JPH01165131A - Deflushing device for resin seal type semiconductor - Google Patents
Deflushing device for resin seal type semiconductorInfo
- Publication number
- JPH01165131A JPH01165131A JP32445687A JP32445687A JPH01165131A JP H01165131 A JPH01165131 A JP H01165131A JP 32445687 A JP32445687 A JP 32445687A JP 32445687 A JP32445687 A JP 32445687A JP H01165131 A JPH01165131 A JP H01165131A
- Authority
- JP
- Japan
- Prior art keywords
- resin seal
- lead frame
- resin
- seal member
- sealed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims description 10
- 239000011347 resin Substances 0.000 title abstract description 14
- 229920005989 resin Polymers 0.000 title abstract description 14
- 238000007789 sealing Methods 0.000 claims description 10
- 238000005476 soldering Methods 0.000 abstract description 3
- 239000000758 substrate Substances 0.000 abstract 1
- 238000000034 method Methods 0.000 description 4
- 239000003082 abrasive agent Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は樹脂封止型半導体のモールドレジンのデフラッ
シュ装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a deflash device for mold resin of resin-sealed semiconductors.
従来の樹脂封止型半導体のモールドレンジのデフラッシ
ュ方法は、第2図に示す如く、樹脂封止後のリードフレ
ーム21を、ローラー22でガイドされたベルト23で
挟持して搬送し、ノズル24から、水と砥材の混合液2
5をリードフレームに噴射し、モールド、のレジンフラ
ッシュを除去していた。As shown in FIG. 2, in the conventional deflashing method for a resin-sealed semiconductor mold range, a lead frame 21 after resin-sealing is conveyed while being held between belts 23 guided by rollers 22, and then transferred to a nozzle 24. From, water and abrasive material mixture 2
5 was sprayed onto the lead frame to remove the resin flash from the mold.
しかし、最近のリードフレームは、第3図に示す如く、
封止部材の硬化収縮、及び封止部材31とリードフレー
ム32の熱膨張係数の違いによって生じるフレームのソ
リを防止する為にリードフレーム32と、端子330間
にスリット34を設けておりフレームとしての剛性も低
下している。However, recent lead frames, as shown in Figure 3,
A slit 34 is provided between the lead frame 32 and the terminal 330 to prevent warping of the frame caused by curing shrinkage of the sealing member and the difference in thermal expansion coefficients between the sealing member 31 and the lead frame 32. Rigidity is also reduced.
この様な構造のリードフレームをデフラッシュした場合
、第3図(b)に示す如く端子33、及びリードフレー
ム32は水と砥材の混合液の噴射により、ソリが発生し
たり曲がったりして、次工程での自動搬送時位置決めが
できず問題があった。When a lead frame with such a structure is deflashed, the terminals 33 and the lead frame 32 may warp or bend due to the injection of a mixture of water and abrasive material, as shown in FIG. 3(b). , there was a problem in that positioning during automatic transport in the next process could not be performed.
又、端子のフォーミング時、端子33の不規則な曲がり
は、端子の平坦度が低下し、プリント基板へのハンダ付
時、接続の安定性、作業の安定性が低下した。Furthermore, irregular bending of the terminal 33 during terminal forming reduces the flatness of the terminal, resulting in reduced connection stability and work stability when soldering to a printed circuit board.
本発明の樹脂封止型半導体のデフラッシュ装置は、複数
の端子部を除いたリードフレーム、及び樹脂封止部材の
面取り部斜面部を、上下から2枚の部材で、押える事を
特徴とする。The resin-sealed semiconductor deflash device of the present invention is characterized in that the lead frame excluding the plurality of terminals and the sloped surface of the chamfered portion of the resin-sealed member are pressed down by two members from above and below. .
(実施例)
第1図(a)は本発明における平面図で、第1図(b)
はそのA−A断面である。11は樹脂封止部材、12は
リードフレーム及び端子、13は押え用の部材、14は
押え用部材の複数端子上下開口部である。又、押え用の
部材は樹脂封止部材の4ケ所の面取り部15で、樹脂封
止部材の面取部の斜面に沿った形状で、樹脂封止部材を
固定している0以上の様な構成をクランプ16でサンド
インチする事により、樹脂封止部材とリードフレームは
相対的に動く事がなくデフラッシュによりリードフレー
ムが曲がったり、ソリが発生する事がなく、自動搬送時
のフレーム位置決め性も安定する。(Example) FIG. 1(a) is a plan view of the present invention, and FIG. 1(b)
is its AA cross section. 11 is a resin sealing member, 12 is a lead frame and a terminal, 13 is a holding member, and 14 is a plurality of terminal upper and lower openings of the holding member. In addition, the holding members are chamfered portions 15 at four locations on the resin sealing member, and have a shape that follows the slope of the chamfered portions of the resin sealing member, and have a shape of 0 or more that fixes the resin sealing member. By sandwiching the structure with the clamp 16, the resin sealing member and lead frame do not move relative to each other, and the lead frame does not bend or warp due to deflashing, making frame positioning easier during automatic transportation. is also stable.
