JPH01110380U - - Google Patents

Info

Publication number
JPH01110380U
JPH01110380U JP625688U JP625688U JPH01110380U JP H01110380 U JPH01110380 U JP H01110380U JP 625688 U JP625688 U JP 625688U JP 625688 U JP625688 U JP 625688U JP H01110380 U JPH01110380 U JP H01110380U
Authority
JP
Japan
Prior art keywords
semiconductor device
bonding pad
package
wire
utility
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP625688U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP625688U priority Critical patent/JPH01110380U/ja
Publication of JPH01110380U publication Critical patent/JPH01110380U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP625688U 1988-01-20 1988-01-20 Pending JPH01110380U (US06265458-20010724-C00056.png)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP625688U JPH01110380U (US06265458-20010724-C00056.png) 1988-01-20 1988-01-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP625688U JPH01110380U (US06265458-20010724-C00056.png) 1988-01-20 1988-01-20

Publications (1)

Publication Number Publication Date
JPH01110380U true JPH01110380U (US06265458-20010724-C00056.png) 1989-07-25

Family

ID=31210333

Family Applications (1)

Application Number Title Priority Date Filing Date
JP625688U Pending JPH01110380U (US06265458-20010724-C00056.png) 1988-01-20 1988-01-20

Country Status (1)

Country Link
JP (1) JPH01110380U (US06265458-20010724-C00056.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011047733A (ja) * 2009-08-26 2011-03-10 Nec Corp 劣化検出回路、劣化検出システム及び劣化検出方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50113764A (US06265458-20010724-C00056.png) * 1974-02-20 1975-09-06

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS50113764A (US06265458-20010724-C00056.png) * 1974-02-20 1975-09-06

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011047733A (ja) * 2009-08-26 2011-03-10 Nec Corp 劣化検出回路、劣化検出システム及び劣化検出方法

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