JPH01156548U - - Google Patents

Info

Publication number
JPH01156548U
JPH01156548U JP5269788U JP5269788U JPH01156548U JP H01156548 U JPH01156548 U JP H01156548U JP 5269788 U JP5269788 U JP 5269788U JP 5269788 U JP5269788 U JP 5269788U JP H01156548 U JPH01156548 U JP H01156548U
Authority
JP
Japan
Prior art keywords
map
index
wafer
wafer prober
starting point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5269788U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5269788U priority Critical patent/JPH01156548U/ja
Publication of JPH01156548U publication Critical patent/JPH01156548U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP5269788U 1988-04-19 1988-04-19 Pending JPH01156548U (enrdf_load_html_response)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5269788U JPH01156548U (enrdf_load_html_response) 1988-04-19 1988-04-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5269788U JPH01156548U (enrdf_load_html_response) 1988-04-19 1988-04-19

Publications (1)

Publication Number Publication Date
JPH01156548U true JPH01156548U (enrdf_load_html_response) 1989-10-27

Family

ID=31278704

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5269788U Pending JPH01156548U (enrdf_load_html_response) 1988-04-19 1988-04-19

Country Status (1)

Country Link
JP (1) JPH01156548U (enrdf_load_html_response)

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