JP7638121B2 - Mass spectrometry method and analysis method using same for correcting temperature or time change of generated gas - Google Patents
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- 238000004458 analytical method Methods 0.000 title claims description 19
- 238000004949 mass spectrometry Methods 0.000 title claims description 13
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- 229910021536 Zeolite Inorganic materials 0.000 description 5
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- HNPSIPDUKPIQMN-UHFFFAOYSA-N dioxosilane;oxo(oxoalumanyloxy)alumane Chemical compound O=[Si]=O.O=[Al]O[Al]=O HNPSIPDUKPIQMN-UHFFFAOYSA-N 0.000 description 5
- 239000000126 substance Substances 0.000 description 5
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- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 3
- 238000004895 liquid chromatography mass spectrometry Methods 0.000 description 3
- VXNZUUAINFGPBY-UHFFFAOYSA-N 1-Butene Chemical compound CCC=C VXNZUUAINFGPBY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 229910002092 carbon dioxide Inorganic materials 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
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Description
本発明は、質量分析方法、および、それを用いた発生ガスの温度変化または時間変化に補正を行う分析方法に関する。 The present invention relates to a mass spectrometry method and an analysis method using the same that corrects for temperature changes or time changes in the generated gas.
加熱発生ガス質量分析を以下、TPD-MSと記すことがある。TPD-MSは、物質の温度を調節されたプログラムに従って等温あるいは非等温(昇温や冷却)に変化させる際に、生じる発生ガスを質量分析法(以下、MSと記すことがある。)により、各ガス種の分子量に対応する質量分析計の強度(以下、MS強度と記すことがある。)を、温度あるいは時間の関数として測定する手法である(非特許文献1)。TPD-MS測定で得られる結果はMS強度-温度曲線あるいはMS強度-時間曲線である(以下、TPD-MS曲線と記すことがある)。 Heating evolved gas mass spectrometry is sometimes referred to as TPD-MS. TPD-MS is a technique in which the temperature of a substance is changed isothermally or non-isothermally (by heating or cooling) according to a controlled program, and the evolved gas is measured by mass spectrometry (hereinafter sometimes referred to as MS) to measure the mass spectrometer intensity (hereinafter sometimes referred to as MS intensity) corresponding to the molecular weight of each gas species as a function of temperature or time (Non-Patent Document 1). The results obtained from TPD-MS measurements are MS intensity-temperature curves or MS intensity-time curves (hereinafter sometimes referred to as TPD-MS curves).
従来のTPD-MS測定においては、試料から発生したガスが質量分析計で検出されるまでのタイムラグ、および、発生したガスが装置内で滞留することにより、質量分析計では信号が時間分布を有して検出される(以下、ブロード化と記すことがある。)が、いずれも補正されない。特にブロード化の影響は昇温速度が大きくなるほど深刻になり、一例として、パルス状に注入したガスが検出時に300sにブロード化する場合、昇温速度10℃/minの測定においては、発生ガス挙動が見かけ上50℃の温度分布を有することになり、正確な発生ガス挙動を把握できない。さらに昇温速度を変えて発生ガス挙動を解析する反応速度論解析において、深刻な解析誤差を生む主要因となる。また、構成される装置系によりタイムラグおよびブロード化の時間は変わるという課題もある。 In conventional TPD-MS measurements, the time lag between when the gas evolved from the sample is detected by the mass spectrometer and when the evolved gas remains in the device, resulting in the signal being detected by the mass spectrometer with a time distribution (hereinafter referred to as broadening), is not corrected for. In particular, the effect of broadening becomes more severe as the heating rate increases. For example, if pulse-injected gas broadens at 300 s when detected, in a measurement with a heating rate of 10°C/min, the behavior of the evolved gas will appear to have a temperature distribution of 50°C, making it impossible to accurately grasp the behavior of the evolved gas. Furthermore, this is the main cause of serious analytical errors in reaction kinetics analysis, which analyzes the behavior of the evolved gas by changing the heating rate. Another issue is that the time lag and the duration of broadening vary depending on the device system configured.
