JPH01137534U - - Google Patents

Info

Publication number
JPH01137534U
JPH01137534U JP3335788U JP3335788U JPH01137534U JP H01137534 U JPH01137534 U JP H01137534U JP 3335788 U JP3335788 U JP 3335788U JP 3335788 U JP3335788 U JP 3335788U JP H01137534 U JPH01137534 U JP H01137534U
Authority
JP
Japan
Prior art keywords
microscope
probe device
down mechanism
explanatory diagram
observed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3335788U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3335788U priority Critical patent/JPH01137534U/ja
Publication of JPH01137534U publication Critical patent/JPH01137534U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
JP3335788U 1988-03-14 1988-03-14 Pending JPH01137534U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3335788U JPH01137534U (enrdf_load_stackoverflow) 1988-03-14 1988-03-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3335788U JPH01137534U (enrdf_load_stackoverflow) 1988-03-14 1988-03-14

Publications (1)

Publication Number Publication Date
JPH01137534U true JPH01137534U (enrdf_load_stackoverflow) 1989-09-20

Family

ID=31260025

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3335788U Pending JPH01137534U (enrdf_load_stackoverflow) 1988-03-14 1988-03-14

Country Status (1)

Country Link
JP (1) JPH01137534U (enrdf_load_stackoverflow)

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