JPH01112315A - Central processing unit - Google Patents

Central processing unit

Info

Publication number
JPH01112315A
JPH01112315A JP62269673A JP26967387A JPH01112315A JP H01112315 A JPH01112315 A JP H01112315A JP 62269673 A JP62269673 A JP 62269673A JP 26967387 A JP26967387 A JP 26967387A JP H01112315 A JPH01112315 A JP H01112315A
Authority
JP
Japan
Prior art keywords
temperature
diode
chip
signal
abnormality
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62269673A
Other languages
Japanese (ja)
Inventor
Yoichi Nagata
陽一 永田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP62269673A priority Critical patent/JPH01112315A/en
Publication of JPH01112315A publication Critical patent/JPH01112315A/en
Pending legal-status Critical Current

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  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Abstract

PURPOSE:To find out abnormal heating by forming a CPU main body and a diode to detect a temperature on the same chip to monitor the temperature change of a chip at all times. CONSTITUTION:A constant current in the forward direction is always supplied on the diode 3 formed on the same chip as the CPU main body 1. A temperature detecting part 5 measures the voltage of the diode 3 in the forward direction, and detects the temperature of the chip, and an abnormality decision part 6 decides whether the temperature arrives at an abnormal temperature area decided in advance, and when it is, a signal representing abnormality is outputted. And an input/output control part 7 decides a timing for holding or a time to be held, and holds access to an external device 8. In such a way, it is possible to sense the temperature change of the chip immediately and accurately, and to perform a processing for a fault rapidly and to apply detailed control on a cooling system, etc.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、中央処理装置に関するものである。[Detailed description of the invention] Industrial applications The present invention relates to a central processing unit.

従来の技術 従来の構成例を第2図に示す。従来、温度を測して中央
処理装置(以下、CPUと略す)の異常を検出する場合
、CPHのパッケージ9、あるいは、CPUのパッケー
ジ9の近辺に温度センサ1゜を設置して、パッケージ9
や空気の温度を測定する。温度は、電源電圧や冷却系等
の状態を監視して異常を検出して状況に応じた処置を施
こす監視部11に入力される。もしも、故障等で正常時
より多量の熱が発生して、実験で前もって定められた異
常温度に達した場合、端末にメツセージを表示するなど
の手段で警告を発したり、CPHの動作を止めるなどの
処置をしている。
BACKGROUND ART An example of a conventional configuration is shown in FIG. Conventionally, when measuring the temperature to detect an abnormality in the central processing unit (hereinafter abbreviated as CPU), a temperature sensor 1° is installed near the CPH package 9 or the CPU package 9.
or to measure the temperature of the air. The temperature is input to a monitoring unit 11 that monitors the status of the power supply voltage, cooling system, etc., detects abnormalities, and takes measures according to the situation. If a malfunction occurs and more heat is generated than normal, and the temperature reaches an abnormal temperature predetermined in the experiment, a warning will be issued by displaying a message on the terminal, or the CPH will stop operating. are being treated.

しかしながら、CPUの高性能化、高集積化に伴ない、
発熱量が急速に増大してきている現状において、温度セ
ンサを半導体基板(以下、チップと呼ぶ)から離れた位
置に設置していると、異常が生じてチップの温度が上昇
する速さに比較し、温度センサが温度上昇を感知するま
での時間が長くかかってしまう。
However, with the increasing performance and integration of CPUs,
In the current situation where the amount of heat generated is increasing rapidly, if a temperature sensor is installed far from a semiconductor substrate (hereinafter referred to as a chip), an abnormality will occur and the temperature of the chip will rise compared to the speed. , it takes a long time for the temperature sensor to detect a temperature rise.

また、異常な発熱の原因がCPU、冷却系の故障ではな
くて、−時的に外部のデバイス駆動、たとえは、外部メ
モリへのアクセスが集中的に多量に起きて消費電力が増
加した場合にもcpυの動作を止めてしまうことになる
Also, the cause of abnormal heat generation is not due to a failure of the CPU or cooling system, but rather due to the drive of an external device, for example, when a large amount of access to external memory occurs intensively, increasing power consumption. will also stop the operation of cpυ.

発明が解決しようとする問題点 このように、従来の温度異常検出と制御システムでは、
温度センサが温度上昇を感知するまでに時間がかかり過
ぎて、異常を検出した時にはcptyの動作保障温度範
囲を越えたり、ひどい場合はCPUが故障して全く使い
物にならなくなる。
Problems to be Solved by the Invention As described above, in the conventional temperature abnormality detection and control system,
It takes too long for the temperature sensor to detect a rise in temperature, and when an abnormality is detected, the temperature range for which the cpty is guaranteed to operate will be exceeded, or in the worst case, the CPU will break down and become completely unusable.

また、異常でなく、−時的な発熱の場合にもCPHの動
作を止めることは大いに無駄であり避けるべきである。
Furthermore, stopping the operation of the CPH even in the case of temporary heat generation rather than abnormality is wasteful and should be avoided.

