JPH01172808U - - Google Patents
Info
- Publication number
- JPH01172808U JPH01172808U JP6886788U JP6886788U JPH01172808U JP H01172808 U JPH01172808 U JP H01172808U JP 6886788 U JP6886788 U JP 6886788U JP 6886788 U JP6886788 U JP 6886788U JP H01172808 U JPH01172808 U JP H01172808U
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- integrator circuit
- rays
- output
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 3
- 230000010354 integration Effects 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6886788U JPH01172808U (enExample) | 1988-05-25 | 1988-05-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6886788U JPH01172808U (enExample) | 1988-05-25 | 1988-05-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01172808U true JPH01172808U (enExample) | 1989-12-07 |
Family
ID=31294162
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6886788U Pending JPH01172808U (enExample) | 1988-05-25 | 1988-05-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01172808U (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006177841A (ja) * | 2004-12-24 | 2006-07-06 | National Institute Of Advanced Industrial & Technology | 非破壊検査装置および方法 |
-
1988
- 1988-05-25 JP JP6886788U patent/JPH01172808U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006177841A (ja) * | 2004-12-24 | 2006-07-06 | National Institute Of Advanced Industrial & Technology | 非破壊検査装置および方法 |