JPH01172808U - - Google Patents

Info

Publication number
JPH01172808U
JPH01172808U JP6886788U JP6886788U JPH01172808U JP H01172808 U JPH01172808 U JP H01172808U JP 6886788 U JP6886788 U JP 6886788U JP 6886788 U JP6886788 U JP 6886788U JP H01172808 U JPH01172808 U JP H01172808U
Authority
JP
Japan
Prior art keywords
circuit
integrator circuit
rays
output
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6886788U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6886788U priority Critical patent/JPH01172808U/ja
Publication of JPH01172808U publication Critical patent/JPH01172808U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP6886788U 1988-05-25 1988-05-25 Pending JPH01172808U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6886788U JPH01172808U (enrdf_load_stackoverflow) 1988-05-25 1988-05-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6886788U JPH01172808U (enrdf_load_stackoverflow) 1988-05-25 1988-05-25

Publications (1)

Publication Number Publication Date
JPH01172808U true JPH01172808U (enrdf_load_stackoverflow) 1989-12-07

Family

ID=31294162

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6886788U Pending JPH01172808U (enrdf_load_stackoverflow) 1988-05-25 1988-05-25

Country Status (1)

Country Link
JP (1) JPH01172808U (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006177841A (ja) * 2004-12-24 2006-07-06 National Institute Of Advanced Industrial & Technology 非破壊検査装置および方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006177841A (ja) * 2004-12-24 2006-07-06 National Institute Of Advanced Industrial & Technology 非破壊検査装置および方法

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