JPH01159948A - Vacuum exhaust system for scanning electron microscope - Google Patents
Vacuum exhaust system for scanning electron microscopeInfo
- Publication number
- JPH01159948A JPH01159948A JP31626387A JP31626387A JPH01159948A JP H01159948 A JPH01159948 A JP H01159948A JP 31626387 A JP31626387 A JP 31626387A JP 31626387 A JP31626387 A JP 31626387A JP H01159948 A JPH01159948 A JP H01159948A
- Authority
- JP
- Japan
- Prior art keywords
- tank
- coolant
- hose
- scanning electron
- baffle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000009792 diffusion process Methods 0.000 claims abstract description 11
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 10
- 238000001816 cooling Methods 0.000 claims description 8
- 238000005086 pumping Methods 0.000 claims description 2
- 230000008602 contraction Effects 0.000 abstract description 2
- 239000002826 coolant Substances 0.000 abstract 8
- 239000002184 metal Substances 0.000 abstract 2
- 230000010349 pulsation Effects 0.000 abstract 2
- 239000000498 cooling water Substances 0.000 description 28
- 230000000694 effects Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000013016 damping Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000001000 micrograph Methods 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は走査型電子顕微鏡用真空排気システムに係り、
特に油拡散ポンプ等の冷却水より発生する振動を減衰す
るのに好適なタンクを設けた真空排気システムに関する
。[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to a vacuum evacuation system for a scanning electron microscope,
In particular, the present invention relates to a vacuum pumping system equipped with a tank suitable for damping vibrations generated by cooling water such as an oil diffusion pump.
従来の冷却水路は、単にビニールチューブで水導栓より
水を油拡散ポンプ等の冷却水路に直結していた。この場
合には水導水の水圧が変化するとその変化のたびに冷却
水路に微小振動が生じ、走査型電子顕微鏡による像に障
害を与えていた。Conventional cooling waterways simply use vinyl tubes to connect water directly to cooling waterways such as oil diffusion pumps through water valves. In this case, every time the water pressure of the water conveying water changes, minute vibrations occur in the cooling channel, which interferes with images taken with a scanning electron microscope.
他の従来例として、冷却水路に蛇管(コイル状)を設け
これに水を流して振動を除去する方法が提案されたが、
脈流が大きく発生するとやはり振動が除去できないとい
う欠点があった。なお、この種のシステムとして関連す
るものには、例えばrQ&A真空50間(立共出版株式
会社、昭和57年12月25日発行)P42.図1」が
ある。As another conventional example, a method has been proposed in which a coiled pipe is provided in the cooling waterway and water is run through it to remove vibrations.
There is also a drawback that vibrations cannot be removed when large pulsating flows occur. Incidentally, related systems of this type include, for example, rQ&A Vacuum 50 Space (Rikkyo Publishing Co., Ltd., published December 25, 1980) P42. There is a "Figure 1".
上記従来技術は冷却水の流量状態の点について配慮がさ
れておらず、冷却水が脈流状態では乱流となりそれによ
り発生する振動によって走査型電子顕微鏡の像のエツジ
が振れるといった振動による像障害が生じる問題があっ
た。The above conventional technology does not take into account the flow rate of the cooling water, and when the cooling water is in a pulsating state, it becomes a turbulent flow and the resulting vibrations cause image disturbances such as the edges of the scanning electron microscope image being shaken. There was a problem that occurred.
本発明の目的は冷却水の流量状態を常に定常流状態とす
ることによって、冷却水によって発生する像障害を低減
することができる走査型電子顕微鏡用真空排気システム
を提供することにある。SUMMARY OF THE INVENTION An object of the present invention is to provide a vacuum evacuation system for a scanning electron microscope that can reduce image disturbances caused by the cooling water by keeping the flow rate of the cooling water constant.
」二記目的は、冷却水路に弾性体を用いたタンクを設け
ることにより、水の脈流から発生する乱流を弾性体によ
ってその運動エネルギを吸収し、常に層流とすることに
よって、達成される。The second objective was achieved by providing a tank using an elastic body in the cooling channel, and by absorbing the kinetic energy of the turbulent flow generated from the pulsating water flow with the elastic body, and making the flow always laminar. Ru.
冷却水路に設けられた弾性体のタンクは、冷却水が脈流
状態では、その脈流に対応して伸縮する。When the cooling water is in a pulsating flow state, the elastic tank provided in the cooling water channel expands and contracts in response to the pulsating flow.
