JPH01107971U - - Google Patents
Info
- Publication number
- JPH01107971U JPH01107971U JP1988001985U JP198588U JPH01107971U JP H01107971 U JPH01107971 U JP H01107971U JP 1988001985 U JP1988001985 U JP 1988001985U JP 198588 U JP198588 U JP 198588U JP H01107971 U JPH01107971 U JP H01107971U
- Authority
- JP
- Japan
- Prior art keywords
- workpiece
- contact
- contactor
- block
- inspection device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988001985U JPH01107971U (enExample) | 1988-01-13 | 1988-01-13 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988001985U JPH01107971U (enExample) | 1988-01-13 | 1988-01-13 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01107971U true JPH01107971U (enExample) | 1989-07-20 |
Family
ID=31202358
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988001985U Pending JPH01107971U (enExample) | 1988-01-13 | 1988-01-13 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01107971U (enExample) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57197477A (en) * | 1981-05-29 | 1982-12-03 | Toshiba Corp | Measuring method for electronic parts |
-
1988
- 1988-01-13 JP JP1988001985U patent/JPH01107971U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57197477A (en) * | 1981-05-29 | 1982-12-03 | Toshiba Corp | Measuring method for electronic parts |