JPH01180189A - Image pickup device - Google Patents

Image pickup device

Info

Publication number
JPH01180189A
JPH01180189A JP63004344A JP434488A JPH01180189A JP H01180189 A JPH01180189 A JP H01180189A JP 63004344 A JP63004344 A JP 63004344A JP 434488 A JP434488 A JP 434488A JP H01180189 A JPH01180189 A JP H01180189A
Authority
JP
Japan
Prior art keywords
value
area
evaluation value
exposure
exposure evaluation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP63004344A
Other languages
Japanese (ja)
Inventor
Toshinobu Haruki
春木 俊宣
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP63004344A priority Critical patent/JPH01180189A/en
Priority to AU28358/89A priority patent/AU607033B2/en
Priority to CA000588018A priority patent/CA1333821C/en
Priority to KR89000222A priority patent/KR970010207B1/en
Priority to EP89100476A priority patent/EP0326825B1/en
Priority to DE8989100476T priority patent/DE68905930T2/en
Publication of JPH01180189A publication Critical patent/JPH01180189A/en
Priority to US07/562,653 priority patent/US5079622A/en
Priority to US07/562,654 priority patent/US5036400A/en
Priority to US07/657,621 priority patent/US5065247A/en
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To suppress the effect of a faulty brightness part onto the entire pattern with respect to an object including partially the fault bright part and to obtain an image pickup signal with proper exposure by blocking the input to an arithmetic means of a relevant exposure evaluation circuit when an exposure evaluation value includes a value larger or smaller than the permissible range with respect to a reference value. CONSTITUTION:Arithmetic circuits 10a-10f as an evaluation value detection means of an image pickup device output a brightness level of an image pickup video signal subjected to A/D conversion 6 in plural separated sampling areas on the pattern by the switching means 8 as the exposure evaluation value for each area. The evaluation value is given to error discrimination means 11a-11f, it is compared with a reference value of a reference memory 16 to apply weighting in the permissible range due to the difference of the both. The sum of the evaluation values subject to weighting is obtained by a mean value calculation means 12 and an aperture mechanism and its variable gain amplifier 5 are controlled so that the output is made coincident with the value of the object memory 18 set in advance.

Description

【発明の詳細な説明】[Detailed description of the invention]