分析手法において、信号解析の一つであるデコンボリューション(非特許文献2)は、一般的にスペクトル、X線回折、液体クロマトグラフィー質量分析法(以下、LC-MSと記すことがある。)、ガスクロマトグラフィー質量分析法(以下、GC-MSと記すことがある。)、ゲル浸透クロマトグラフィー(以下にGPCと記すことがある。)のピーク分離に用いられる。LC-MS、GC-MSでは、実測されるMS強度は単成分のピークであるコンポーネントが重なっており、デコンボリューションにより求めた各コンポーネントのマススペクトルはマススペクトルライブラリから検索することができるため、ピークトップの保持時間およびピーク形状の違いにより、同一ピークか否かを判別することが可能となる(非特許文献3)。その他に、物質の温度を調節されたプログラムに従って等温あるいは非等温(昇温や冷却)に変化させた際の、試料からの熱の出入りを調べる分析におけるデコンボリューションの適用事例として、等温における熱量計へのインパルス熱応答解析(非特許文献4、5)や高速カロリメトリーを用いた高分子の融解速度の解析(非特許文献6)がある。
In analytical techniques, deconvolution (Non-Patent Document 2), which is one of the signal analyses, is generally used for peak separation in spectra, X-ray diffraction, liquid chromatography mass spectrometry (hereinafter sometimes referred to as LC-MS), gas chromatography mass spectrometry (hereinafter sometimes referred to as GC-MS), and gel permeation chromatography (hereinafter sometimes referred to as GPC). In LC-MS and GC-MS, the MS intensity measured is the overlap of components that are single-component peaks, and the mass spectrum of each component obtained by deconvolution can be searched from a mass spectrum library, so it is possible to determine whether or not they are the same peak based on the difference in the retention time of the peak top and the peak shape (Non-Patent Document 3). Other examples of the application of deconvolution in analyses to investigate the inflow and outflow of heat from a sample when the temperature of a substance is changed to isothermal or non-isothermal (heating or cooling) according to a regulated program include impulse thermal response analysis of a calorimeter at isothermal temperatures (
本発明では、デコンボリューションをTPD-MS曲線に適用することで、従来のTPD-MS測定で試料から発生したガスが質量分析計で検出される際に起こる、信号のブロード化を取り除き、実際の発生ガス挙動を把握することを課題とする。 The objective of this invention is to apply deconvolution to TPD-MS curves to remove the signal broadening that occurs when gas evolved from a sample is detected by a mass spectrometer in conventional TPD-MS measurements, and to understand the actual behavior of the evolved gas.
上記課題を解決するため、本発明は以下の構成からなる。 To solve the above problems, the present invention has the following configuration.
つまり、質量分析における、時間の関数としての強度曲線または温度の関数としての強度曲線にデコンボリューションによる解析を行う、質量分析方法、および、上記質量分析方法を用い、試料の加熱時に発生するガスの温度変化または時間変化に補正を行う分析方法、である。 In other words, it is a mass spectrometry method that performs deconvolution analysis on the intensity curve as a function of time or the intensity curve as a function of temperature in mass spectrometry, and an analysis method that uses the above mass spectrometry method to correct for temperature changes or time changes in gas generated when a sample is heated.
本発明におけるデータ補正法(デコンボリューション)をTPD-MS曲線に適用することで、試料からの実際の発生ガス挙動を取得することが可能となる。 By applying the data correction method (deconvolution) of the present invention to the TPD-MS curve, it is possible to obtain the actual behavior of the gas evolved from the sample.
