JPH01100356U - - Google Patents
Info
- Publication number
- JPH01100356U JPH01100356U JP19668887U JP19668887U JPH01100356U JP H01100356 U JPH01100356 U JP H01100356U JP 19668887 U JP19668887 U JP 19668887U JP 19668887 U JP19668887 U JP 19668887U JP H01100356 U JPH01100356 U JP H01100356U
- Authority
- JP
- Japan
- Prior art keywords
- frit
- ray tube
- cathode ray
- color cathode
- applies
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007789 sealing Methods 0.000 claims description 2
- 238000009413 insulation Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Relating To Insulation (AREA)
- Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
Description
第1図aは本考案の実施例1を示す斜視図、第
1図bは第1図aの部分拡大図、第1図cは本考
案の実施例2を示す斜視図、第2図は従来の試験
装置を示す図である。
1……バルブ、2……フリツト封着部、3……
カバー、4……導電性ゴム、5……スプリング、
6……ワイヤ、7……パネル、8……アノード、
9……締付レバー、10……締付レバーホールド
機構、11……取つ手、12……突起部。
FIG. 1a is a perspective view showing the first embodiment of the present invention, FIG. 1b is a partially enlarged view of FIG. 1a, FIG. 1c is a perspective view showing the second embodiment of the present invention, and FIG. FIG. 2 is a diagram showing a conventional test device. 1...Valve, 2...Fritt sealing part, 3...
Cover, 4... Conductive rubber, 5... Spring,
6... wire, 7... panel, 8... anode,
9...Tightening lever, 10...Tightening lever holding mechanism, 11...Handle, 12...Protrusion.
Claims (1)
ツト封着部に高電圧を印加し、そのフリツトの絶
縁耐電圧を試験する装置において、外部から導電
性ゴムをフリツト封着部全周にわたつて密着させ
る締付機構を有することを特徴とするカラーブラ
ウン管フリツト封着部絶縁耐電圧試験装置。 A tightening mechanism that applies conductive rubber from the outside to the entire circumference of the frit seal in a device that applies high voltage to the frit seal between the panel and funnel of a color cathode ray tube to test the dielectric strength of the frit. 1. A color cathode ray tube frit sealing part insulation withstand voltage testing device, characterized by having the following features:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19668887U JPH01100356U (en) | 1987-12-25 | 1987-12-25 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19668887U JPH01100356U (en) | 1987-12-25 | 1987-12-25 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01100356U true JPH01100356U (en) | 1989-07-05 |
Family
ID=31487286
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19668887U Pending JPH01100356U (en) | 1987-12-25 | 1987-12-25 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01100356U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07169402A (en) * | 1993-12-15 | 1995-07-04 | Nec Kansai Ltd | High voltage leakage detecting device |
-
1987
- 1987-12-25 JP JP19668887U patent/JPH01100356U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07169402A (en) * | 1993-12-15 | 1995-07-04 | Nec Kansai Ltd | High voltage leakage detecting device |
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