イ】 産業上の利用分野 本発明はビデオカメラ等のレンズ絞り機構を有する撮像
装置に関する。 1】従来の技術 ビデオカメラ等の撮像装置において、レンズ等の光学絞
り及び撮像映像信号レベルを増幅する一手アンプの増幅
率の制御にて為される露出−整に広く賞月されている。 ところがこの方法では、m面内に光源等の高輝度部を含
む場合や、背景が非常に暗い場合に、主要被与体が適切
な明るさを得られないという問題点があった。 この問題点を解決するために、多くの画面において主要
被写体は、その中央に置かれるということを利用した露
出補正法か提案されている。例えば、特開昭62−11
0369号公報(HO4NS/243)には、画面を中
央領域と周辺領域の2つに分割し、夫々の領域に2ける
撮像映像信号の信号レベルを評価値として検出し、鴫辺
領域の評価値に対して中央領域の評価値に重みを付けた
(極端な場合にはl : 0)上で両評価値の比に応じ
てレンズの絞り量及び撮像映像16号の増幅利得を制御
することにより、中央領域の露出決定に対する寄与を増
加させる技術が開示されている。 (/9 発明が解決しようと丁−る課題前記従来技術に
よると、画面全体の明るさの変化に対しては最適なオー
トアイリス動作が為されるが、例えば中央領域にのみ高
輝度部が入り込む場合や、周辺領域にのみ太陽等の極端
に高輝度な被写体が含まnる場合は、絞り量が増し、ゲ
インが低下して主要被写体の明るさが不十分になること
は避けられない。 に)課題を解決する九めの手段 本発明は、画面上に分割された複数11!lのサンプリ
ングエリアにおける個々の撮像映像信号の輝度信号レベ
ルを各エリア毎の露出評価値として出力する評価値検出
手段と、前記露出評価値の和を算出する演算手段と、該
演算手段出力が予め設定された目標値に一致する様に、
レンズの絞り量または前記撮像映像信号の増幅率を制御
する露出調整手段とを備え、lTi1I記露出評価値の
中に基準値に対して許容範囲以上大きいかあるいは小さ
いものが含まnる時に、該当する露出評価値の前記演算
手段への入力を阻止することを特徴とする。 (ホ)作用 本発明は上述の如く構成したので、光源等の特殊な被与
体を含む領域の輝度信号レベルの画面全体の露出決定に
対する寄与が抑止可能となる。 (へ)実施例 以下、9面に従い本発明の実施例について説明する。 81図は第1実施例の回路ブロック図である。 (1)αレンズ、(2)はメカ的な絞フ機’a<露出調
整手段)、(3)はC0D(固体撮像素子)にて構成さ
れる撮像デバイス、(4)はプリアンプである。 レンズ11)K入射される被写体からの入射光は、絞り
機構<21にてレンズの絞りが調整されて、その光電が
調整され九後に撮像デバイス(3)にて光電変換されて
撮像映像信号として出力される。 この撮像映像信号は水平及び垂直走査でシリアルに取り
出されてプリアンプ(41にて所定ゲインで増幅され穴
径に、後段の可変利得アンプ(B出調整手段)(5)、
A/D変換回路(6)及び同期分離回路タル値に変換し
、切換回路(8)にて選択され次項算回路に入力される
。 同期分離@J路(7)は撮像映像信号エフ垂直及び水平
同期信号を分離し、後段の切換制御回路(9)は、この
両同期信号及び撮像デバイス(3)の制御に用いられた
りaツク備考に基いて切換回路(9)の切換制御を為し
、第2図に示す様に分割されたサンプリングエリア(A
a)(Ab)・・・(Af)に対応して切換える。BI
]ち、エリア(Aa)内の撮像映像信号のA/D変換値
が積算回路C10&)に、同様にエリア(Ab)(Ac
)(Ad)(Ae)(Af)内のA/D変換値が夫々積
算回路(10b)(10e)(lod)(10e)(1
0f)に人力され積算される。尚、積算回路はいずれも
、新しいA/D変換値と後段のラッチ回路出力を加算す
る児算器と、この加算結果をラッチするラッチ回路にて
構成される。 こうして+II算口路(FF価値検出手段) (10&
)(10b )−(10f )にσ夫々エリア(Aa)
(Ab)・・・(Af)に対応するlフィールド分の撮
像映像信号の輝度信号レベルがディジタル値として保持
さnることになる。このディジタル値をテンプリングエ
リア毎の露出評価値と呼ぶ。尚、積算回路はいずれも垂
直同期借号にてリセットさ詐るため、常に1フイ一ルド
分について積算されることになる。 以上の積算結果は、夫々異常判別回路(重み付は軽減手
段)(lla)(llb)−(llf)に入力され、該
当するサンプリングエリア内に光源等の高輝度部、ある
いは深緑等の低輝度部の如き異常輝度部か存在するか否
かが判別され、存在する場合には後段の平均値算出回路
(演算手段)αつへの入力が阻止される。 この異常判別回路(lla)は、具体的にぽ第3図の様
に¥M度度量出口路13a)、比較囲路(14&ン、ゲ
ート回路(15a ) VCてil[されている。 積算回路(10a)からの露出評価値(L、a)は密度
算出回路(13a)にて対応するサンプリングエリア(
Aa)の面積C8&)にて密度(Da)ミLJL/SJ
Lを算出し、これを基準値メモリー〇61に予め記憶さ
れ九基準II (PJと比較し、両者の差が許容範囲内
にあれば、後段のゲート回路(15a〕を開状態とし、
許容範囲を越える、部ち、該当するサンプリングエリア
内にのみ光源等の高輝度部や、深緑等の低4度部等の異
常輝度部が存在する場合には、密度(Da)は基準値[
F]K比べ極端に大きいあるいは小さいために、ゲート
回路(15a)は閉状態となり、積算回路(101から
の露出評価値CL&)の通過は阻止される。尚、異常判
別回路(llb)(lie)・・・(llf)も異常判
別回路C1l&)と同様の構成である。但し、各サンプ
リングエリアの面積は夫々予め設定され、必ずしも同一
とは限らない。 平均値算出回路σ4は、ゲート回路(15&)(15b
)・・・を通過し7I21.4)−ンプリングエリア毎
の露出評価値の単位面積当りの平均値、部ち密度の平均
値を算出する。例えば、テンプリングエリア(Ac)に
のみ光源等の異常輝度部が存在する場合を考えると、異
常判別回路(lie)にて露出評価値(Sc)のみが阻
止され、平均値算出回路α4には露出評価値(LA)(
Lb)(Ld)(Le)(Lf)が入力され、これらの
露出評価11[の和(LX)を、異常判別回路にて異常
と判別されなかったサンプリングエリア(A a ) 
(A b )(Ad)(Ae)(Af)の面積の和(S
X)T割り算し比値を平均値(N1〕として算出する。 この平均値(N)は比較囲路aDに入力され、目標値メ
モリα&に予め記憶されている目漂値(Qと比較され、
両者の差に対応するエラー信号が可変利得アンプ(5)
及び駆IiJ囲賂σ3に入力される。 駆動回路α9はこのエラー信号に基いて、アイリスモー
タ等を駆動させて絞り機構(2)を動作させて絞!7t
t−調整して、平均値が目標値に一致する様に作動ぜし
め、また可変利得アンプ(5)はエラー信号に基いて平
均値が目標値に近ずく様にそのゲインが調整される。こ
うして一部のエリアに異常輝度部が存在する場合に、こ
の異常成分の影響を排徐して自動絞り(オートアイリス
)調整が実行可能となる。 次に第4図を参照にして第2実711h例について説明
する。尚、第1実施例と同一部分には同一符号を付して
説明を省略し、またサンプリングエリアの設定は第5図
の如く中央と周辺で5分割される。 切換回路(8)の前段までは第1実施例と同一であり、
切換制御回路(9)により、サンプリングエリア(Ag
)(Ah)(At)(Aj)(Ak)の夫々の露出評価
値(ムg)(Lh)(Ll)(Lj)(Lk)が積算回
路(10g)(10h)(10f)(10j)(10k
)!り出力さnる。次に密度算出回路■にて中央のサン
プリングエリア(Ag)の露出評価値(Lg)がエリア
(Ag)の面積(Sg)にて割り算されて、密度(Dg
)が算出され、更に比IIR回路のにて基準値メモリー
11Bの基準値0と比較されて、この比較結果に基りて
後段の切換回路!211の切換制御を為す。五−μち、
密度(Dg)が基準値[F]K対して許容範囲内にある
と、エリア(Ag)に異常輝度部は存在しないとして切
換回路12υの可1jJJWc片(215)に固定接点
(21b)ijt!IKgJ換わり、密度CDg)が比
較回路α力に入力され、目標f[(Qと比較されて、第
1実弯例と同様にこの比較結果がエラー信号としてオ−
ドアイリス動作に用いられる。 また密度(Dg)が基準値0に比べ端端に大きいあるい
は小さい場合には、切換1路+211は固定接点(21
cllllに切換わり、比較回路(17)Krs、平均
値算出回路fi3出力が入力される。 平均値算出回路Iりは、N1実施例の平均値算出回路α
シと同様に1積算回路(10h)(lot)(10j)
(10k)K積算さnたサンプリングエリア(Ah)(
Ai)(Aj)(Ak)の露出評価値(Lh)(Ll)
(Liン(L、k)の中で、異常判別回路(11h〕(
111〕(llj)(llk)を経て異常輝度部が含ま
れているエリアを除くものを入力とし、第1実施例と同
様に密度の平均l1l(N2)が算出される。 従。て、中央のサンプリングエリア(Ag)に異常輝度
部が存在しない場合には、このエリア(Ag)の露出評
価値(Lg)を優先し、存在する場合には周辺のエリア
の中の異常輝度部のないエリアの単位面積当りの評価値
の平均値がオートアイリス動作に用いられる。尚、比較
@U回路n以下のigJ作についてr!第1実施例と同
一である。 次に第6図を参照にして第3実施例について説明する。 尚、サンプリングエリアの設定方法は第2実施例と同一
であり、ま次第4図と同一部分には同一符号を付して説
明を省略する。 比較回路Ωの比較出力は、切換回路(重み付は軽減手段
)@■の切換制御を実行する。即ち、中央のサンプリン
グエリア(Ag)の露出評価値(Ll)がai * 1
11 (E’)に対して許容範囲外にある場合には、可
動接片(24&)(25J11)を固定接点(24b)
(25b)@に固定し、露出評価値(Lf)を平均値算
出回路t43に7i:接入力し、同時に他のテンプリン
グエリアの露出評価値(ムh〕(Li)(Lj)(Lk
)を、夫々積算L!!回路(10h)(101)(lo
j)(lok)エフ平均値算出回路りに入力して全エリ
アの単位面積当りの露出評価値の平均値(N3)が算出
されて、比較回路鼎にて目標値と比較される。 また、中央のサンプリングエリア(Ag)の露出評価値
(Lg)C)密度(Dg)が基準値0に対して許容範囲
内に存在すると判断される場合には可動接片(24&)
(25a)は固定接点(241(25C)flKW換わ
り、中央のサンプリングエリア(Ag)の評価値は重み
付は回路(至)にて重み付けが為され穴径に、平均値算
出回路Iに入力される。 重み付は回路■は1例えば入力されるディジタル値を2
倍して出力する掛算回路であり、従うて中央のテン1リ
ングエリア(Ag)に異常輝度部が存在しない場合には
、この中央を周辺よりも重視して重み付けを行い、異常
輝度部がエリア(Ag)内に存在する場合には、この中
央のサンプリングエリア(Ag)での露出評価11[(
ムg)によるオートアイリス動作に対する影響力を軽減
することが可能となる。尚、平均値算出回路りは第1実
施例の平均値算出回路σ2に対応し、以下の4収及び動
作は同一である。 次にjN71kを参照にして第4実施例について説明す
る。この第4実施例において、積算回路(lOg)・・
・(10k)K保持されている各サンプリングエリアの
露出評価値は全て平均値算出回路QK大入力れ、各サン
プリングエリアに対する単位面積当りの露出評価値の平
均[(Ml)が算出され、この平均値が基準値として比
較回路時に入力され、この比較回路時にて露出評価!1
1(Lg)のサンプリングエリア(Ag)の単位面積当
りの値、即ち密度(Dg)と比較され、この比較結果に
基いて後段の切換回路□□□の切換制御が為さnる。 即ち、v!!!度(Dg)が平均値(M1〕に対して許
容範囲内にある場合には、可動接片(38a)を固定接
点(38b)に固定して、第1目標値メモリー(至)K
予め記憶されている第1目標値(R1〕が比較回路C3
9に目標値として入力され、密度(Dg)が平均値(M
l)に比べて許容範囲を越えて大きい場合には、可動接
