JPH01169120U - - Google Patents
Info
- Publication number
- JPH01169120U JPH01169120U JP6436588U JP6436588U JPH01169120U JP H01169120 U JPH01169120 U JP H01169120U JP 6436588 U JP6436588 U JP 6436588U JP 6436588 U JP6436588 U JP 6436588U JP H01169120 U JPH01169120 U JP H01169120U
- Authority
- JP
- Japan
- Prior art keywords
- peripheral side
- side wall
- thick plate
- transparent
- plate glass
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000005357 flat glass Substances 0.000 claims description 4
- 230000002093 peripheral effect Effects 0.000 claims 4
- 239000011521 glass Substances 0.000 claims 2
- 238000005034 decoration Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Purses, Travelling Bags, Baskets, Or Suitcases (AREA)
- Closures For Containers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6436588U JPH01169120U (es) | 1988-05-16 | 1988-05-16 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6436588U JPH01169120U (es) | 1988-05-16 | 1988-05-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01169120U true JPH01169120U (es) | 1989-11-29 |
Family
ID=31289834
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6436588U Pending JPH01169120U (es) | 1988-05-16 | 1988-05-16 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01169120U (es) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6035026B2 (ja) * | 1979-09-08 | 1985-08-12 | 株式会社 堀場製作所 | 超低濃度イオン測定装置の校正方法 |
-
1988
- 1988-05-16 JP JP6436588U patent/JPH01169120U/ja active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6035026B2 (ja) * | 1979-09-08 | 1985-08-12 | 株式会社 堀場製作所 | 超低濃度イオン測定装置の校正方法 |