問題点を解決するための手段 本発明は、同一チップ上に、ダイオードと、前記ダイオ
ードの頭方向に定電流を供給する電源と、前記ダイオー
ドに発生する電圧の値に応じて信号を出力する温度検出
部と、前記温度検出部からの信号を入力して、あらかじ
め定められた温度に対応した信号であるかを判定し、前
記温度に達している場合は前記温度であることを示す信
号を出力する異常判定部と、前記異常判定部からの信号
を入力して外部装置とのアクセスを保留にする論理回路
で構成された入出力制御部を備えたことを特徴とする中
央処理装置である。
Means for Solving the Problems The present invention provides a diode, a power supply that supplies a constant current in the direction of the head of the diode, and a temperature that outputs a signal depending on the value of the voltage generated in the diode on the same chip. A detection unit inputs a signal from the temperature detection unit, determines whether the signal corresponds to a predetermined temperature, and outputs a signal indicating that the temperature is reached if the temperature has reached the specified temperature. The central processing unit is characterized in that it is equipped with an input/output control section configured with an abnormality determination section that performs the above-mentioned abnormality determination section, and a logic circuit that inputs a signal from the abnormality determination section and suspends access to an external device.

作用 CPU本体と、温度を検出するダイオードとを同一チッ
プ上に形成することにより、チップの温度変化を随時監
視して異常発熱を早期に発見できる。また、温度が上昇
した時に、人出制御部が外部装置へのアクセスを保留に
することで消費電力を減らし、CPHの動作を止めるこ
となく発熱を抑えることができる。
By forming the operating CPU main body and a diode for detecting temperature on the same chip, changes in the temperature of the chip can be monitored at any time to detect abnormal heat generation at an early stage. Furthermore, when the temperature rises, the turnout control section suspends access to external devices, thereby reducing power consumption and suppressing heat generation without stopping the operation of the CPH.

実施例 本発明の一実施例の構成を第1図に示す。CPU本体1
と同一チップ上に形成したダイオード3の順方向には、
定電流源4によって常に一定の電流が供給されている。
Embodiment FIG. 1 shows the configuration of an embodiment of the present invention. CPU body 1
In the forward direction of the diode 3 formed on the same chip as
A constant current source 4 always supplies a constant current.

一般にダイオードは第3図に示すように、定電流駆動の
場合、温度に対して、負の直線的な順方向電圧特性を有
している。温度検出部6では、ダイオード3の順方向電
圧を測定することでチップの温度がわかるので、電圧に
応じて信号を出力すれば温度管理ができる。温度検出部
6から送出された信号は、異常判定部6に入力される。
Generally, as shown in FIG. 3, a diode has a negative linear forward voltage characteristic with respect to temperature when driven at a constant current. Since the temperature detection section 6 can determine the temperature of the chip by measuring the forward voltage of the diode 3, the temperature can be controlled by outputting a signal according to the voltage. The signal sent from the temperature detection section 6 is input to the abnormality determination section 6.

異常判定部6では、温度があらかじめ定められた異常な
温度領域に達しているかを判定し、異常であれば異常を
示す信号を出力する。なお、温度によって異なる信号を
出力するようにしておけばより細かい制御が可能となる
。異常判定部6からの異常を示す信号を入力した入出力
制御部7では、保留にするタイミングや保留にしておく
時間を決定し、外部装置8、主にメモリへのアクセスを
保留にする。
The abnormality determination unit 6 determines whether the temperature has reached a predetermined abnormal temperature range, and if abnormal, outputs a signal indicating the abnormality. Note that more detailed control becomes possible by outputting different signals depending on the temperature. The input/output control unit 7 receives the signal indicating the abnormality from the abnormality determination unit 6, and determines the timing and duration of the hold, and puts access to the external device 8, mainly the memory, on hold.

一般に、CPUの消費電力のかなりの部分は、外部のデ
バイスを駆動するだめのものであるため、外部メモリへ
のアクセスを保留することは、発熱を抑えるのに非常に
有効でちる。そのためにキャッシュ2を内蔵するCPU
1では特に効果的であると考えられる。
Generally, a considerable portion of the power consumed by a CPU is used to drive external devices, so suspending access to external memory is very effective in reducing heat generation. For this purpose, a CPU with built-in cache 2
1 is considered to be particularly effective.

なお、もし発熱の原因が冷却系やapU自体の故障によ
るものであれば、外部装置へのアクセスを保留にしだだ
けでは温度は下がらない。更に、本発明の温度検出部6
と異常判定部6と入出力制御部7に異常が起こることを
想定して、ダイオード3の順方向電圧は外部へも出力し
て、外部の回路でもCPU内部の温度を検知できるよう
にしておく。
Note that if the cause of the heat generation is a failure of the cooling system or the apU itself, simply suspending access to external devices will not reduce the temperature. Furthermore, the temperature detection section 6 of the present invention
Assuming that an abnormality occurs in the abnormality determination unit 6 and the input/output control unit 7, the forward voltage of the diode 3 is also output to the outside so that the temperature inside the CPU can be detected by an external circuit. .