片(381を固定接点(38b)K切換え、第2目標値
メモリー缶に予め記憶されている第2目標値(R2〕が
比較回路(至)に入力され、密度(D3〕が平均値(M
1〕に比べて許容範囲を越えて小さい場合には、可ja
J接片(38a)を固定接点(38d)に隔換え、第3
目標値メモリーC(7]に予め記憶さnている第3目標
値(R3〕が比較回路(2)に入力さnる。尚、第1乃
至第3目標値(R1)(R2)(R3)にはR2<R1
<R3の関係が成り立つ。 また露出評価値(Lg)は重み付は回路図にて2倍され
て、他のサンプリングエリアの露出評価値(Lh)・・
・(Lk)と共に平均値算出回路53に入力され、各サ
ンプリングエリアにおける単位面積当りの露出評価値の
平均値
A] Field of Industrial Application The present invention relates to an imaging device such as a video camera having a lens diaphragm mechanism. 1. Prior Art In imaging devices such as video cameras, exposure adjustment, which is achieved by controlling the optical aperture of a lens or the like and the amplification factor of a one-handed amplifier that amplifies the level of the captured video signal, has been widely praised. However, this method has a problem in that the main donor cannot obtain appropriate brightness when the m-plane includes a high-luminance area such as a light source or when the background is very dark. To solve this problem, an exposure compensation method has been proposed that takes advantage of the fact that the main subject is placed in the center of many screens. For example, JP-A-62-11
Publication No. 0369 (HO4NS/243) discloses that the screen is divided into two areas, a central area and a peripheral area, and the signal level of the captured video signal in each area is detected as an evaluation value, and the evaluation value of the edge area is calculated. By weighting the evaluation value of the central region (l: 0 in the extreme case) and controlling the aperture amount of the lens and the amplification gain of the captured image No. 16 according to the ratio of both evaluation values. , a technique is disclosed to increase the contribution of the central region to the exposure decision. (/9 Problems to be Solved by the Invention According to the above-mentioned prior art, optimal auto-iris operation is performed in response to changes in the brightness of the entire screen, but for example, when a high-brightness part enters only the central area. Or, if only the peripheral area contains an extremely bright subject such as the sun, it is inevitable that the aperture will increase, the gain will decrease, and the main subject will not be bright enough. Ninth Means for Solving the Problem The present invention provides a plurality of 11 screens divided on the screen! evaluation value detection means for outputting the luminance signal level of each imaged video signal in the sampling areas of l as an exposure evaluation value for each area; a calculation means for calculating the sum of the exposure evaluation values; In order to match the set target value,
and an exposure adjustment means for controlling the aperture amount of the lens or the amplification factor of the captured image signal, and when the exposure evaluation values include those that are larger than or smaller than the allowable range with respect to the reference value, it is applicable. The method is characterized in that input of the exposure evaluation value to the calculation means is inhibited. (E) Function Since the present invention is configured as described above, it is possible to suppress the contribution of the luminance signal level of the area including a special object such as a light source to the exposure determination of the entire screen. (f) Examples Examples of the present invention will be described below according to the ninth page. FIG. 81 is a circuit block diagram of the first embodiment. (1) an α lens, (2) a mechanical diaphragm 'a<exposure adjustment means), (3) an imaging device composed of a C0D (solid-state image sensor), and (4) a preamplifier. Lens 11)KThe incident light from the subject is adjusted by the aperture mechanism <21, the photoelectricity of which is adjusted, and then photoelectrically converted by the imaging device (3) to form an imaged video signal. Output. This imaged video signal is serially taken out by horizontal and vertical scanning, amplified with a predetermined gain by a preamplifier (41), and then applied to a variable gain amplifier (B output adjustment means) (5) at the subsequent stage.
The A/D conversion circuit (6) and the synchronization separation circuit convert it into a total value, which is selected by the switching circuit (8) and input to the next calculation circuit. The synchronization separation @J path (7) separates the vertical and horizontal synchronization signals from the imaging video signal, and the subsequent switching control circuit (9) is used to control both synchronization signals and the imaging device (3). The switching circuit (9) is controlled based on the notes, and the sampling area (A) is divided as shown in Figure 2.
a) Switch corresponding to (Ab)...(Af). B.I.
] Then, the A/D conversion value of the imaged video signal in area (Aa) is sent to the integration circuit C10 &) in the same way as area (Ab) (Ac
) (Ad) (Ae) (Af) are integrated into the integration circuits (10b) (10e) (lod) (10e) (1
0f) and integrated manually. It should be noted that each of the integration circuits is composed of an arithmetic unit that adds a new A/D conversion value and the output of a latch circuit at the subsequent stage, and a latch circuit that latches the addition result. In this way, +II calculation route (FF value detection means) (10&