図1に典型的なTPD-MSの装置図を例示する。試料を設置する炉内は温度制御され、試料を加熱して発生したガスは、キャリアガスと共に配管とキャピラリーを通過して質量分析計に導入される。当該装置では、炉より下流のガスが、流れる配管とキャピラリーは、好ましくは100~400℃の範囲で、保持されるのが好ましく、例えば250℃に保持される。当該装置で設定される昇温速度は0.1~90℃/minの範囲が好ましく、好ましく10℃/minが例示される。本発明では、低分子ガスとして、例えば、1-ブテン(濃度7.99%) (以下、1-Buと記すことがある)、二酸化炭素(以下、CO2と記すことがある)、窒素(以下、N2と記すことがある)のいずれかが例示され、キャリアガス流下(当該装置ではヘリウム流50mL/min)で、図1に示す試料導入部の直上に設置された逆止弁からマイクロシリンジを使い、パルス状に注入(当該装置では好ましくは1μL~10μLで実施)すると、試料導入部の温度(当該装置では好ましくは25℃~500℃で実施)に依らず、パルスのガスを打ち込んで質量分析計で検出されるまでに同一のタイムラグ(当該装置では、例として12秒)を生じさせることができる。このタイムラグは、キャリアガスの流速と試料導入部から質量分析計の検出器までの距離に比例して変化する。 A typical TPD-MS apparatus diagram is shown in Figure 1. The temperature inside the furnace in which the sample is placed is controlled, and the gas generated by heating the sample passes through piping and capillaries together with the carrier gas and is introduced into the mass spectrometer. In this apparatus, the piping and capillaries through which the gas flows downstream of the furnace are preferably maintained in the range of 100 to 400°C, for example, at 250°C. The heating rate set in this apparatus is preferably in the range of 0.1 to 90°C/min, and is preferably 10°C/min, for example. In the present invention, examples of low molecular gases include 1-butene (concentration 7.99%) (hereinafter sometimes referred to as 1-Bu), carbon dioxide (hereinafter sometimes referred to as CO2 ), and nitrogen (hereinafter sometimes referred to as N2 ). When the gas is injected in pulses (preferably 1 μL to 10 μL in this device) using a microsyringe from a check valve installed directly above the sample introduction part shown in FIG. 1 under a carrier gas flow (helium flow of 50 mL/min in this device), the same time lag (12 seconds in this device, for example) can be generated from the injection of the pulse gas to detection by the mass spectrometer, regardless of the temperature of the sample introduction part (preferably 25 ° C to 500 ° C in this device). This time lag changes in proportion to the flow rate of the carrier gas and the distance from the sample introduction part to the detector of the mass spectrometer.
次に、質量分析計で検出されるガス成分の開始時刻をゼロ秒として、MS強度の経時変化を調べた結果を図2に示す。ガス種に依存せずMS強度の時間変化は形状が一致することが確認できる。また、同一設備を使うと、ガス注入量(1μL~10μLの範囲内で実施することが好ましい)に依存せず、測定の繰り返し再現性も良いことが確認できる。このことから、図2に示すMS強度の経時変化(以下、実測のMS強度の経時変化を時間tの関数としてθ(t)と記すことがある。)は、パルス状にガスを注入した際の装置での応答関数(以下、インパルス応答関数g(t)と記すことがある。)と見なすことができるから、θ(t)とg(t)の間に線形関係が成り立つ場合、以下の関係式(1)が成り立つ。なお、θ(t)で取得されるガス成分と同じ分子をパルスで打ち込んでg(t)を取得することもある。 Next, the time-dependent change in MS intensity was investigated by setting the start time of the gas components detected by the mass spectrometer to zero seconds, and the results are shown in Figure 2. It can be confirmed that the shape of the time-dependent change in MS intensity is consistent regardless of the gas type. In addition, when the same equipment is used, it can be confirmed that the repeatability of the measurement is good, regardless of the gas injection amount (preferably in the range of 1 μL to 10 μL). From this, the time-dependent change in MS intensity shown in Figure 2 (hereinafter, the time-dependent change in the measured MS intensity as a function of time t may be written as θ(t)) can be regarded as the response function of the device when gas is injected in a pulsed form (hereinafter, sometimes referred to as impulse response function g(t)). Therefore, when a linear relationship holds between θ(t) and g(t), the following relationship (1) holds. Note that g(t) can also be obtained by injecting the same molecules as the gas components obtained at θ(t) in a pulse.