それによって水の脈流状態の運動エネルギは弾性体に吸
収され、常に定常流の状態となる。従って冷却水が走査
型電子顕微鏡に像障害を与えることがない。As a result, the kinetic energy of the pulsating water flow is absorbed by the elastic body, resulting in a constant flow state. Therefore, the cooling water does not interfere with the image of the scanning electron microscope.
以下、本発明の一実施例にもとすき説明する。 An embodiment of the present invention will be explained below.
第1図は本発明の特徴をもつとも良く表わしている冷却
水路タンクの断面図、第2図はタンクを用いた走査型電
子顕微鏡の排気システムを表わしている図である。FIG. 1 is a cross-sectional view of a cooling water tank that is a good example of the features of the present invention, and FIG. 2 is a diagram showing an exhaust system for a scanning electron microscope using the tank.
第2図において走査型電子顕微鏡の試料室1の吸気口に
パンフル2を通して油拡散ポンプ3が取り付けられてい
る。バッフル2にはタンク7を用いた冷却水吸入ホース
5が配管され、油拡散ポンプ3には冷却水排出ホース6
が配管され、パンフル2と油拡散ポンプ3の間に冷却水
ホース4が配管されている。タンク7は第1図において
バネ9で押さえつけられた弾性体であるゴムタンク8が
配管金具10によって冷却水ホースと連結している構造
となっている。In FIG. 2, an oil diffusion pump 3 is attached to an inlet of a sample chamber 1 of a scanning electron microscope through a panfur 2. A cooling water intake hose 5 using a tank 7 is connected to the baffle 2, and a cooling water discharge hose 6 is connected to the oil diffusion pump 3.
A cooling water hose 4 is connected between the panflu 2 and the oil diffusion pump 3. In FIG. 1, the tank 7 has a structure in which a rubber tank 8, which is an elastic body pressed by a spring 9, is connected to a cooling water hose by a piping fitting 10.
第1図において、冷却水吸入ホース5内が脈流となると
、その脈流に対応してゴムタンク8が縦方向は配管金具
10て押さえられているので横方向に伸縮する。その伸
縮もバネ9によってタンク7から流出する流量が一定と
なるように制御される。従って冷却水吸入ホース5の脈
流はタンク7を通過することによって定常流となる。In FIG. 1, when a pulsating flow occurs in the cooling water suction hose 5, the rubber tank 8 expands and contracts in the lateral direction because it is held down by the piping fitting 10 in the vertical direction in response to the pulsating flow. Its expansion and contraction are also controlled by the spring 9 so that the flow rate flowing out from the tank 7 is constant. Therefore, the pulsating flow of the cooling water suction hose 5 becomes a steady flow by passing through the tank 7.
本実施例によれば、冷却水吸入ホース5に流れる冷却水
が脈流となっても、タンク7により常に定常流となり、
排気システムに流れ込む冷却水は常に定常流となる。よ
って本実施例は冷却水が脈流となったとき起こる振動が
走査型電子顕微鏡の観察像のエツジを振らすといった振
動による像障害を減少する効果がある。According to this embodiment, even if the cooling water flowing into the cooling water suction hose 5 becomes a pulsating flow, the tank 7 always maintains a steady flow.
The cooling water flowing into the exhaust system is always a steady flow. Therefore, this embodiment has the effect of reducing image disturbances caused by vibrations, such as vibrations caused when the cooling water becomes a pulsating flow that shakes the edges of an image observed by a scanning electron microscope.
前記実施例においてタンク7は冷却水吸入ホース5にの
み用いられているが、第3図に示すように、冷却水吸入
ホース5と冷却水排出ホース6と冷却水ホース4におい
てタンク7を用いているものであってもよい。本実施例
では、排気システムに流入する冷却水の脈流と排気シス
テム内のバッフル2や油拡散ポンプ3を冷却水が通過す
ることによって生しる脈流をもそれぞれのホースに用い
られたタンク7が常に定常流とし、排気システムの全冷
却水路で定常流状態の冷却水が流れ、振動による像障害
を減少する効果がある。In the above embodiment, the tank 7 is used only for the cooling water intake hose 5, but as shown in FIG. It may be something that exists. In this embodiment, the pulsating flow of cooling water flowing into the exhaust system and the pulsating flow generated by the cooling water passing through the baffle 2 and oil diffusion pump 3 in the exhaust system are also connected to the tank used for each hose. 7 is always a steady flow, and the cooling water in a steady flow state flows in all the cooling channels of the exhaust system, which has the effect of reducing image disturbance due to vibration.
