JPH01156845U - - Google Patents

Info

Publication number
JPH01156845U
JPH01156845U JP5364788U JP5364788U JPH01156845U JP H01156845 U JPH01156845 U JP H01156845U JP 5364788 U JP5364788 U JP 5364788U JP 5364788 U JP5364788 U JP 5364788U JP H01156845 U JPH01156845 U JP H01156845U
Authority
JP
Japan
Prior art keywords
axis direction
axis
stage
laser beam
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5364788U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5364788U priority Critical patent/JPH01156845U/ja
Publication of JPH01156845U publication Critical patent/JPH01156845U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Machine Tool Sensing Apparatuses (AREA)
JP5364788U 1988-04-20 1988-04-20 Pending JPH01156845U (pl)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5364788U JPH01156845U (pl) 1988-04-20 1988-04-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5364788U JPH01156845U (pl) 1988-04-20 1988-04-20

Publications (1)

Publication Number Publication Date
JPH01156845U true JPH01156845U (pl) 1989-10-27

Family

ID=31279612

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5364788U Pending JPH01156845U (pl) 1988-04-20 1988-04-20

Country Status (1)

Country Link
JP (1) JPH01156845U (pl)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001157951A (ja) * 1999-11-30 2001-06-12 Univ Chuo 逐次2点法による形状精度測定装置および逐次2点法による形状精度測定用レーザ変位計間隔測定方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001157951A (ja) * 1999-11-30 2001-06-12 Univ Chuo 逐次2点法による形状精度測定装置および逐次2点法による形状精度測定用レーザ変位計間隔測定方法

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