ここで、ν(η)は応答遅れのないMS強度の経時変化であり、実際の発生ガス挙動を表す。g(t-η)はインパルス応答関数であり、装置で検出されるまでの発生ガスのブロード化を規定する遅延関数である。ここで、デコンボリューション解析を用いることにより、θ(t)とg(t)からν(η)を導出することができる。デコンボリューション解析の方法は、非特許文献2、4,5を参考にすることができる。なお、g(t)は、事前に図2で示すように、パルス状のガスを注入した際のMSの信号強度を調べることで取得できる。θ(t)は評価したい試料からの発生ガスをTPD-MS測定した際の実測のMS強度の経時変化である。
Here, ν(η) is the change in MS intensity over time without response delay, and represents the actual behavior of the evolved gas. g(t-η) is an impulse response function, a delay function that specifies the broadening of the evolved gas until it is detected by the device. Here, by using deconvolution analysis, ν(η) can be derived from θ(t) and g(t). For the method of deconvolution analysis,
本発明は、質量分析における時間の関数としての強度曲線または温度の関数としての強度曲線にデコンボリューションによる解析を行う質量分析方法であり、この質量分析強度曲線に関するデコンボリューション解析法は、初めてTPD-MS曲線にデコンボリューションを適用したものである。そのデコンボリューションの基本式は以下の式(2)~(4)である。 The present invention is a mass spectrometry method that performs deconvolution analysis on the intensity curve as a function of time or the intensity curve as a function of temperature in mass spectrometry, and this deconvolution analysis method for mass spectrometry intensity curves is the first to apply deconvolution to TPD-MS curves. The basic equations for the deconvolution are the following equations (2) to (4).
ここでiは虚数単位、ωは周波数である。式(2)と式(3)はそれぞれθ(t)とg(t)のフーリエ変換を表し、式(4)は、式(2)と式(3)をもとに、フーリエ変換して得られる関数の商を得た後、逆フーリエ変換することでν(η)を導出することができる。 Here, i is the imaginary unit and ω is the frequency. Equations (2) and (3) represent the Fourier transforms of θ(t) and g(t), respectively. Equation (4) is based on equations (2) and (3), and the quotient of the function obtained by applying a Fourier transform is obtained, and then an inverse Fourier transform is applied to derive ν(η).
分析の対象としては、多孔質材料、無機物、有機物、医薬品、生体分子、触媒、高分子材料(例えば、熱硬化性樹脂、熱可塑性樹脂)が例示され、なかでも、気体や液体を吸着することができる多孔質材料の一つであるゼオライトが好ましく例示される。 Examples of objects that can be analyzed include porous materials, inorganic substances, organic substances, pharmaceuticals, biomolecules, catalysts, and polymeric materials (e.g., thermosetting resins, thermoplastic resins). Among these, a preferred example is zeolite, which is a porous material that can adsorb gases and liquids.
以下、本発明を実施例により説明する。 The present invention will now be described with reference to examples.
MS測定には島津製作所製の質量分析計であるGCMS-QP2010を使用した。測定雰囲気として、キャリアガスとして50mL/minのへリウム流で実施した。 MS measurements were performed using a Shimadzu mass spectrometer, GCMS-QP2010. Measurements were performed in a helium carrier gas flow of 50 mL/min.
室温にて、マイクロシリンジを使い、図1に示す逆止弁から5μLの1-Buを1min間隔で2回パルス状に注入した。 At room temperature, 5 μL of 1-Bu was injected twice in a pulse at 1-min intervals using a microsyringe through the check valve shown in Figure 1.
5μLの1-Buを1回注入して得られるTPD-MS曲線を図2に示した。5μLのN2、および、CO2を1回注入して得られるTPD-MS曲線も図2に示した。 The TPD-MS curves obtained from a single injection of 5 μL of 1-Bu are shown in Figure 2. The TPD-MS curves obtained from a single injection of 5 μL of N 2 and CO 2 are also shown in Figure 2.
