JPH01118379U - - Google Patents

Info

Publication number
JPH01118379U
JPH01118379U JP1123488U JP1123488U JPH01118379U JP H01118379 U JPH01118379 U JP H01118379U JP 1123488 U JP1123488 U JP 1123488U JP 1123488 U JP1123488 U JP 1123488U JP H01118379 U JPH01118379 U JP H01118379U
Authority
JP
Japan
Prior art keywords
temperature
test chamber
opening
air curtain
temperature test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1123488U
Other languages
English (en)
Japanese (ja)
Other versions
JPH075426Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988011234U priority Critical patent/JPH075426Y2/ja
Publication of JPH01118379U publication Critical patent/JPH01118379U/ja
Application granted granted Critical
Publication of JPH075426Y2 publication Critical patent/JPH075426Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP1988011234U 1988-02-01 1988-02-01 温度特性試験槽 Expired - Lifetime JPH075426Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988011234U JPH075426Y2 (ja) 1988-02-01 1988-02-01 温度特性試験槽

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988011234U JPH075426Y2 (ja) 1988-02-01 1988-02-01 温度特性試験槽

Publications (2)

Publication Number Publication Date
JPH01118379U true JPH01118379U (US20100012521A1-20100121-C00001.png) 1989-08-10
JPH075426Y2 JPH075426Y2 (ja) 1995-02-08

Family

ID=31219606

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988011234U Expired - Lifetime JPH075426Y2 (ja) 1988-02-01 1988-02-01 温度特性試験槽

Country Status (1)

Country Link
JP (1) JPH075426Y2 (US20100012521A1-20100121-C00001.png)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51118151A (en) * 1975-04-02 1976-10-16 Clark Equipment Co Open topped well type freezing show case
JPS58141175U (ja) * 1982-03-17 1983-09-22 株式会社東芝 オ−プンシヨ−ケ−ス
JPS613378U (ja) * 1984-06-13 1986-01-10 日本建鐵株式会社 冷凍冷蔵オ−プンシヨ−ケ−ス
JPS61105077A (ja) * 1984-10-26 1986-05-23 三菱電機株式会社 オ−プンシヨ−ケ−ス
JPS61203281U (US20100012521A1-20100121-C00001.png) * 1985-06-07 1986-12-20
JPS62169063A (ja) * 1986-01-21 1987-07-25 Kumamoto Nippon Denki Kk 環境試験装置
JPH01196583A (ja) * 1988-02-01 1989-08-08 Takamisawa Cybernetics Co Ltd 温度特性試験槽

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51118151A (en) * 1975-04-02 1976-10-16 Clark Equipment Co Open topped well type freezing show case
JPS58141175U (ja) * 1982-03-17 1983-09-22 株式会社東芝 オ−プンシヨ−ケ−ス
JPS613378U (ja) * 1984-06-13 1986-01-10 日本建鐵株式会社 冷凍冷蔵オ−プンシヨ−ケ−ス
JPS61105077A (ja) * 1984-10-26 1986-05-23 三菱電機株式会社 オ−プンシヨ−ケ−ス
JPS61203281U (US20100012521A1-20100121-C00001.png) * 1985-06-07 1986-12-20
JPS62169063A (ja) * 1986-01-21 1987-07-25 Kumamoto Nippon Denki Kk 環境試験装置
JPH01196583A (ja) * 1988-02-01 1989-08-08 Takamisawa Cybernetics Co Ltd 温度特性試験槽

Also Published As

Publication number Publication date
JPH075426Y2 (ja) 1995-02-08

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