JPH01166151A - Test system - Google Patents

Abstract

PURPOSE:To surely grasp a situation when plural input output devices generate troubles simultaneously or an input output device to generate a trouble obstructs the actions of the other normal input output devices by comparing the history of the actions of the respective input output devices at the time of executing an input output instruction in parallel. CONSTITUTION:A tested device realizes an action in accordance with the input output instruction by a microprogram control. That is to say, when a testing device 1 issues the input output instruction, an interface control part 4 detects this, an interruption to a microprogram 5 is generated only to the specific tested device and only the tested device to which the interruption is generated executes the decoding and the execution of the input output instruction by the microprogram control. Concerning the input output instruction to execute the priority selection of the interruption, a means to generate the interruption to the microprograms of all the tested devices is provided and all the tested devices trace the input output instruction by the microprograms.

Description

[Detailed Description of the Invention] [Summary] The present invention relates to a testing method for input/output devices in an information processing device, and is a test method for determining whether the operation of the input/output device to be tested is influenced by the operation of other input/output devices. In an information processing device in which multiple input/output devices are connected to the main unit directly or via an input/output control device, each input/output device and input/output In addition to providing a means for setting the control device to a test state, when an input/output command is issued from the main unit while each input/output device and input/output control device is in the test state, the input/output targeted by the input/output command is The configuration is such that an input/output device or an input/output control device other than the device is also provided with means for recording the history of its own operation in response to the input/output command.

[Field of Industrial Application] The present invention relates to a testing method for input/output devices in an information processing device in which a plurality of input/output devices are connected directly or via an input/output control device, and in particular, the present invention relates to a method for testing input/output devices in an information processing device in which a plurality of input/output devices are connected directly or via an input/output control device, and in particular, for testing, A test that can confirm whether, when an input/output command is issued to a device, the execution of the input/output command or the operation of the relevant input/output device is affected by the operation of other input/output devices. Regarding the method.

[Prior Art] FIG. 3 is a diagram showing an example of the configuration of an information processing system, in which 50 is a CPU, 51 is a memory, and 52 and 53 are input/output control devices (abbreviated as IOC in the figure). , 54~
59 represents an input/output device (abbreviated as Ilo in the figure), and 60 represents a bus.

In the figure, when testing the functions of each part of the system, a test system is configured by loading a test program into a memory 51, and the test is performed by a CPU 50 executing the test program.

When testing input/output devices or input/output control devices,
Issue input/output commands to the input/output device to be tested, trace the operation of the input/output device, and use the results to determine
Make a pass/fail judgment.

Such a test program is also used when a device malfunctions to find the cause of the malfunction and the location of the malfunction.

[Problems to be Solved by the Invention] In the conventional test system as described above, the main body system device that executes the test and the devices under test such as input/output devices are subject to failures such as internal state tracing functions for each device. It has an analysis means, and when a failure occurs in any of the devices, the failure location is identified and repaired by analyzing the operation history of each part when the test program is executed.

Incidentally, in a normal configuration as shown in FIG. 3, each input/output device or input/output control device is connected to a common bus 60. When the CPU 50 issues an input/output command to one of the input/output devices, address information is sent onto the bus 60, and the corresponding input/output device responds to this, thereby maintaining the logical connection and input/output data. will be given and received.

In this type of control, sometimes even though the input/output device under test is not experiencing any particular fault, other input/output devices may be faulty and emit false signals, making it appear as if there is a fault. In some cases, failures in multiple devices overlap, making it extremely difficult to investigate the cause.

In view of these conventional problems, it is an object of the present invention to provide means that can easily perform failure analysis of input/output devices, particularly in an information processing system having a plurality of input/output devices.

[Means for Solving the Problems] According to the present invention, the above objects are achieved by the means described in the claims. That is, the present invention provides means for setting each input/output device and input/output control device to a test state in an information processing device in which a plurality of input/output devices are connected to a main unit directly or via an input/output control device. In addition, if an input/output command is issued from the main unit while each input/output device or input/output control device is in a test state, the input/output device or input/output control device other than the input/output device targeted by the input/output command The test system is also equipped with a means for recording the history of its own operations in response to input/output commands.

