F ₍₁₎ ~
The level of the signal applied to the input terminal T of F/F _(o) is "H", and when the level of the signal input to this input terminal T rises from "L" to "H", that is, when the sample begins to pass through the detection area of position sensors PS ₁ to PS _o , flip-flop F/F ₍₁₎ to F/
It is assumed that the input signal at the input terminal D at that time is output from the output terminal Q of F _(o) .

If the status discrimination sensor CS determines that a certain sample TO is defective, the input terminal D of the first stage transmitter TS ₁
An "H" signal is input to. And this sample
When TO is detected by the first stage position sensor PS ₁ ,
From the output end Q of the transmitter TS ₁ to the next stage transmitter TS ₂
An "H" signal is input to the input terminal D of. Furthermore, when the sample TO is detected by the next stage position sensor PS ₂ , the "H" signal sent from the first stage transmitter TS ₁ is transmitted from the output end Q to the third stage transmitter TS _3.
send to As the sample TO moves sequentially through the transmitter in this way, an "H" signal corresponding to the state of the sample TO, which in this example corresponds to a defective product, is transmitted sequentially through the transmitter. When the sample TO reaches the final stage transmitter TS _o , an "H" signal is sent from there to the rejecter REM as an reject command. As a result, the rejector REM operates, and the defective sample TO is eliminated from the line L.

Here, the reason why the interval a between the detection areas of adjacent position sensors is made shorter than the length b in the moving direction of the specimen will be described. If the distance a is longer than the dimension b, for example, after a good specimen passes the first stage position sensor PS ₁ , the next stage position sensor
There is a state in which the specimen does not reach PS ₂ , but in this case, if the sample of the subsequent defective product reaches the first stage position sensor PS ₁ , the input terminal D of the next stage transmitter TS ₂
The signal becomes "H" which corresponds to a defective product.
When a non-defective specimen reaches the next-stage position sensor _PS2 , an "H" signal is output from the output terminal Q of the next-stage transmitter _TS2 . Therefore, the correspondence between the state of the specimen located in front of the transmitter and the state determination signal output from the transmitter is broken, resulting in the rejection of good specimens or, conversely, the rejection of defective specimens. This happens if you put the sample on the line without removing it. On the other hand, if the distance a is shorter than the dimension b, the front specimen always reaches the next stage position sensor PS ₂ before the subsequent specimen reaches the first stage position sensor PS ₁ . Therefore, the above-mentioned inconvenience does not occur.

As described above, according to the present invention, multiple stages of transmitters are arranged along a line, and signals for determining the condition of the inspected object are sequentially transmitted through the transmitters in accordance with the movement of the inspected object, and the final stage The distance between the position detecting parts of adjacent transmitters is smaller than the dimension in the moving direction of the object to be inspected. Therefore, regardless of the moving speed of the object to be inspected, the timings of transmission and movement of the condition determination signal correspond to each other, and the condition of the object to be inspected and the condition determination signal reliably correspond. The inspected object sent to and the state determination signal input to the rejecter correspond to each other. As a result, even if the moving speed of the inspected object is not constant, even if the line temporarily stops, or if the inspected object falls off the line, the distance between the condition discrimination sensor and the ejector will be reduced. Even if the number of objects to be inspected decreases, only defective products can be reliably rejected, and automatic inspection can always be carried out with high reliability regardless of the distance between the condition discrimination sensor and the rejector. Note that if a non-contact type position detector is used, automatic inspection can be performed without affecting the line in any way.

[Brief explanation of the drawing]

FIG. 1 is an explanatory diagram showing the basic configuration of an automatic inspection device according to the present invention, and FIG. 2 is an explanatory diagram of an embodiment based on the basic configuration of FIG. 1. CS...Status determination sensor, TO...Object to be inspected (specimen), REM...Removal machine, TS, TS ₁ to TS _a ...Transmitter, PS ₁ to PS _o ...Position sensor, F/F _{(1 )} ~F/
F _(o) ...D type flip-flop, L...line.

Claims (1)

[Claims for Utility Model Registration] A condition discrimination sensor detects and discriminates whether the inspected object is good or bad as it moves continuously on the line, and a rejector installed after the condition discrimination sensor is operated to determine whether it is defective or not. In an automatic inspection device that removes a classified object to be inspected from a line, a plurality of transmitters are disposed along the line between the state discrimination sensor and the rejecter, and each transmitter is configured to remove the object to be inspected from the line. It consists of a position detection section that detects the position, and a signal transmission section that gives the status determination signal input at that time to the next stage transmitter when the position detection signal from this position detection section is input. A state determination signal from the state determination sensor is input to the signal transmission section of the transmitter, and
A state determination signal from a signal transmission section of a last stage transmitter is input to the eliminator, and the distance between adjacent position detection sections is smaller than the dimension of the object to be inspected in the moving direction. Device.