JPH01148852U - - Google Patents
Info
- Publication number
- JPH01148852U JPH01148852U JP4579188U JP4579188U JPH01148852U JP H01148852 U JPH01148852 U JP H01148852U JP 4579188 U JP4579188 U JP 4579188U JP 4579188 U JP4579188 U JP 4579188U JP H01148852 U JPH01148852 U JP H01148852U
- Authority
- JP
- Japan
- Prior art keywords
- light source
- visual inspection
- inspection device
- darkness
- brightness
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000011179 visual inspection Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
第１図は本考案の一実施例による外観検査装置
の簡略構成図である。
１は銅張積層板、２は光源、３は密着型イメー
ジセンサー、４は処理回路、５は出力装置である
。
FIG. 1 is a simplified configuration diagram of a visual inspection device according to an embodiment of the present invention. 1 is a copper-clad laminate, 2 is a light source, 3 is a contact image sensor, 4 is a processing circuit, and 5 is an output device.
Claims (1)
列された複数の密着型イメージセンサーに加え、
表面状態の明暗に対応した映像信号を波図形に処
理する手段とを具備してなることを特徴とする外
観検査装置。 In addition to multiple close-contact image sensors arranged in a staggered manner perpendicular to the light source and product flow direction,
1. A visual inspection device comprising means for processing a video signal corresponding to the brightness and darkness of a surface condition into a wave pattern.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4579188U JPH01148852U (en) | 1988-04-05 | 1988-04-05 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4579188U JPH01148852U (en) | 1988-04-05 | 1988-04-05 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01148852U true JPH01148852U (en) | 1989-10-16 |
Family
ID=31272088
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4579188U Pending JPH01148852U (en) | 1988-04-05 | 1988-04-05 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01148852U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009080064A (en) * | 2007-09-27 | 2009-04-16 | Nuflare Technology Inc | Pattern inspection device and pattern inspection method |
| JP2014206547A (en) * | 2008-01-16 | 2014-10-30 | オルボテック リミテッド | Inspection of substrate using multiple cameras |
| WO2021240025A1 (en) * | 2020-05-26 | 2021-12-02 | Cin Advanced Systems Group S.L. | Surface defect inspection device, vehicle body surface defect inspection line and surface defect inspection process |
-
1988
- 1988-04-05 JP JP4579188U patent/JPH01148852U/ja active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009080064A (en) * | 2007-09-27 | 2009-04-16 | Nuflare Technology Inc | Pattern inspection device and pattern inspection method |
| JP2014206547A (en) * | 2008-01-16 | 2014-10-30 | オルボテック リミテッド | Inspection of substrate using multiple cameras |
| US11113803B2 (en) | 2008-01-16 | 2021-09-07 | Orbotech Ltd. | Inspection of a substrate using multiple cameras |
| WO2021240025A1 (en) * | 2020-05-26 | 2021-12-02 | Cin Advanced Systems Group S.L. | Surface defect inspection device, vehicle body surface defect inspection line and surface defect inspection process |