JPH01139431U - - Google Patents
Info
- Publication number
- JPH01139431U JPH01139431U JP3646488U JP3646488U JPH01139431U JP H01139431 U JPH01139431 U JP H01139431U JP 3646488 U JP3646488 U JP 3646488U JP 3646488 U JP3646488 U JP 3646488U JP H01139431 U JPH01139431 U JP H01139431U
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- measurement
- wafer inspection
- tester
- displays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims description 3
- 238000005259 measurement Methods 0.000 claims description 3
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3646488U JPH01139431U (uk) | 1988-03-18 | 1988-03-18 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3646488U JPH01139431U (uk) | 1988-03-18 | 1988-03-18 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01139431U true JPH01139431U (uk) | 1989-09-22 |
Family
ID=31263066
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3646488U Pending JPH01139431U (uk) | 1988-03-18 | 1988-03-18 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01139431U (uk) |
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1988
- 1988-03-18 JP JP3646488U patent/JPH01139431U/ja active Pending