) (10b) - (10f) respectively σ area (Aa)
The luminance signal level of the captured video signal for l fields corresponding to (Ab) . . . (Af) is held as a digital value. This digital value is called an exposure evaluation value for each template area. Incidentally, since all of the integration circuits are reset at the vertical synchronization signal, the integration is always performed for one field. The above integration results are input to the respective abnormality discrimination circuits (weighting is a reduction means) (lla) (llb) - (llf), and if there is a high brightness area such as a light source or a low brightness area such as a deep green area within the corresponding sampling area. It is determined whether or not there is an abnormal brightness part such as the part, and if it exists, the input to the subsequent average value calculation circuit (calculation means) α is blocked. Specifically, as shown in Figure 3, this abnormality discrimination circuit (lla) is comprised of a measurement output path 13a), a comparison circuit (14 and 14), a gate circuit (15a), and a VC circuit. The exposure evaluation value (L, a) from (10a) is calculated by the density calculation circuit (13a) in the corresponding sampling area (
Density (Da) at area C8&) of Aa) LJL/SJ
Calculate L, store this in advance in the reference value memory 〇61, compare it with the nine criteria II (PJ, and if the difference between the two is within the allowable range, open the subsequent gate circuit (15a),
If the permissible range is exceeded, or if there are abnormal brightness areas such as high brightness areas such as light sources or low 4 degree areas such as deep green areas only within the corresponding sampling area, the density (Da) will be set to the standard value [
F] Since it is extremely large or small compared to K, the gate circuit (15a) is closed, and passage of the exposure evaluation value CL& from the integration circuit (101) is blocked. The abnormality determination circuits (llb), (lie), . . . (llf) also have the same configuration as the abnormality determination circuit C1l&). However, the area of each sampling area is set in advance and is not necessarily the same. The average value calculation circuit σ4 is a gate circuit (15&) (15b
)... 7I21.4) - Calculate the average value per unit area of the exposure evaluation value for each sampling area and the average value of the part density. For example, if we consider a case where there is an abnormal brightness part such as a light source only in the Templing area (Ac), only the exposure evaluation value (Sc) is blocked in the abnormality determination circuit (lie), and the average value calculation circuit α4 is Exposure evaluation value (LA) (
Lb) (Ld) (Le) (Lf) are input, and the sum (LX) of these exposure evaluations 11 is determined as the sampling area (A a ) that was not determined to be abnormal by the abnormality determination circuit.
The sum of the areas of (A b ) (Ad) (Ae) (Af) (S
X) T is divided and the ratio value is calculated as an average value (N1). This average value (N) is input into the comparison circuit aD and compared with the target value (Q) stored in advance in the target value memory α&. ,
The error signal corresponding to the difference between the two is a variable gain amplifier (5)
and is input to the input value σ3. Based on this error signal, the drive circuit α9 drives the iris motor etc. to operate the aperture mechanism (2) and aperture! 7t
The variable gain amplifier (5) is operated based on the error signal so that the average value approaches the target value. In this way, when an abnormal brightness portion exists in some area, automatic iris adjustment can be performed while eliminating the influence of this abnormal component. Next, a second example 711h will be explained with reference to FIG. Incidentally, the same parts as in the first embodiment are given the same reference numerals and the explanation thereof will be omitted, and the sampling area is divided into five parts at the center and the periphery as shown in FIG. The stage up to the stage before the switching circuit (8) is the same as the first embodiment,
The switching control circuit (9) controls the sampling area (Ag
) (Ah) (At) (Aj) (Ak) The respective exposure evaluation values (mug) (Lh) (Ll) (Lj) (Lk) are integrated into the integration circuit (10g) (10h) (10f) (10j) (10k
)! Output. Next, the exposure evaluation value (Lg) of the central sampling area (Ag) is divided by the area (Sg) of the area (Ag) in the density calculation circuit (■), and the density (Dg) is divided by the area (Sg) of the area (Ag).
) is calculated and further compared with the reference value 0 of the reference value memory 11B in the ratio IIR circuit, and based on the comparison result, the subsequent switching circuit! 211 switching control is performed. 5-μchi,
If the density (Dg) is within the allowable range with respect to the reference value [F]K, it is assumed that no abnormal brightness portion exists in the area (Ag), and the fixed contact (21b) ijt! Instead of IKgJ, the density CDg) is input to the comparator circuit α, and is compared with the target f[(Q), and as in the first practical example, this comparison result is output as an error signal.