[Function] According to the means of the present invention, when an input/output device and an input/output device are in a test state (hereinafter also referred to as test mode), when an input/output instruction in a test program is executed, the input/output device is Input/output devices other than the input/output device at the address specified by the output command also start recording their own operating states.

Therefore, while the operation history of each input/output device when an input/output instruction is executed is recorded in parallel, by comparing these, it is possible to check whether, for example, the input/output device targeted by the input/output instruction is operating correctly. It is possible to easily determine whether or not the input/output device is being used, whether it is affecting the operation of other input/output devices, and whether or not other input/output devices are affecting the device that is supposed to perform input/output operations. can be investigated.

[Embodiment] FIG. 1 is a diagram showing an example of the configuration of an embodiment of the present invention, in which 1 represents a test device, 2 represents a bus, and 3-1 to 3-n represent devices under test.

Figure 2 shows the internal configuration of the device under test in the example (here, the first
The inside of the device under test 3-1 in the figure is shown. 1.2.3-1 is the same as FIG. 1, 4 is an interface control section, 5 is a microprogram, 6 is a microprocessor, and 7 is an internal bus.

A test device 1 in FIG. 1 represents a common control section within one device.

In the figure, test equipment 1 sets the equipment under test to test mode in order to test the equipment under test 3-1 to 3-n, issues input/output commands defined to the equipment under test, and Start it and check its working status.

There are cases in which input/output commands are valid only for a specific device under test, and cases in which they are valid for all devices under test. Commands that are valid for all devices under test are those for selecting a specific device under test from a plurality of devices under test, such as an operation for prioritizing interrupts from the device under test.

FIG. 2 shows an example of means for all the devices under test to collect traces of input/output commands that are valid for all the devices under test.

In this example, the device under test realizes operations according to input/output commands through microprogram control. That is, when the test equipment issues an input/output command, the interface control unit 4 detects this, and an interrupt is generated to the microprogram only for a specific device under test, and only the device under test where the interrupt has occurred executes the microprogram. Deciphers and executes input/output instructions under program control.

In this embodiment, a means is provided to generate an interrupt to the microprograms of all the devices under test for the input/output commands that perform the priority selection of the interrupts, and the microprograms allow all the devices under test to execute the input/output commands. trace.

The method for changing interrupts by the interface control unit can be either limited to the test or not limited to the test.

[Effects of the Invention] As explained above, according to the present invention, input/output commands can be executed in an information processing device in which a plurality of input/output devices or input/output control devices are connected to a main system device via a common bus. It is possible to compare the history of the operation of each input/output device in parallel when a failure occurs, so if multiple input/output devices fail at the same time, or if a failed input/output device is connected to another normal input/output device. It is possible to reliably and easily grasp the situation in which the operation of the output device is obstructed.

Therefore, there is an advantage that the cause of the failure can be quickly discovered.

[BRIEF DESCRIPTION OF THE DRAWINGS] FIG. 1 is a diagram showing an example of the configuration of an embodiment of the present invention, FIG. 2 is a diagram showing the internal configuration of the device under test of the embodiment, and FIG. 3 is a diagram of the information processing system. It is a figure showing an example of composition. 1... Test equipment, 2... Bus, 3-1
~3-n...Device under test, 4...Interface control unit, 5...Microprogram, 6...Microprocessor, 7...・・・
Part 1 of the same shows an excerpt of the configuration of the internal bus pilot.
Figure 3 shows the configuration of the detailed information processing system.

Claims (1)

[Claims] In an information processing device in which a plurality of input/output devices are connected to a main unit directly or via an input/output control device, an input/output command is sent from the main unit to each input/output device and input/output control device. When the input/output command is issued, an input/output device or an input/output control device other than the input/output device targeted by the input/output command is also provided with a means for recording the history of its own operation using the input/output command as a trigger. test system.