本発明によれば、冷却水が脈流てあってもその運動エネ
ルギを弾性体を用いたタンクが吸収し、常に定常流とす
ることができるので、冷却水が脈流となることによって
発生する振動を防ぐことができ、走査型電子顕微鏡の像
障害を減少する効果がある。According to the present invention, even if there is a pulsating flow of cooling water, the tank made of an elastic body absorbs the kinetic energy and the flow can always be maintained as a steady flow. It can prevent vibration and has the effect of reducing image disturbances in scanning electron microscopes.
第1図は本発明の一実施例の冷却水路タンクの断面図、
第2図はタンクを用いた走査型電子顕微鏡の排気システ
ムを示す図、第3図は他の実施例におけるタンクを用い
た走査型電子顕微鏡の排気システムを示す図である。
1・・試料室、2・バッフル、3・・油拡散ポンプ、4
・・冷却水ホース、5・・・冷却水吸入ホース、6・・
・冷却水排出ホース、7・・タンク、8・ゴムタンク、
第1図
第2図
第3図
「−一一下7FIG. 1 is a sectional view of a cooling water tank according to an embodiment of the present invention;
FIG. 2 is a diagram showing an exhaust system for a scanning electron microscope using a tank, and FIG. 3 is a diagram showing an exhaust system for a scanning electron microscope using a tank in another embodiment. 1. Sample chamber, 2. Baffle, 3. Oil diffusion pump, 4
...Cooling water hose, 5...Cooling water suction hose, 6...
・Cooling water discharge hose, 7. Tank, 8. Rubber tank,
Figure 1 Figure 2 Figure 3 "-11 7
Claims (1)
プを用いた走査型電子顕微鏡の真空排気システムにおい
て、該真空ポンプを冷却する水路に弾性体を用いたタン
クを設けたことを特徴とする走査型電子顕微鏡用真空排
気システム。 2、特許請求の範囲第1項において、該真空ポンプとバ
ッフルを直結した真空排気システムにて、該真空ポンプ
と該バッフルとの間を連結した水路に弾性体を用いたタ
ンクを設けたことを特徴とする走査型電子顕微鏡用真空
排気システム。[Claims] 1. In a vacuum pumping system for a scanning electron microscope using a vacuum pump such as an oil diffusion pump that requires a water cooling passage, a tank using an elastic body is provided in the water channel for cooling the vacuum pump. A vacuum evacuation system for a scanning electron microscope, characterized by the following: 2. Claim 1 states that in a vacuum exhaust system in which the vacuum pump and the baffle are directly connected, a tank made of an elastic body is provided in the water channel connecting the vacuum pump and the baffle. Features a vacuum evacuation system for scanning electron microscopes.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP31626387A JPH01159948A (en) | 1987-12-16 | 1987-12-16 | Vacuum exhaust system for scanning electron microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP31626387A JPH01159948A (en) | 1987-12-16 | 1987-12-16 | Vacuum exhaust system for scanning electron microscope |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01159948A true JPH01159948A (en) | 1989-06-22 |
Family
ID=18075149
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP31626387A Pending JPH01159948A (en) | 1987-12-16 | 1987-12-16 | Vacuum exhaust system for scanning electron microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01159948A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004228077A (en) * | 2003-01-24 | 2004-08-12 | Leica Microsystems Lithography Ltd | Cooling of device for guiding electron beam |
JP2008200739A (en) * | 2007-02-22 | 2008-09-04 | Japan Metals & Chem Co Ltd | Rotary member for molten metal degassing apparatus, and molten metal degassing apparatus comprising the same |
-
1987
- 1987-12-16 JP JP31626387A patent/JPH01159948A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004228077A (en) * | 2003-01-24 | 2004-08-12 | Leica Microsystems Lithography Ltd | Cooling of device for guiding electron beam |
JP2008200739A (en) * | 2007-02-22 | 2008-09-04 | Japan Metals & Chem Co Ltd | Rotary member for molten metal degassing apparatus, and molten metal degassing apparatus comprising the same |
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