発明の効果 CPU本体と同一チップ上にダイオードを形成すること
でチップの温度変化を即時に、そして正確に感知するこ
とができる。このことは、より早く故障に対する処理と
、より詳細な冷却系等の制御を可能にして、実用上大い
に有効である。
Effects of the Invention By forming a diode on the same chip as the CPU main body, changes in the temperature of the chip can be sensed immediately and accurately. This makes it possible to handle failures more quickly and to control the cooling system and the like in more detail, which is very effective in practice.

近年、CPUは高性能化、高密度化に伴ない消費電力が
増大している。高性能化により、CPHの外部に接続す
る素子数も増加するため、これらの外部装置を駆動する
だめの電力が全消費電力のかなりの部分を占めるように
なってきた。そのため、外部装置とのアクセスを保留に
して消費電力を抑えることは、温度を下げるのに非常に
有効である。
In recent years, the power consumption of CPUs has increased as the performance and density of CPUs have increased. As the performance increases, the number of elements connected to the outside of the CPH also increases, so the power required to drive these external devices has come to occupy a considerable portion of the total power consumption. Therefore, reducing power consumption by suspending access to external devices is very effective in lowering temperature.

また、キャッシュ付のCPUでは外部装置の一つ、外部
メモリとのアクセスを保留にしても動作速度が遅くなる
程度は小さい。従って、CPHの動作を停止させること
なく、そして、動作速度をそれ程遅くすることもなく、
温度を下げることが可能となり、信頼性の確保に非常に
有用である。
Furthermore, in a CPU with a cache, even if access to one of the external devices or the external memory is suspended, the degree to which the operating speed is slowed down is small. Therefore, without stopping the operation of the CPH and without significantly slowing down the operation speed,
This makes it possible to lower the temperature, which is extremely useful for ensuring reliability.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例における中央処理装置の構成
ブロック図、第2図は従来の中央処理装置の構成ブロッ
ク図、第3図はダイオードの順方向電圧の温度特性図で
ある。 1・・・・・・CPU本体、3・・・・・・ダイオード
、4・・・・・・定電流源、6・・・・・・温度検出部
、6・・・・・・異常判定部、γ・・・・1・入出力制
御部、8・・・・・・外部装置。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名第3
図 滝演(°Q) −城
FIG. 1 is a block diagram of the configuration of a central processing unit according to an embodiment of the present invention, FIG. 2 is a block diagram of the configuration of a conventional central processing unit, and FIG. 3 is a temperature characteristic diagram of forward voltage of a diode. 1...CPU main body, 3...Diode, 4...Constant current source, 6...Temperature detection section, 6...Abnormality determination part, γ...1, input/output control part, 8...external device. Name of agent: Patent attorney Toshio Nakao and 1 other person No. 3
Zutaki Performance (°Q) - Castle

Claims (1)

【特許請求の範囲】[Claims] 同一半導体基板上に、ダイオードと、前記ダイオードの
順方向に定電流を供給する電源と、前記ダイオードに発
生する電圧の値に応じて信号を出力する温度検出部と、
前記温度検出部からの信号を入力して、あらかじめ定め
られた温度に対応した信号であるかを判定し、前記温度
に達している場合は前記温度であることを示す信号を出
力する異常判定部と、前記異常判定部からの信号を入力
して外部装置とのアクセスを保留にする論理回路で構成
された入出力制御部を備えたことを特徴とする中央処理
装置。
A diode, a power supply that supplies a constant current in the forward direction of the diode, and a temperature detection section that outputs a signal according to the value of the voltage generated in the diode, on the same semiconductor substrate;
an abnormality determination unit that receives a signal from the temperature detection unit, determines whether the signal corresponds to a predetermined temperature, and outputs a signal indicating that the temperature has reached the temperature; and an input/output control unit configured with a logic circuit that inputs a signal from the abnormality determination unit and suspends access to an external device.
JP62269673A 1987-10-26 1987-10-26 Central processing unit Pending JPH01112315A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62269673A JPH01112315A (en) 1987-10-26 1987-10-26 Central processing unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62269673A JPH01112315A (en) 1987-10-26 1987-10-26 Central processing unit

Publications (1)

Publication Number Publication Date
JPH01112315A true JPH01112315A (en) 1989-05-01

Family

ID=17475610

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62269673A Pending JPH01112315A (en) 1987-10-26 1987-10-26 Central processing unit

Country Status (1)

Country Link
JP (1) JPH01112315A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7148589B2 (en) 1994-03-28 2006-12-12 Kabushiki Kaisha Toshiba Method and apparatus for controlling internal heat generating circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7148589B2 (en) 1994-03-28 2006-12-12 Kabushiki Kaisha Toshiba Method and apparatus for controlling internal heat generating circuit

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