JPH01163867U - - Google Patents
Info
- Publication number
- JPH01163867U JPH01163867U JP6048288U JP6048288U JPH01163867U JP H01163867 U JPH01163867 U JP H01163867U JP 6048288 U JP6048288 U JP 6048288U JP 6048288 U JP6048288 U JP 6048288U JP H01163867 U JPH01163867 U JP H01163867U
- Authority
- JP
- Japan
- Prior art keywords
- measured
- flaw detection
- probe
- feeding mechanism
- intermittently
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims description 6
- 239000000523 sample Substances 0.000 claims description 5
- 239000000463 material Substances 0.000 claims 4
- 238000010586 diagram Methods 0.000 description 2
Description
第１図はこの考案の一実施例に係る探傷位置の
側面図、第２図は第１図の矢印Ａから見た探傷装
置の正面図、第３図は第１図、第２図の構成にお
ける探触子のワーク上の走査状態の説明図、第４
図は従来の探傷装置の斜視図、第５図は第４図の
構成における探触子のワーク上の走査状態の説明
図である。
図において、１はワーク、２は探触子、３は電
動ローラ・コンベア、５，６はピンチローラ、９
はカムシヤフト、１５は仕分シリンダである。な
お、図中、同一符号は同一、又は相当部分を示す
。
Fig. 1 is a side view of the flaw detection position according to an embodiment of this invention, Fig. 2 is a front view of the flaw detection device seen from arrow A in Fig. 1, and Fig. 3 is the configuration of Figs. 1 and 2. Explanatory diagram of the scanning state of the probe on the workpiece in 4th
The figure is a perspective view of a conventional flaw detection device, and FIG. 5 is an explanatory diagram of the scanning state of the probe on the workpiece in the configuration of FIG. 4. In the figure, 1 is a workpiece, 2 is a probe, 3 is an electric roller conveyor, 5 and 6 are pinch rollers, and 9
is a camshaft, and 15 is a sorting cylinder. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.
Claims (1)
る送り機構と、送り機構の間欠停止時に被測定材
の第２の方向に移動しながら被測定材の探傷を行
う探触子と、探触子による探傷結果に基づいて被
測定材を仕分けする仕分機構を備えることを特徴
とする探傷装置。 a feeding mechanism that intermittently moves the fixed material to be measured in a first direction; a probe that performs flaw detection on the material to be measured while moving in a second direction of the material to be measured when the feeding mechanism is intermittently stopped; A flaw detection device comprising a sorting mechanism that sorts materials to be measured based on flaw detection results obtained by a probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6048288U JPH01163867U (en) | 1988-05-07 | 1988-05-07 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6048288U JPH01163867U (en) | 1988-05-07 | 1988-05-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01163867U true JPH01163867U (en) | 1989-11-15 |
Family
ID=31286191
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6048288U Pending JPH01163867U (en) | 1988-05-07 | 1988-05-07 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01163867U (en) |
-
1988
- 1988-05-07 JP JP6048288U patent/JPH01163867U/ja active Pending