JPH01151266U - - Google Patents

Info

Publication number
JPH01151266U
JPH01151266U JP4857688U JP4857688U JPH01151266U JP H01151266 U JPH01151266 U JP H01151266U JP 4857688 U JP4857688 U JP 4857688U JP 4857688 U JP4857688 U JP 4857688U JP H01151266 U JPH01151266 U JP H01151266U
Authority
JP
Japan
Prior art keywords
semiconductor device
testing apparatus
space
device testing
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4857688U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4857688U priority Critical patent/JPH01151266U/ja
Publication of JPH01151266U publication Critical patent/JPH01151266U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
JP4857688U 1988-04-11 1988-04-11 Pending JPH01151266U (US20100012521A1-20100121-C00001.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4857688U JPH01151266U (US20100012521A1-20100121-C00001.png) 1988-04-11 1988-04-11

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4857688U JPH01151266U (US20100012521A1-20100121-C00001.png) 1988-04-11 1988-04-11

Publications (1)

Publication Number Publication Date
JPH01151266U true JPH01151266U (US20100012521A1-20100121-C00001.png) 1989-10-19

Family

ID=31274717

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4857688U Pending JPH01151266U (US20100012521A1-20100121-C00001.png) 1988-04-11 1988-04-11

Country Status (1)

Country Link
JP (1) JPH01151266U (US20100012521A1-20100121-C00001.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002046781A1 (fr) * 2000-12-07 2002-06-13 Advantest Corporation Douille d'essai pour composants electroniques, et appareil d'essai pour composants electroniques utilisant cette douille

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002046781A1 (fr) * 2000-12-07 2002-06-13 Advantest Corporation Douille d'essai pour composants electroniques, et appareil d'essai pour composants electroniques utilisant cette douille
US6932635B2 (en) 2000-12-07 2005-08-23 Advantest Corporation Electronic component testing socket and electronic component testing apparatus using the same

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