Used for door iris operation. In addition, if the density (Dg) is larger or smaller at the end than the reference value 0, the switching path 1 +211 is connected to the fixed contact (21
cllll, and the comparison circuit (17) Krs and the output of the average value calculation circuit fi3 are input. The average value calculation circuit I is the average value calculation circuit α of the N1 embodiment.
1 integration circuit (10h) (lot) (10j)
(10k) K integrated sampling area (Ah) (
Exposure evaluation value (Lh) (Ll) of Ai) (Aj) (Ak)
(In the Lin (L, k), the abnormality determination circuit (11h)
111](llj)(llk) excluding the area containing the abnormal brightness portion, and calculates the average density l1l(N2) in the same manner as in the first embodiment. Follow. If there is no abnormal brightness area in the central sampling area (Ag), priority is given to the exposure evaluation value (Lg) of this area (Ag), and if there is an abnormal brightness area in the surrounding area, priority is given to the exposure evaluation value (Lg). The average value of the evaluation values per unit area of the area without is used for auto iris operation. In addition, regarding igJ works below comparison @U circuit n! This is the same as the first embodiment. Next, a third embodiment will be described with reference to FIG. The method of setting the sampling area is the same as in the second embodiment, and the same parts as in FIG. The comparison output of the comparison circuit Ω executes the switching control of the switching circuit (weighting is a reducing means) @■. That is, the exposure evaluation value (Ll) of the central sampling area (Ag) is ai * 1
11 (E'), move the movable contact (24&) (25J11) to the fixed contact (24b).
(25b) Fix it to @, input the exposure evaluation value (Lf) to the average value calculation circuit t43, and at the same time input the exposure evaluation value (muh) (Li) (Lj) (Lk) of other Templing areas.
), respectively, are integrated L! ! Circuit (10h) (101) (lo
j) (lok) The average value (N3) of the exposure evaluation values per unit area of the entire area is calculated by inputting it to the F average value calculation circuit, and is compared with the target value in the comparison circuit. In addition, if it is determined that the exposure evaluation value (Lg) C) density (Dg) of the central sampling area (Ag) is within the allowable range with respect to the reference value 0, the movable contact piece (24&)
(25a) is a fixed contact (241 (25C) flKW), and the evaluation value of the central sampling area (Ag) is weighted in the circuit (to) and input into the hole diameter to the average value calculation circuit I. For weighting, the circuit ■ is 1, for example, the input digital value is 2
It is a multiplication circuit that multiplies and outputs the multiplication signal. Therefore, if there is no abnormal brightness area in the central ten-ring area (Ag), weighting is performed with more emphasis on this center than on the periphery, and the abnormal brightness area is (Ag), exposure evaluation 11 [(
It is possible to reduce the influence of the automatic iris operation caused by the automatic iris operation. Note that the average value calculation circuit corresponds to the average value calculation circuit σ2 of the first embodiment, and the following four functions and operations are the same. Next, a fourth embodiment will be described with reference to jN71k. In this fourth embodiment, the integration circuit (lOg)...
・The exposure evaluation values of each sampling area held in (10k)K are all input to the average value calculation circuit QK, and the average exposure evaluation value per unit area for each sampling area [(Ml) is calculated, and this average The value is input as a reference value during the comparison circuit, and the exposure is evaluated using this comparison circuit! 1
1 (Lg) per unit area of the sampling area (Ag), that is, the density (Dg), and based on the comparison result, switching control of the subsequent switching circuit □□□ is performed. That is, v! ! ! If the degree (Dg) is within the allowable range with respect to the average value (M1), the movable contact piece (38a) is fixed to the fixed contact (38b) and the first target value memory (to) K
The first target value (R1) stored in advance is the comparator circuit C3.
9 as the target value, and the density (Dg) is set to the average value (M
l) If the value exceeds the allowable range, the movable contact (381) is switched to the fixed contact (38b), and the second target value (R2) stored in advance in the second target value memory can is compared. The density (D3) is input to the circuit (to) and the density (D3) is the average value (M
1], it is possible if it is smaller than the allowable range.
Replace the J contact piece (38a) with a fixed contact (38d), and connect the third
The third target value (R3) previously stored in the target value memory C (7) is input to the comparator circuit (2). ) has R2<R1
<R3 holds true. Also, the weighting of the exposure evaluation value (Lg) is doubled in the circuit diagram, and the exposure evaluation value (Lh) of other sampling areas...
- The average value of the exposure evaluation values per unit area in each sampling area is input together with (Lk) to the average value calculation circuit 53

