JPH0120655Y2 - - Google Patents

Description

[Detailed description of the invention] The present invention calculates a calibration coefficient of the analyzer based on the calibration value of a calibration sample connected to the analyzer and measured by the analyzer, and calculates the calibration coefficient of the analyzer according to the calibration coefficient. The present invention relates to a calibration device for an analyzer configured to correct measured values.

Generally, analyzers have zero point fluctuations and span point fluctuations, so in order to avoid errors in measured values due to these fluctuations, the above-mentioned calibration device is often used to correct the measured values. In addition, in such a calibration device, the above-mentioned analyzer is calibrated by calculating the parallel shift of the input characteristic of the analyzer at the zero point and calculating the slope of the input characteristic at the span point. There is.

However, in the above-mentioned calibration device,
Calculating the parallel shift of the above input characteristic at the zero point and calculating the slope of the above input characteristic at the span point, and calculating the slope of the above input characteristic at the zero point and calculating the parallel shift of the above input characteristic at the span point. If an attempt was made to configure the device so that it could do either of these, it would have the drawback of increasing the size of the device and increasing manufacturing costs.

The present invention was devised in view of these drawbacks, and its purpose is to
To provide a calibration device for an analyzer that allows the user to freely select whether to calculate the parallel shift and slope of the input characteristic at the zero point and span point, respectively, or at the span point and zero point, respectively. There is a particular thing.

The feature of this invention is a calibration device for an analyzer that calibrates the analyzer by calculating the parallel shift and slope of the input characteristics based on the calibration values of the calibration sample that is connected to the analyzer and measured by the analyzer. In this method, a predetermined digital input circuit is added, and depending on the output signal from the digital input circuit, the above-mentioned parallel movement and inclination components are calculated at the zero point and the span point, respectively, or at the span point and the zero point, respectively. The reason is that it is structured so that you can freely choose between the two.

Hereinafter, the present invention will be explained in detail using figures. FIG. 1 is a signal system diagram showing an example of use of the embodiment of the present invention, in which 1 is the calibration device of the embodiment of the present invention, 2 is an analyzer to be calibrated, such as an infrared gas analyzer, 4 5 is a calibration sample made of, for example, a standard gas, and 5 is a measurement sample made of, for example, a measurement gas.
Further, a calibration sample 4 and a measurement sample 5 are supplied to the analyzer 2 via electromagnetic valves 3, respectively, and a predetermined signal form (for example, a DC voltage of 0 to 1 V) measured by the analyzer is supplied from the analyzer 2. etc.) is sent to the calibration device 1. Furthermore, a contact signal Sb for instructing the start of the calibration operation is applied from the outside to the calibration device 1, and a control signal Sc for controlling the opening/closing of the solenoid valve 3 and a contact signal indicating that the calibration operation is in progress are applied from the calibration device 1. Signal Sd, contact signal Se indicating various alarm states,
And a calibrated measurement signal Sf, etc., which is obtained by calibrating the analog input signal Sa, is sent out.

FIG. 2 is a block circuit diagram of an embodiment of the present invention. In the figure, 6 is an amplifier that receives and amplifies the analog input signal Sa, and 7 is an A/D converter that converts the output signal of the amplifier 6. The converter 8 is a digital input circuit that outputs a predetermined digital signal and is composed of, for example, a changeover switch or a jumper on a printed board, and 9 receives the output signal from the A/D converter 7 or the digital input circuit 8, respectively. The input/output interface 10 is a ROM (Read Only) in which predetermined programs and data are stored.
Memory) 11 and RAM (Random Access
Memory) 12 is installed and performs predetermined calculations upon receiving the output signal from the input/output interface 9, and also outputs various control signals Sc, Sd, Se and a calibrated measurement signal Sf via the input/output interface 9. A microprocessor that outputs (hereinafter,
(referred to as "CPU").

