JPH01107971U - - Google Patents

Info

Publication number
JPH01107971U
JPH01107971U JP198588U JP198588U JPH01107971U JP H01107971 U JPH01107971 U JP H01107971U JP 198588 U JP198588 U JP 198588U JP 198588 U JP198588 U JP 198588U JP H01107971 U JPH01107971 U JP H01107971U
Authority
JP
Japan
Prior art keywords
workpiece
contact
contactor
block
inspection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP198588U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP198588U priority Critical patent/JPH01107971U/ja
Publication of JPH01107971U publication Critical patent/JPH01107971U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
JP198588U 1988-01-13 1988-01-13 Pending JPH01107971U (enrdf_load_html_response)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP198588U JPH01107971U (enrdf_load_html_response) 1988-01-13 1988-01-13

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP198588U JPH01107971U (enrdf_load_html_response) 1988-01-13 1988-01-13

Publications (1)

Publication Number Publication Date
JPH01107971U true JPH01107971U (enrdf_load_html_response) 1989-07-20

Family

ID=31202358

Family Applications (1)

Application Number Title Priority Date Filing Date
JP198588U Pending JPH01107971U (enrdf_load_html_response) 1988-01-13 1988-01-13

Country Status (1)

Country Link
JP (1) JPH01107971U (enrdf_load_html_response)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57197477A (en) * 1981-05-29 1982-12-03 Toshiba Corp Measuring method for electronic parts

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57197477A (en) * 1981-05-29 1982-12-03 Toshiba Corp Measuring method for electronic parts

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