【M2】が算出され、比較回路(2)にて前述の
第1乃至M3目標僅のいずれかと比較される。 従うて、この第4実施例では前述の実施例で常に固定さ
れていた基準値0、目標値(Qが状況に応じて変化する
ことになる。部ち、異常輝度部が画面上に存在しない場
合には、比較ロ路ロ出力は密ff(Dg)が平均1直(
M1〕に対して許容範囲にあるとして第1目標値メモリ
ー(R1〕を選択し、一方平均値算出回路63に中央の
サンプリングエリア(Ag)の1出評価値(Lg)のみ
を重み付けした平均値(M2)を出力し、比較回路(3
9は両者を比較してエラー信号を発してオートアイリス
動作を実行する。例えば、この状態よりIm面全体の光
量が増加すれば、比較回路(至)の両入力は共に路等し
く増加するため、切換回路C!8框第1目標値(R1〕
を選択するが、平均+1(M2)は増加するため1Ml
目標値(R1〕と平均値(M2)の差、即ちエラー信号
は大きくなり、絞り量が大きくなる。 次に中央のサンプリングエリア(ムg)にのみ深緑等の
極端な低輝度部が存在する場合に、平均@[(M2 )
に比べ密度(Dg)の減少が著しく、許容範囲金越える
まで減少すると切換回路Ωは県2目標値(R2)を選択
する。一方平均([L(M2)は減少するが、纂2目標
値(R2)が第1目標値(R1)に比べ小さく設定され
ている几め、エラー信号が大きく増加することはない。 同様に中央のサンプリングエリア(Ag)にのみ太陽等
の極端な高輝度部が存在する場合に、平均値(Ml)に
比べ密度CDI)の増加が著しく、許容範囲を越えるま
で増加すると、切換回路間は第3目標値(R3)を選択
する。一方、平均値(M2)は増加するが、第3目標値
(R3〕が第1目標値(R1)K比べ大きく設定されて
いるため、エラー信号が大きく増加することはない。こ
の様に中央のサンプリングエリア(Ag)にのみ異常輝
度部が存在しても、これに応じて目標値が変化してエラ
ー信号に大きな変化は生じることなく、異常輝度部によ
る影響が抑止される。尚、本実施例の比較回路C3!]
は第1実施例の比較回路03に対応し、以下の構成及び
動作は同一である。 上述の如<、ml実施例では異常輝度部が存在するエリ
アと不在のエリアに対して夫々の露出評価値に0:1の
重み付け、 !11ち存在するエリアは全く無視する方
法が採られ、第2実施例については更に中央のエリアを
優先している。゛また第3実施flJについては、中央
のエリアに異常輝度部が有るか否かく応じて中央のエリ
アの露出評価1直を周辺のエリアに対して重み付けを行
り方法が採られ。 第4実施例では中央のエリアに異常輝度部が有るか否か
に応じて、目標値を変化させることにより鎖的に中央エ
リアの露出評価値の重み付は量を変化させていることに
なる。 尚、本実施例の回路ブロックの各に!If′F:をマイ
クロコンピュータを用いてソフトウェア的に処理可能で
あることは言うまでもない。更に前述の実施例では基準
値あるいは目標値との比較に際しては、サンプリングエ
リアの単位面積当りの露出評価値を用いているが、基準
値及び目−億として単位面積当りの量を設定しておき、
該当するナングリング土リアの面積との積を!接露出評
価値と比較してもよい− (ト)発明の効果 上述の如く本発明によれば、部分的に異常輝度部を含む
蓋写体く対して、異常輝度部の全体の画面の露出に対す
る影響を極力抑えて、逼切な露出が為された撮像映像信
号が得られる。
[M2] is calculated and compared with any one of the first to M3 targets described above in a comparison circuit (2). Therefore, in this fourth embodiment, the reference value 0 and the target value (Q), which were always fixed in the previous embodiments, change depending on the situation.In addition, there are no abnormal brightness areas on the screen. In this case, the comparison low and low outputs have an average density ff (Dg) of 1 shift (
The first target value memory (R1) is selected as being within the allowable range for M1], while the average value calculation circuit 63 calculates a weighted average value of only the first evaluation value (Lg) of the central sampling area (Ag). (M2) and comparator circuit (3
9 compares the two, issues an error signal, and executes an auto-iris operation. For example, if the light intensity of the entire Im surface increases from this state, both inputs of the comparison circuit (to) will increase by the same amount, so that the switching circuit C! 8th stile 1st target value (R1)
However, since the average +1 (M2) increases, 1Ml
The difference between the target value (R1) and the average value (M2), that is, the error signal, increases, and the aperture amount increases.Next, there are extremely low brightness areas such as deep green only in the central sampling area (mug). If the average @[(M2)
When the density (Dg) decreases significantly compared to , and exceeds the allowable range, the switching circuit Ω selects the prefecture 2 target value (R2). On the other hand, although the average ([L(M2)) decreases, since the second target value (R2) is set smaller than the first target value (R1), the error signal does not increase significantly.Similarly, When an extremely bright area such as the sun exists only in the central sampling area (Ag), if the density CDI) increases significantly compared to the average value (Ml) and exceeds the allowable range, the switching circuit will Select the third target value (R3). On the other hand, although the average value (M2) increases, the error signal does not increase significantly because the third target value (R3) is set larger than the first target value (R1). Even if there is an abnormal brightness area only in the sampling area (Ag), the target value will change accordingly, the error signal will not change significantly, and the influence of the abnormal brightness area will be suppressed. Example comparison circuit C3!]
corresponds to the comparison circuit 03 of the first embodiment, and the following configuration and operation are the same. As described above, in the ml example, the exposure evaluation values are weighted 0:1 for areas where abnormal brightness parts exist and areas where there are no abnormal brightness parts. A method is adopted in which the 11 existing areas are completely ignored, and in the second embodiment, priority is given to the central area. Furthermore, in the third implementation flJ, a method is adopted in which the first exposure evaluation of the central area is weighted with respect to the surrounding areas depending on whether or not there is an abnormal brightness portion in the central area. In the fourth embodiment, by changing the target value depending on whether or not there is an abnormal brightness part in the central area, the amount of weighting of the exposure evaluation value in the central area is changed in a chain manner. . Furthermore, each of the circuit blocks in this example! It goes without saying that If'F: can be processed by software using a microcomputer. Furthermore, in the above-mentioned embodiment, when comparing with the reference value or target value, the exposure evaluation value per unit area of the sampling area is used, but the amount per unit area is set as the reference value and target value. ,
Multiply the area of the corresponding Nangling soil! It may also be compared with the direct exposure evaluation value. It is possible to obtain a captured video signal with strict exposure while suppressing the influence on the image as much as possible.