質量分析計で1-Buに由来するMS信号を検出開始した時点を0sとしてプロットした、実測のTPD-MS曲線(この曲線はθ(t)に対応する。)を図3に点線で示す。2回のガス注入に対応して2つのピークが見られ、信号が検出され終わるまでに300sほど要し、パルス状に注入したガスがブロード化することが確認できる(未デコンボリューション)。 Figure 3 shows the actual TPD-MS curve (corresponding to θ(t)) plotted with the time when the MS signal originating from 1-Bu started to be detected by the mass spectrometer as 0 s. Two peaks are seen corresponding to the two gas injections, and it takes about 300 s for the signal to be completely detected, confirming that the pulsed gas injection broadens the signal (not deconvoluted).
図2に示した5μLの1-Buを2回注入して得られるTPD-MS曲線をg(t)として、式(2)~(4)を用いて算出されるν(η)を図3に実線で示す。デコンボリューション結果として、注入時間に対応する位置に2つのピークが現れており、実測のTPD-MS曲線よりもピーク形状が先鋭化することが確認できる。実際の注入時間とデコンボリューション後のピーク位置が近くなることも確認できる。 The TPD-MS curve obtained by injecting 5 μL of 1-Bu twice, as shown in Figure 2, is denoted as g(t), and ν(η) calculated using equations (2) to (4) is shown by the solid line in Figure 3. As a result of deconvolution, two peaks appear at positions corresponding to the injection times, and it can be confirmed that the peak shapes are sharper than in the actually measured TPD-MS curve. It can also be confirmed that the actual injection time and the peak positions after deconvolution are closer.
図4に、室温の飽和蒸気圧下で3日間吸湿させたゼオライト(4A型 、富士フイルム和光純薬株式会社製)を10℃/minで昇温させた際の水分子のTPD-MS曲線を示す。点線で示す実測TPD-MS曲線に対してデコンボリューション曲線は低温側でピークを示し、ピーク幅も狭くなり、信号のブロード化が除かれる補正が施されていることがわかる。デコンボリューション前後でピーク温度は10℃ほど変化しており、時間にして60sほどのブロード化が補正されていることがわかる。 Figure 4 shows the TPD-MS curve of water molecules when zeolite (4A type, Fujifilm Wako Pure Chemical Corporation) that has absorbed moisture for three days under saturated vapor pressure at room temperature is heated at 10°C/min. Compared to the measured TPD-MS curve shown by the dotted line, the deconvolution curve shows a peak at the low temperature side, and the peak width is narrower, indicating that correction has been applied to remove signal broadening. The peak temperature changes by about 10°C before and after deconvolution, indicating that broadening of about 60 s has been corrected.
1:ヘリウムガス (キャリアガス)
2:逆止弁
3:試料導入部(ガス発生源)
4:温度制御された加熱炉
5:開放弁
6:ガス導入
7:質量分析計
8:キャピラリーチューブ
9:検出器
10:1- Buを5μL注入した時点(注入1回目)
11:1- Bu を5μL注入した時点(注入2回目)
12:デコンボリューション曲線ν(t)
13:実測TPD-MS曲線θ(t)
14:調湿させたゼオライトのデコンボリューション曲線ν(t)
15:調湿させたゼオライトの実測TPD-MS曲線θ(t)
1: Helium gas (carrier gas)
2: Check valve
3: Sample introduction section (gas generation source)
4: Temperature-controlled furnace
5: Release valve
6: Gas introduction
7: Mass spectrometer
8: Capillary tube
9. Detector
10: 5 μL of 1-Bu was injected (first injection)
11: 5 μL of 1-Bu was injected (second injection)
12: Deconvolution curve ν(t)
13: Measured TPD-MS curve θ(t)
14: Deconvolution curve ν(t) of zeolite with moisture control
15: Measured TPD-MS curve θ(t) of zeolite with moisture control
Claims (5)
5. The analytical method for correcting for temperature or time changes in generated gas according to claim 2, wherein the change in intensity of a mass spectrometer after a pulsed gas is injected into a sample heating furnace is used as an impulse response function.
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