JPH01130253U - - Google Patents

Info

Publication number
JPH01130253U
JPH01130253U JP2625788U JP2625788U JPH01130253U JP H01130253 U JPH01130253 U JP H01130253U JP 2625788 U JP2625788 U JP 2625788U JP 2625788 U JP2625788 U JP 2625788U JP H01130253 U JPH01130253 U JP H01130253U
Authority
JP
Japan
Prior art keywords
electron beam
detection element
signal line
input side
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2625788U
Other languages
Japanese (ja)
Other versions
JPH0722040Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988026257U priority Critical patent/JPH0722040Y2/en
Publication of JPH01130253U publication Critical patent/JPH01130253U/ja
Application granted granted Critical
Publication of JPH0722040Y2 publication Critical patent/JPH0722040Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本考案の電子線マイクロアナライザ
についての一実施例を示す概略の説明図であり、
電子線検出器を中心に示す図である。 図中の符号については、1は電子線マイクロア
ナライザ、2は試料照射部、3は試料部、4は電
子線照射部、5は半導体反射電子検出器、6は電
子線照射口、7は光検出素子、8は照射面、9は
二次電子検出器、10はシンチレータ、11は光
検出素子、12は出力端、13は信号線、14は
中央処理装置(CPU)、15は入力側、16は
出力端、17は増幅器、18は入力側、19は信
号線、20は出力側、21はスナツプスイツチ、
22は端子、23は接触片、24は出力側端子、
25は入力側、26は信号出力側、27は入力側
、28は信号線、29は作動側回路、30は作動
側回路、31は高圧側電源、32は出力端、33
は増幅器、34は入力側、35は信号線、36は
出力側、37は端子である。
FIG. 1 is a schematic explanatory diagram showing one embodiment of the electron beam microanalyzer of the present invention.
It is a diagram mainly showing an electron beam detector. Regarding the symbols in the figure, 1 is the electron beam microanalyzer, 2 is the sample irradiation section, 3 is the sample section, 4 is the electron beam irradiation section, 5 is the semiconductor backscattered electron detector, 6 is the electron beam irradiation port, and 7 is the light beam irradiation section. Detection element, 8 is an irradiation surface, 9 is a secondary electron detector, 10 is a scintillator, 11 is a photodetection element, 12 is an output end, 13 is a signal line, 14 is a central processing unit (CPU), 15 is an input side, 16 is an output end, 17 is an amplifier, 18 is an input side, 19 is a signal line, 20 is an output side, 21 is a snap switch,
22 is a terminal, 23 is a contact piece, 24 is an output side terminal,
25 is the input side, 26 is the signal output side, 27 is the input side, 28 is the signal line, 29 is the operating side circuit, 30 is the operating side circuit, 31 is the high voltage side power supply, 32 is the output end, 33
is an amplifier, 34 is an input side, 35 is a signal line, 36 is an output side, and 37 is a terminal.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 電子線信号検出素子を備える電子線信号検出器
において、備えられている電子線検出素子の周囲
に光検出素子が設けられていることを特徴とする
電子線信号検出器。
An electron beam signal detector including an electron beam signal detection element, characterized in that a photodetection element is provided around the provided electron beam detection element.
JP1988026257U 1988-02-29 1988-02-29 Electron microanalyzer Expired - Lifetime JPH0722040Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988026257U JPH0722040Y2 (en) 1988-02-29 1988-02-29 Electron microanalyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988026257U JPH0722040Y2 (en) 1988-02-29 1988-02-29 Electron microanalyzer

Publications (2)

Publication Number Publication Date
JPH01130253U true JPH01130253U (en) 1989-09-05
JPH0722040Y2 JPH0722040Y2 (en) 1995-05-17

Family

ID=31247723

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988026257U Expired - Lifetime JPH0722040Y2 (en) 1988-02-29 1988-02-29 Electron microanalyzer

Country Status (1)

Country Link
JP (1) JPH0722040Y2 (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6226757A (en) * 1985-07-25 1987-02-04 Shimadzu Corp Inductive coupling plasma mass spectrograph

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6226757A (en) * 1985-07-25 1987-02-04 Shimadzu Corp Inductive coupling plasma mass spectrograph

Also Published As

Publication number Publication date
JPH0722040Y2 (en) 1995-05-17

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