【図面の簡単な説明】[Brief explanation of the drawing]

図1は全て本発明に係り、帛1図は渠l実施例のロ路ブ
ロック図、第2図・藁5図はサンプリングエリアの分割
図、第3図は第1図の要部回路プロック図、第4図はN
2実施例の回路ブロック図、第6因は第3実施例の回路
ブロック図、第7図は第4実施例の回路ブロック図であ
る。
Figure 1 is all related to the present invention, Figure 1 is a block diagram of the conduit embodiment, Figure 2 and Figure 5 are division diagrams of the sampling area, and Figure 3 is a block diagram of the main circuit of Figure 1. , Figure 4 is N
The circuit block diagram of the second embodiment, the sixth factor is a circuit block diagram of the third embodiment, and FIG. 7 is the circuit block diagram of the fourth embodiment.

Claims (4)

【特許請求の範囲】[Claims] (1)画面上に分割された複数個のサンプリングエリア
における個々の撮像映像信号の輝度信号レベルを各エリ
ア毎の露出評価値として出力する評価値検出手段と、 前記露出評価値の和を算出する演算手段と、該演算手段
出力が予め設定された目標値に一致する様に、レンズの
絞り量または前記撮像映像信号の増幅率を制御する露出
調整手段とを備え、前記露出評価値の中に基準値に対し
て許容範囲以上大きいかあるいは小さいものが含まれる
時に、該当する露出評価値の前記演算手段への入力を阻
止することを特徴とする撮像装置。
(1) Evaluation value detection means that outputs the brightness signal level of each captured video signal in a plurality of sampling areas divided on the screen as an exposure evaluation value for each area, and calculating the sum of the exposure evaluation values. a calculation means; and an exposure adjustment means for controlling the aperture amount of the lens or the amplification factor of the captured video signal so that the output of the calculation means coincides with a preset target value; An imaging apparatus characterized in that when an exposure evaluation value that is larger than or smaller than a reference value by more than an allowable range is included, input of the corresponding exposure evaluation value to the calculation means is blocked.
(2)前記サンプリングエリアの中で画面の中央におけ
るエリアの露出評価値が基準値に対して許容範囲内にあ
る場合には、前記演算手段出力に代えてこの露出評価値
のみを前記露出調整手段に入力することを特徴とする特
許請求の範囲第1項記載の撮像装置。
(2) If the exposure evaluation value of the area at the center of the screen in the sampling area is within the allowable range with respect to the reference value, only this exposure evaluation value is used by the exposure adjustment means instead of the output of the calculation means. 2. The imaging apparatus according to claim 1, wherein the image capturing apparatus inputs the information to the user.
(3)前記サンプリングエリアの中で画面の中央におけ
るエリアの露出評価値が基準値に対して許容範囲内にあ
る場合には、この露出評価値にのみ重み付けを行うこと
を特徴とする特許請求の範囲第1項記載の撮像装置。
(3) If the exposure evaluation value of the area at the center of the screen in the sampling area is within an allowable range with respect to a reference value, weighting is performed only on this exposure evaluation value. The imaging device according to scope 1.
(4)前記サンプリングエリアの中で画面の中央におけ
るエリアの露出評価値の基準値に対する関係に応じて、
前記目標値を変化させることを特徴とする特許請求の範
囲第1項記載の撮像装置。
(4) Depending on the relationship between the exposure evaluation value of the area at the center of the screen in the sampling area and the reference value,
The imaging device according to claim 1, wherein the target value is changed.
JP63004344A 1988-01-12 1988-01-12 Image pickup device Expired - Lifetime JPH01180189A (en)