又、端子フォーミング時の形状も均一になる。Moreover, the shape during terminal forming becomes uniform.
以上述べた様に本発明によれば、デフラッシュにより、
リードフレームが曲がる事なく、後工程での自動搬送が
安定する。さらにフォーミング後の端子の平坦度も向上
し、プリント基板へのハンダ付時、接続の安定性、作業
性が向上する。As described above, according to the present invention, by deflashing,
The lead frame does not bend, and automatic transportation in subsequent processes is stabilized. Furthermore, the flatness of the terminal after forming is improved, improving connection stability and workability when soldering to a printed circuit board.
第1図(a)は、本発明の平面図。
第1図(b)は、本発明の断面図。
第2図は、従来のデフラッシュ方法を示す図。
第3図(a)は、リードフレームの平面図。
第3図(b)は、リードフレームの側面図。
11・・・樹脂封止部材
12・・・リードフレーム及び端子
13・・・押え用部材
14・・・押え用部材の複数端子の開口部23・・・搬
送用ベルト
24・・・ノズル
25・・・混合液
34・・・スリット
以 上
出願人 セイコーエプソン株式会社
代理人 弁理士 最 上 務 他1名
第1図(α) 第1図(b)
第3図(cL) 第3図(b)FIG. 1(a) is a plan view of the present invention. FIG. 1(b) is a sectional view of the present invention. FIG. 2 is a diagram showing a conventional deflashing method. FIG. 3(a) is a plan view of the lead frame. FIG. 3(b) is a side view of the lead frame. 11... Resin sealing member 12... Lead frame and terminal 13... Holding member 14... Openings of multiple terminals of holding member 23... Conveying belt 24... Nozzle 25. ... Mixed liquid 34 ... Slit or above Applicant Seiko Epson Co., Ltd. agent Patent attorney Tsutomu Mogami and 1 other person Figure 1 (α) Figure 1 (b) Figure 3 (cL) Figure 3 (b) )
Claims (1)
着する素子固着板と、該素子固着板に連なる帯状部材と
、該素子固着板近傍に先端子を有し、該先端部に前記半
導体素子の電極が電気的に接続された複数の端子と、前
記半導体素子、前記素子固着板、前記複数の端子を封止
し、その封止部材は、外形が4つの主たる側辺、及び側
辺間の角部において面取り部を有し、且、該側辺及び該
面取り部が斜面になっている樹脂封止部材からなる樹脂
封止型半導体のデフラッシュ装置において、樹脂封止部
材から導出された複数の端子の上下部を除いたリードフ
レーム部及び、前記面取り部を、上下から2枚の部材で
押えて加工する事を特徴とする樹脂封止型半導体のデフ
ラッシュ装置。A semiconductor element having a large number of electrodes, an element fixing plate for fixing the semiconductor element, a band-like member connected to the element fixing plate, a tip in the vicinity of the element fixing plate, and a tip attached to the tip of the semiconductor element. A plurality of terminals to which electrodes are electrically connected, the semiconductor element, the element fixing plate, and the plurality of terminals are sealed, and the sealing member has an outer shape of four main sides and a portion between the sides. In a resin-sealed semiconductor deflash device comprising a resin-sealed member having a chamfered portion at a corner, and in which the side edges and the chamfered portion are sloped, a plurality of deflashing devices derived from the resin-sealed member are provided. A deflashing device for a resin-sealed semiconductor, characterized in that the lead frame part excluding the upper and lower parts of the terminal and the chamfered part are pressed and processed by two members from above and below.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP32445687A JPH01165131A (en) | 1987-12-22 | 1987-12-22 | Deflushing device for resin seal type semiconductor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP32445687A JPH01165131A (en) | 1987-12-22 | 1987-12-22 | Deflushing device for resin seal type semiconductor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01165131A true JPH01165131A (en) | 1989-06-29 |
Family
ID=18166012
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP32445687A Pending JPH01165131A (en) | 1987-12-22 | 1987-12-22 | Deflushing device for resin seal type semiconductor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01165131A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6988879B2 (en) * | 2002-10-18 | 2006-01-24 | Asm Technology Singapore Pte Ltd | Apparatus and method for reducing substrate warpage |
-
1987
- 1987-12-22 JP JP32445687A patent/JPH01165131A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6988879B2 (en) * | 2002-10-18 | 2006-01-24 | Asm Technology Singapore Pte Ltd | Apparatus and method for reducing substrate warpage |
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