The operation of the embodiment of the present invention having the above configuration will be explained below. In FIG. 2, when the analog input signal Sa is input, it is amplified by an amplifier 6 and then converted into an A/D converter by an A/D converter 7.
The data is converted and then sent to the CPU 10 via the input/output interface 9. On the other hand, the digital input circuit 8 outputs, for example, the above changeover switch.
A predetermined digital signal indicating ON or OFF is sent to the CPU 10 via the input/output interface 9. Further, in the CPU 10, the digital signal causes the changeover switch to be turned on, for example.
If it is determined that it is ON, a program (hereinafter referred to as "first program") that calculates the parallel shift and slope of the input characteristics in the analyzer at the zero point and span point, respectively, is stored in the ROM11.
(or RAM 12). Therefore, the amplifier 6,
The input signal Sa (hereinafter referred to as "measurement input signal") sent to the CPU 10 via the A/D converter 7 and the input/output interface 9 is subjected to arithmetic processing according to the first program. , corresponding to the calculation results, the above various control signals Sc, Sd, etc.
Se and the calibrated measurement signal Sf are sent from the CPU 10 to the outside via the input/output interface 9. Similarly, when it is determined that the changeover switch is OFF based on the digital signal, a program (hereinafter referred to as "Second program"
) is the above ROM11 (or RAM12)
selected from among the programs stored in . Therefore, the measurement input signal is subjected to calculation processing according to the second program, and the various control signals Sc, Sd, Se and the calibrated measurement signal Sf are sent from the CPU 10 in accordance with the calculation results. The data is then sent to the outside via the input/output interface 9.

According to the embodiment of the present invention as described in detail above, since the first program or the second program is selected by the digital signal from the digital input circuit 8, a special large-sized device is not added. It is possible to calculate the parallel shift and slope of the input characteristics of the analyzer at the zero point and the span point, respectively, or at the span point and the zero point, respectively, without increasing the size of the device. It has the advantage of being free to choose what to do. Furthermore, since the digital input circuit is an inexpensive component, there is an advantage that the increase in cost due to the addition of the digital input circuit can be almost ignored. In addition, when calibrating an analyzer using the embodiment of the present invention described above, it is necessary to wait until the input signal stabilizes during zero point calibration or span calibration, and then take in the data after stabilization to calculate the calibration coefficient. Time elements such as time and span time are required, but if this zero time or span time is set to zero, span calibration or zero point calibration can be performed independently.

[Brief explanation of the drawing]

FIG. 1 is a signal system diagram showing an example of use of the embodiment of the present invention, and FIG. 2 is a block circuit diagram of the embodiment of the present invention. 1... Calibration device, 2... Analyzer, 3... Solenoid valve, 4... Calibration sample, 5... Measurement sample, 6... Amplifier, 7... A/D converter, 8... Digital input circuit , 9... input/output interface, 10...
...Microprocessor, 11...ROM, 12...
RAM.

Claims (1)

[Scope of claim for utility model registration] (1) Calibrating the analyzer by calculating the parallel shift and slope of the input characteristics based on the calibration values of the calibration sample connected to the analyzer and measured by the analyzer. A calibration device for an analyzer includes an amplifier that amplifies an analog input signal from the analyzer, an A/D converter that A/D converts the output signal of the amplifier, and a digital input circuit that outputs a predetermined digital signal. , an input/output interface that receives output signals from the digital input circuit and the A/D converter, and a ROM and RAM in which predetermined programs and data are stored.
a microprocessor mounted on the input/output interface, which receives output signals from the input/output interface, performs predetermined calculations, and outputs various control signals and calibrated measurement signals via the input/output interface; The program includes a first program for calculating the translational movement and the slope at the zero point and the span point, respectively, and a second program for calculating the parallel movement and the slope at the span and zero points, respectively. A calibration device for an analyzer, characterized in that the first program or the second program is selected by the digital signal. (2) The analyzer calibration device according to claim 1, wherein the digital input circuit is a changeover switch. (3) The analyzer calibration device according to claim 1, wherein the digital input circuit is a jumper provided on a printed board and whose connection can be switched at will.