Priority Applications (9)

Application Number Priority Date Filing Date Title
JP63004344A JPH01180189A (en) 1988-01-12 1988-01-12 Image pickup device
AU28358/89A AU607033B2 (en) 1988-01-12 1989-01-10 Auto iris/gamma correction apparatus for making automatic exposure adjustment and/or automatic gamma correction in response to video signal and image sensing apparatus comprising such auto iris/gamma correction apparatus
CA000588018A CA1333821C (en) 1988-01-12 1989-01-11 Auto iris/gamma correction apparatus for making automatic exposure adjustment and/or automatic gamma correction in response to video signal and image sensing apparatus comprising such auto iris/gamma correction apparatus
KR89000222A KR970010207B1 (en) 1988-01-12 1989-01-11 Auto / ris / gamma correction apparatus in response to a video signal
EP89100476A EP0326825B1 (en) 1988-01-12 1989-01-12 Auto iris/gamma correction apparatus in response to a video signal
DE8989100476T DE68905930T2 (en) 1988-01-12 1989-01-12 AUTOMATIC IRIS DIRECTION AND GAMMA CORRECTION DEVICE DEPENDING ON A VIDEO SIGNAL.
US07/562,653 US5079622A (en) 1988-01-12 1990-08-03 Auto iris/gamma correction apparatus for making automatic exposure adjustment and/or automatic gamma correction in response to video signal and image sensing apparatus comprising such auto iris/gamma correction apparatus
US07/562,654 US5036400A (en) 1988-01-12 1990-08-03 Automatic iris correction apparatus for use in automatically adjusting exposure in response to a video signal
US07/657,621 US5065247A (en) 1988-01-12 1991-02-02 Automatic iris correction apparatus for use in automatically adjusting exposure in response to a video signal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63004344A JPH01180189A (en) 1988-01-12 1988-01-12 Image pickup device

Publications (1)

Publication Number Publication Date
JPH01180189A true JPH01180189A (en) 1989-07-18

Family

ID=11581811

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63004344A Expired - Lifetime JPH01180189A (en) 1988-01-12 1988-01-12 Image pickup device

Country Status (1)

Country Link
JP (1) JPH01180189A (en)

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